| CMOS SRAM circuit design and parametric test in nano-scaled technologies: process-aware SRAM design and test A Pavlov, M Sachdev Springer Science & Business Media, 2008 | 364 | 2008 |
| A 153Mb-SRAM Design with Dynamic Stability Enhancement and Leakage Reduction in 45nm High-Κ Metal-Gate CMOS Technology F Hamzaoglu, K Zhang, Y Wang, HJ Ahn, U Bhattacharya, Z Chen, YG Ng, ... Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical …, 2008 | 66 | 2008 |
| A 3.8 GHz 153 Mb SRAM design with dynamic stability enhancement and leakage reduction in 45 nm high-k metal gate CMOS technology F Hamzaoglu, K Zhang, Y Wang, HJ Ahn, U Bhattacharya, Z Chen, YG Ng, ... IEEE Journal of Solid-State Circuits 44 (1), 148-154, 2009 | 65 | 2009 |
| Weak cell detection in deep-submicron SRAMs: A programmable detection technique A Pavlov, M Sachdev, JP De Gyvez IEEE Journal of Solid-State Circuits 41 (10), 2334-2343, 2006 | 28 | 2006 |
| Word line pulsing technique for stability fault detection in SRAM cells A Pavlov, M Azimane, JP de Gyvez, M Sachdev Test Conference, 2005. Proceedings. ITC 2005. IEEE International, 10 pp.-825, 2005 | 26 | 2005 |
| An SRAM weak cell fault model and a DFT technique with a programmable detection threshold A Pavlov, M Sachdev, JP de Gyvez Test Conference, 2004. Proceedings. ITC 2004. International, 1006-1015, 2004 | 24 | 2004 |
| Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test A Pavlov, M Sachdev Springer Publishing Company, Incorporated, 2008 | 19* | 2008 |
| Design and test of embedded SRAMs AS Pavlov University of Waterloo, 2005 | 18 | 2005 |
| Test for weak SRAM cells JJP De Gyvez, M Sachdev, A Pavlov US Patent 7,200,057, 2007 | 14 | 2007 |
| Sub-quarter micron SRAM cells stability in low-voltage operation: a comparative analysis O Semenov, A Pavlov, M Sachdev Integrated Reliability Workshop Final Report, 2002. IEEE International, 168-171, 2002 | 9 | 2002 |
| SRAM test method and SRAM test arrangement to detect weak cells JJP De Gyvez, M Azimane, AS Pavlov US Patent 7,463,508, 2008 | 7 | 2008 |
| SRAM Cell Stability: Definition, Modeling and Testing A Pavlov, M Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies …, 2008 | 7 | 2008 |
| A 640x480 CMOS Image Sensor for High Speed Image Capture EC Fox, GR Allan, B Li, D Dattani, S Kamasz, MJ Kiik, Q Tang, A Pavlov, ... 2001 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, 2003 | 4 | 2003 |
| High-speed VGA CMOS image sensor GR Allan, D Dattani, DR Dykaar, EC Fox, SG Ingram, SR Kamasz, MJ Kiik, ... Photonics West 2001-Electronic Imaging, 111-118, 2001 | 4 | 2001 |
| SRAM circuit design and operation A Pavlov, M Sachdev CMOS SRAM circuit design and parametric test in nano-scaled technologies …, 2008 | 3 | 2008 |
| Programmable techniques for cell stability test and debug in embedded SRAMs A Pavlov, M Sachdev, JP de Gyvez, M Azimane Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005 …, 2005 | 3 | 2005 |
| Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques A Pavlov, M Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies …, 2008 | 1 | 2008 |
| Introduction and motivation A Pavlov, M Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies …, 2008 | 1 | 2008 |
| Traditional SRAM Fault Models and Test Practices A Pavlov, M Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies …, 2008 | | 2008 |
| Techniques for Detection of SRAM Cells with Stability Faults A Pavlov, M Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies …, 2008 | | 2008 |
