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Glenn H. Chapman
Glenn H. Chapman
Professor School of Engineering Science, Simon Fraser University
Verified email at cs.sfu.ca - Homepage
Title
Cited by
Cited by
Year
Methods and apparatus for detecting defects in imaging arrays by image analysis
GH Chapman, I Koren, Z Koren, J Dudas, C Jung
US Patent 8,009,209, 2011
2492011
Vision system and proximity detector
GB Immega, GH Chapman
US Patent 5,726,443, 1998
1221998
A wafer-scale digital integrator using restructurable VSLI
JI Raffel, AH Anderson, GH Chapman, KH Konkle, B Mathur, AM Soares, ...
IEEE Journal of Solid-State Circuits 20 (1), 399-406, 1985
961985
Method of making a conductive path in multi-layer metal structures by low power laser beam
JI Raffel, JA Yasaitis, GH Chapman, ML Naiman, MIO Technology
US Patent 4,585,490, 1986
851986
Selectively programmable interconnections in multilayer integrated circuits
GH Chapman, TO Herndon
US Patent 5,087,589, 1992
821992
Anti-theft electrical power cord
GH Chapman, M Zaacks
US Patent 6,150,940, 2000
712000
A monolithic Hough transform processor based on restructurable VLSI
FM Rhodes, JJ Dituri, GH Chapman, BE Emerson, AM Soares, JI Raffel
IEEE transactions on pattern analysis and machine intelligence 10 (1), 106-110, 1988
691988
Fabrication of interlayer conductive paths in integrated circuits
TO Herndon, GH Chapman
US Patent 4,843,034, 1989
591989
Angular domain imaging of objects within highly scattering media using silicon micromachined collimating arrays
GH Chapman, M Trinh, N Pfeiffer, G Chu, D Lee
IEEE Journal of selected topics in quantum electronics 9 (2), 257-266, 2003
582003
Quantitative analysis of in-field defects in image sensor arrays
J Leung, J Dudas, GH Chapman, I Koren, Z Koren
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
522007
Cathodoluminescence Characteristics of CuxS Films Produced By Different Methods
JJ Loferski, GH Chapman, J Shewchun, SD Mittleman, EA De Meo, ...
Solar Energy Materials 1 (1), 157, 1979
521979
Identification of in-field defect development in digital image sensors
J Dudas, LM Wu, C Jung, GH Chapman, Z Koren, I Koren
Digital Photography III 6502, 319-330, 2007
512007
Laser‐formed connections using polyimide
JI Raffel, JF Freidin, GH Chapman
Applied Physics Letters 42 (8), 705-706, 1983
441983
Laser restructurable technology and design
J Raffel, AH Anderson, GH Chapman
Wafer Scale Integration, 319-363, 1988
391988
Statistical identification and analysis of defect development in digital imagers
J Leung, GH Chapman, Z Koren, I Koren
Digital Photography V 7250, 272-283, 2009
382009
Successive order, multiple scattering of two-term Henyey-Greenstein phase functions
N Pfeiffer, GH Chapman
Optics express 16 (18), 13637-13642, 2008
382008
Automatic detection of in-field defect growth in image sensors
J Leung, GH Chapman, I Koren, Z Koren
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI …, 2008
372008
Image contrast enhancement in angular domain optical imaging of turbid media
F Vasefi, B Kaminska, GH Chapman, JJL Carson
Optics express 16 (26), 21492-21504, 2008
362008
The technology of laser formed interactions for wafer scale integration
GH Chapman, JM Canter, SS Cohen
[1989] Proceedings International Conference on Wafer Scale Integration, 21-29, 1989
361989
A Wafer-Scale Digital Integrator
JI Raffel, AH Anderson, GH Chapman, KH Konkle, B Mathur, AM Soares, ...
Proc. IEEE Conference on Computer Design, 121, 1984
361984
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