Steve Bigalke
Steve Bigalke
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The need and opportunities of electromigration-aware integrated circuit design
S Bigalke, J Lienig, G Jerke, J Scheible, R Jancke
2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2018
Load-aware redundant via insertion for electromigration avoidance
S Bigalke, J Lienig
Proceedings of the 2016 on International Symposium on Physical Design, 99-106, 2016
Avoidance vs. repair: New approaches to increasing electromigration robustness in VLSI routing
S Bigalke, J Lienig
Integration 75, 189-198, 2020
FLUTE-EM: Electromigration-optimized net topology considering currents and mechanical stress
S Bigalke, J Lienig
2018 IFIP/IEEE International Conference on Very Large Scale Integration …, 2018
Increasing EM robustness of placement and routing solutions based on layout-driven discretization
S Bigalke, J Lienig, T Casper, S Schöps
2018 14th Conference on Ph. D. Research in Microelectronics and Electronics …, 2018
Exploring the use of the finite element method for electromigration analysis in future physical design
M Thiele, S Bigalke, J Lienig
2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017
Electromigration analysis of VLSI circuits using the finite element method
M Thiele, S Bigalke, J Lienig
VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things: 25th …, 2019
Electro-, Stress-and Thermomigration: Three Forces, One Problem
S Bigalke, J Lienig
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