Olivier Thomas
Olivier Thomas
Professeur Aix Marseille Université CNRS IM2NP
Bestätigte E-Mail-Adresse bei im2np.fr - Startseite
Titel
Zitiert von
Zitiert von
Jahr
First-principles study of the structural, electronic, vibrational, and elastic properties of orthorhombic NiSi
D Connétable, O Thomas
Physical review B 79 (9), 094101, 2009
1652009
Interplay between anisotropic strain relaxation and uniaxial interface magnetic anisotropy in epitaxial Fe films on (001) GaAs
O Thomas, Q Shen, P Schieffer, N Tournerie, B Lépine
Physical review letters 90 (1), 017205, 2003
1432003
Molybdenum disilicide: Crystal growth, thermal expansion and resistivity
O Thomas, JP Senateur, R Madar, O Laborde, E Rosencher
Solid state communications 55 (7), 629-632, 1985
1221985
Electrical and optical properties of silicide single crystals and thin films
F Nava, KN Tu, O Thomas, JP Senateur, R Madar, A Borghesi, G Guizzetti, ...
Materials science reports 9 (4-5), 141-200, 1993
1121993
Diffusion of Sb, Ga, Ge, and (As) in TiSi2
P Gas, G Scilla, A Michel, FK LeGoues, O Thomas, FM d’Heurle
Journal of Applied Physics 63 (11), 5335-5345, 1988
941988
Effect of Co, Pt, and Au additions on the stability and epitaxy of films on (111)Si
D Mangelinck, P Gas, JM Gay, B Pichaud, O Thomas
Journal of applied physics 84 (5), 2583-2590, 1998
931998
The diffusion of elements implanted in films of cobalt disilicide
O Thomas, P Gas, A Charai, FK LeGoues, A Michel, G Scilla, FM d’Heurle
Journal of applied physics 64 (6), 2973-2980, 1988
751988
Some titanium germanium and silicon compounds: Reaction and properties
O Thomas, FM d’Heurle, S Delage
Journal of Materials Research 5 (7), 1453-1462, 1990
661990
Reaction of titanium with germanium and silicon‐germanium alloys
O Thomas, S Delage, FM d’Heurle, G Scilla
Applied physics letters 54 (3), 228-230, 1989
651989
Metallurgical reinvestigation of rare earth silicides
E Houssay, A Rouault, O Thomas, R Madar, JP Senateur
Applied Surface Science 38 (1-4), 156-161, 1989
611989
Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm
AA Minkevich, M Gailhanou, JS Micha, B Charlet, V Chamard, O Thomas
Physical Review B 76 (10), 104106, 2007
582007
Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging
S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ...
ACS nano 9 (9), 9210-9216, 2015
552015
Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging
S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ...
ACS nano 9 (9), 9210-9216, 2015
552015
Interdependence of elastic strain and segregation in metallic multilayers: An X-Ray diffraction study of (111) Au/Ni multilayers
S Labat, P Gergaud, O Thomas, B Gilles, A Marty
Journal of Applied Physics 87 (3), 1172-1181, 2000
532000
Formation of Ni silicide from Ni (Au) films on (111) Si
D Mangelinck, P Gas, A Grob, B Pichaud, O Thomas
Journal of applied physics 79 (8), 4078-4086, 1996
521996
Determination of the elastic constants of a cobalt disilicide intermetallic compound
G Guénin, M Ignat, O Thomas
Journal of applied physics 68 (12), 6515-6516, 1990
521990
Strain field in silicon on insulator lines using high resolution X-ray diffraction
M Gailhanou, A Loubens, JS Micha, B Charlet, AA Minkevich, R Fortunier, ...
Applied Physics Letters 90 (11), 111914, 2007
482007
Combined synchrotron x-ray diffraction and wafer curvature measurements during Ni–Si reactive film formation
C Rivero, P Gergaud, M Gailhanou, O Thomas, B Froment, H Jaouen, ...
Applied Physics Letters 87 (4), 041904, 2005
482005
Dislocation storage in single slip-oriented Cu micro-tensile samples: new insights via X-ray microdiffraction
C Kirchlechner, D Kiener, C Motz, S Labat, N Vaxelaire, O Perroud, ...
Philosophical Magazine 91 (7-9), 1256-1264, 2011
472011
Raman spectra of TiN/AlN superlattices
M Bernard, A Deneuville, O Thomas, P Gergaud, P Sandstrom, J Birch
Thin Solid Films 380 (1-2), 252-255, 2000
472000
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