Raoul Velazco
Raoul Velazco
TIMA - CNRS
Verified email at imag.fr
Title
Cited by
Cited by
Year
Upset hardened memory design for submicron CMOS technology
T Calin, M Nicolaidis, R Velazco
IEEE Transactions on nuclear science 43 (6), 2874-2878, 1996
12511996
A survey on fault injection techniques
H Ziade, RA Ayoubi, R Velazco
Int. Arab J. Inf. Technol. 1 (2), 171-186, 2004
2542004
Predicting error rate for microprocessor-based digital architectures through CEU (Code Emulating Upsets) injection
R Velazco, S Rezgui, R Ecoffet
IEEE Transactions on Nuclear Science 47 (6), 2405-2411, 2000
1512000
Radiation effects on embedded systems
R Velazco, P Fouillat, R Reis
Springer Science & Business Media, 2007
1442007
Experimentally evaluating an automatic approach for generating safety-critical software with respect to transient errors
P Cheynet, B Nicolescu, R Velazco, M Rebaudengo, MS Reorda, ...
IEEE Transactions on Nuclear Science 47 (6), 2231-2236, 2000
1292000
Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits
R Velazco, D Bessot, S Duzellier, R Ecoffet, R Koga
IEEE Transactions on Nuclear Science 41 (6), 2229-2234, 1994
1251994
Detecting soft errors by a purely software approach: method, tools and experimental results
B Nicolescu, R Velazco
Embedded Software for SoC, 39-51, 2003
1122003
Design of SEU-hardened CMOS memory cells: the HIT cell
D Bessot, R Velazco
RADECS 93. Second European Conference on Radiation and its Effects on …, 1993
1051993
Software detection mechanisms providing full coverage against single bit-flip faults
B Nicolescu, Y Savaria, R Velazco
IEEE Transactions on Nuclear science 51 (6), 3510-3518, 2004
792004
Single event effects in static and dynamic registers in a 0.25/spl mu/m CMOS technology
F Faccio, K Kloukinas, A Marchioro, T Calin, J Cosculluela, M Nicolaidis, ...
IEEE Transactions on Nuclear Science 46 (6), 1434-1439, 1999
751999
Deep submicron CMOS technologies for the LHC experiments
P Jarron, G Anelli, T Calin, J Cosculluela, M Campbell, M Delmastro, ...
Nuclear Physics B-Proceedings Supplements 78 (1-3), 625-634, 1999
671999
SEU-hardened storage cell validation using a pulsed laser
R Velazco, T Calin, M Nicolaidis, SC Moss, SD LaLumondiere, VT Tran, ...
IEEE Transactions on Nuclear Science 43 (6), 2843-2848, 1996
651996
Total dose and single event effects (SEE) in a CMOS technology
F Faccio, R Velazco, T Calin, A Marchioro, KC Kloukinas, W Snoeys, ...
621999
An automated SEU fault-injection method and tool for HDL-based designs
W Mansour, R Velazco
IEEE Transactions on Nuclear Science 60 (4), 2728-2733, 2013
602013
SEU induced errors observed in microprocessor systems
V Asenek, C Underwood, R Velazco, S Rezgui, M Oldfield, P Cheynet, ...
IEEE Transactions on Nuclear Science 45 (6), 2876-2883, 1998
541998
THESIC: A testbed suitable for the qualification of integrated circuits devoted to operate in harsh environment
R Velazco, P Cheynet, A Bofill, R Ecoffet
521998
Estimating error rates in processor-based architectures
S Rezgui, R Velazco, R Ecoffet, S Rodriguez, JR Mingo
IEEE Transactions on Nuclear Science 48 (5), 1680-1687, 2001
512001
Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor
R Velazco, S Karoui, T Chapuis, D Benezech, LH Rosier
IEEE Transactions on Nuclear Science 39 (3), 436-440, 1992
511992
Thesic+: A flexible system for see testing
F Faure, P Peronnard, R Velazco, R Ecoffet
Proc. of RADECS, 231234, 2002
472002
Bit flip injection in processor-based architectures: a case study
GC Cardarilli, F Kaddour, A Leandri, M Ottavi, S Pontarelli, R Velazco
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW …, 2002
462002
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Articles 1–20