First-principles study of the structural, electronic, vibrational, and elastic properties of orthorhombic NiSi D Connétable, O Thomas
Physical review B 79 (9), 094101, 2009
165 2009 Interplay between anisotropic strain relaxation and uniaxial interface magnetic anisotropy in epitaxial Fe films on (001) GaAs O Thomas, Q Shen, P Schieffer, N Tournerie, B Lépine
Physical review letters 90 (1), 017205, 2003
143 2003 Molybdenum disilicide: Crystal growth, thermal expansion and resistivity O Thomas, JP Senateur, R Madar, O Laborde, E Rosencher
Solid state communications 55 (7), 629-632, 1985
122 1985 Electrical and optical properties of silicide single crystals and thin films F Nava, KN Tu, O Thomas, JP Senateur, R Madar, A Borghesi, G Guizzetti, ...
Materials science reports 9 (4-5), 141-200, 1993
112 1993 Diffusion of Sb, Ga, Ge, and (As) in TiSi2 P Gas, G Scilla, A Michel, FK LeGoues, O Thomas, FM d’Heurle
Journal of Applied Physics 63 (11), 5335-5345, 1988
94 1988 Effect of Co, Pt, and Au additions on the stability and epitaxy of D Mangelinck, P Gas, JM Gay, B Pichaud, O Thomas
Journal of applied physics 84 (5), 2583-2590, 1998
93 1998 The diffusion of elements implanted in films of cobalt disilicide O Thomas, P Gas, A Charai, FK LeGoues, A Michel, G Scilla, FM d’Heurle
Journal of applied physics 64 (6), 2973-2980, 1988
75 1988 Some titanium germanium and silicon compounds: Reaction and properties O Thomas, FM d’Heurle, S Delage
Journal of Materials Research 5 (7), 1453-1462, 1990
66 1990 Reaction of titanium with germanium and silicon‐germanium alloys O Thomas, S Delage, FM d’Heurle, G Scilla
Applied physics letters 54 (3), 228-230, 1989
65 1989 Metallurgical reinvestigation of rare earth silicides E Houssay, A Rouault, O Thomas, R Madar, JP Senateur
Applied Surface Science 38 (1-4), 156-161, 1989
61 1989 Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm AA Minkevich, M Gailhanou, JS Micha, B Charlet, V Chamard, O Thomas
Physical Review B 76 (10), 104106, 2007
58 2007 Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ...
ACS nano 9 (9), 9210-9216, 2015
55 2015 Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ...
ACS nano 9 (9), 9210-9216, 2015
55 2015 Interdependence of elastic strain and segregation in metallic multilayers: An X-Ray diffraction study of (111) Au/Ni multilayers S Labat, P Gergaud, O Thomas, B Gilles, A Marty
Journal of Applied Physics 87 (3), 1172-1181, 2000
53 2000 Formation of Ni silicide from Ni (Au) films on (111) Si D Mangelinck, P Gas, A Grob, B Pichaud, O Thomas
Journal of applied physics 79 (8), 4078-4086, 1996
52 1996 Determination of the elastic constants of a cobalt disilicide intermetallic compound G Guénin, M Ignat, O Thomas
Journal of applied physics 68 (12), 6515-6516, 1990
52 1990 Strain field in silicon on insulator lines using high resolution X-ray diffraction M Gailhanou, A Loubens, JS Micha, B Charlet, AA Minkevich, R Fortunier, ...
Applied Physics Letters 90 (11), 111914, 2007
48 2007 Combined synchrotron x-ray diffraction and wafer curvature measurements during Ni–Si reactive film formation C Rivero, P Gergaud, M Gailhanou, O Thomas, B Froment, H Jaouen, ...
Applied Physics Letters 87 (4), 041904, 2005
48 2005 Dislocation storage in single slip-oriented Cu micro-tensile samples: new insights via X-ray microdiffraction C Kirchlechner, D Kiener, C Motz, S Labat, N Vaxelaire, O Perroud, ...
Philosophical Magazine 91 (7-9), 1256-1264, 2011
47 2011 Raman spectra of TiN/AlN superlattices M Bernard, A Deneuville, O Thomas, P Gergaud, P Sandstrom, J Birch
Thin Solid Films 380 (1-2), 252-255, 2000
47 2000 
François WeissCNRS, Grenoble INPBestätigte E-Mail-Adresse bei grenoble-inp.fr
