Steve Bigalke
Steve Bigalke
Verified email at tu-dresden.de
Title
Cited by
Cited by
Year
Load-aware redundant via insertion for electromigration avoidance
S Bigalke, J Lienig
Proceedings of the 2016 on International Symposium on Physical Design, 99-106, 2016
122016
The need and opportunities of electromigration-aware integrated circuit design
S Bigalke, J Lienig, G Jerke, J Scheible, R Jancke
Proceedings of the International Conference on Computer-Aided Design, 1-8, 2018
72018
FLUTE-EM: Electromigration-optimized net topology considering currents and mechanical stress
S Bigalke, J Lienig
2018 IFIP/IEEE International Conference on Very Large Scale Integration …, 2018
42018
Increasing EM robustness of placement and routing solutions based on layout-driven discretization
S Bigalke, J Lienig, T Casper, S Schöps
2018 14th Conference on Ph. D. Research in Microelectronics and Electronics …, 2018
42018
Exploring the use of the finite element method for electromigration analysis in future physical design
M Thiele, S Bigalke, J Lienig
2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017
42017
Avoidance vs. repair: New approaches to increasing electromigration robustness in VLSI routing
S Bigalke, J Lienig
Integration 75, 189-198, 2020
22020
Electromigration Analysis of VLSI Circuits Using the Finite Element Method
M Thiele, S Bigalke, J Lienig
IFIP/IEEE International Conference on Very Large Scale Integration-System on …, 2017
12017
Electro-, Stress-and Thermomigration: Three Forces, One Problem
S Bigalke, J Lienig
2016
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Articles 1–8