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Hansjoerg Scherer
Hansjoerg Scherer
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Title
Cited by
Cited by
Year
Validation of a quantized-current source with 0.2 ppm uncertainty
F Stein, D Drung, L Fricke, H Scherer, F Hohls, C Leicht, M Götz, C Krause, ...
Applied Physics Letters 107 (10), 2015
952015
Ultrastable low-noise current amplifier: A novel device for measuring small electric currents with high accuracy
D Drung, C Krause, U Becker, H Scherer, FJ Ahlers
Review of Scientific Instruments 86 (2), 2015
942015
Quantum metrology triangle experiments: a status review
H Scherer, B Camarota
Measurement Science and Technology 23 (12), 124010, 2012
882012
Precision measurement of the quantized anomalous Hall resistance at zero magnetic field
M Götz, KM Fijalkowski, E Pesel, M Hartl, S Schreyeck, M Winnerlein, ...
Applied Physics Letters 112 (7), 2018
772018
Robustness of single-electron pumps at sub-ppm current accuracy level
F Stein, H Scherer, T Gerster, R Behr, M Götz, E Pesel, C Leicht, ...
Metrologia 54 (1), S1, 2016
732016
Improving the traceable measurement and generation of small direct currents
D Drung, M Götz, E Pesel, H Scherer
IEEE transactions on instrumentation and measurement 64 (11), 3021-3030, 2015
672015
Improved cryogenic current comparator setup with digital current sources
M Gotz, D Drung, E Pesel, HJ Barthelmess, C Hinnrichs, C Aßmann, ...
IEEE Transactions on Instrumentation and Measurement 58 (4), 1176-1182, 2009
522009
Single-charge devices with ultrasmall Nb∕ AlOx∕ Nb trilayer Josephson junctions
R Dolata, H Scherer, AB Zorin, J Niemeyer
Journal of Applied Physics 97 (5), 2005
472005
Electron counting capacitance standard with an improved five-junction R-pump
B Camarota, H Scherer, MW Keller, SV Lotkhov, GD Willenberg, FJ Ahlers
Metrologia 49 (1), 8, 2011
402011
Validation of the ultrastable low-noise current amplifier as travelling standard for small direct currents
D Drung, C Krause, SP Giblin, S Djordjevic, F Piquemal, O Séron, ...
Metrologia 52 (6), 756, 2015
342015
Single‐Electron Pumps and Quantum Current Metrology in the Revised SI
H Scherer, HW Schumacher
Annalen der Physik 531 (5), 1800371, 2019
312019
Bistability in the current-induced breakdown of the quantum Hall effect
FJ Ahlers, G Hein, H Scherer, L Bilek, H Nickel, R Losch, W Schlapp
Semiconductor science and technology 8 (12), 2062, 1993
311993
Single electron transistors with high-quality superconducting niobium islands
R Dolata, H Scherer, AB Zorin, J Niemeyer
Applied physics letters 80 (15), 2776-2778, 2002
292002
Measurement of sub-picoampere direct currents with uncertainties below ten attoamperes
C Krause, D Drung, H Scherer
Review of Scientific Instruments 88 (2), 2017
272017
Multilayer technique for fabricating Nb junction circuits exhibiting charging effects
AB Pavolotsky, T Weimann, H Scherer, VA Krupenin, J Niemeyer, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
251999
Single electron transistors with junctions
R Dolata, H Scherer, AB Zorin, J Niemeyer
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003
242003
Current scaling and electron heating between integer quantum Hall plateaus in GaAs/AlxGa1-xAs heterostructures
H Scherer, L Schweitzer, FJ Ahlers, L Bliek, R Losch, W Schlapp
Semiconductor science and technology 10 (7), 959, 1995
231995
Characterization of all-chromium tunnel junctions and single-electron tunneling devices fabricated by direct-writing multilayer technique
H Scherer, T Weimann, P Hinze, BW Samwer, AB Zorin, J Niemeyer
Journal of Applied Physics 86 (12), 6956-6964, 1999
211999
Steps toward a capacitance standard based on single-electron counting at PTB
H Scherer, SV Lotkhov, GD Willenberg, AB Zorin
IEEE transactions on instrumentation and measurement 54 (2), 666-669, 2005
192005
The effect of thermal annealing on the properties of Al–AlOx–Al single electron tunneling transistors
H Scherer, T Weimann, AB Zorin, J Niemeyer
Journal of Applied Physics 90 (5), 2528-2532, 2001
192001
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