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Knut Müller-Caspary
Knut Müller-Caspary
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Zitiert von
Zitiert von
Jahr
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
K Müller, FF Krause, A Béché, M Schowalter, V Galioit, S Löffler, ...
Nature communications 5 (1), 5653, 2014
3122014
Measurement of specimen thickness and composition in AlxGa1-xN/GaN using high-angle annular dark field images
A Rosenauer, K Gries, K Müller, A Pretorius, M Schowalter, A Avramescu, ...
Ultramicroscopy 109 (9), 1171-1182, 2009
2112009
Composition mapping in InGaN by scanning transmission electron microscopy
A Rosenauer, T Mehrtens, K Müller, K Gries, M Schowalter, PV Satyam, ...
Ultramicroscopy 111 (8), 1316-1327, 2011
1872011
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy
K Müller-Caspary, FF Krause, T Grieb, S Löffler, M Schowalter, A Béché, ...
Ultramicroscopy 178, 62-80, 2017
1402017
A pnCCD-based, fast direct single electron imaging camera for TEM and STEM
H Ryll, M Simson, R Hartmann, P Holl, M Huth, S Ihle, Y Kondo, P Kotula, ...
Journal of Instrumentation 11 (04), P04006, 2016
1332016
Demonstration of a 2× 2 programmable phase plate for electrons
J Verbeeck, A Béché, K Müller-Caspary, G Guzzinati, MA Luong, ...
Ultramicroscopy 190, 58-65, 2018
1092018
Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis
T Grieb, K Müller, R Fritz, M Schowalter, N Neugebohrn, N Knaub, K Volz, ...
Ultramicroscopy 117, 15-23, 2012
872012
Citric acid based carbon dots with amine type stabilizers: pH-specific luminescence and quantum yield characteristics
F Meierhofer, F Dissinger, F Weigert, J Jungclaus, K Müller-Caspary, ...
The Journal of Physical Chemistry C 124 (16), 8894-8904, 2020
812020
Metal–insulator-transition engineering by modulation tilt-control in perovskite nickelates for room temperature optical switching
Z Liao, N Gauquelin, RJ Green, K Müller-Caspary, I Lobato, L Li, ...
Proceedings of the National Academy of Sciences 115 (38), 9515-9520, 2018
772018
Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy
K Müller, A Rosenauer, M Schowalter, J Zweck, R Fritz, K Volz
Microscopy and Microanalysis 18 (5), 995-1009, 2012
732012
Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device
K Müller, H Ryll, I Ordavo, S Ihle, L Strüder, K Volz, J Zweck, H Soltau, ...
Applied Physics Letters 101 (21), 2012
722012
Effects of instrument imperfections on quantitative scanning transmission electron microscopy
FF Krause, M Schowalter, T Grieb, K Müller-Caspary, T Mehrtens, ...
Ultramicroscopy 161, 146-160, 2016
632016
Sample tilt effects on atom column position determination in ABF–STEM imaging
D Zhou, K Müller-Caspary, W Sigle, FF Krause, A Rosenauer, ...
Ultramicroscopy 160, 110-117, 2016
622016
Synthesis Route for the Self-Assembly of Submicrometer-Sized Colloidosomes with Tailorable Nanopores
K Bollhorst, Tobias and Grieb, Tim and M{\"u}ller-Caspary, Knut and ...
Chemistry of Materials 25, 3464-3471, 2013
542013
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction
C Mahr, K Müller-Caspary, T Grieb, M Schowalter, T Mehrtens, FF Krause, ...
Ultramicroscopy 158, 38-48, 2015
532015
Nanoscopic insights into InGaN/GaN core–shell nanorods: Structure, composition, and luminescence
M Müller, P Veit, FF Krause, T Schimpke, S Metzner, F Bertram, ...
Nano letters 16 (9), 5340-5346, 2016
512016
Nanostructured praseodymium oxide: correlation between phase transitions and catalytic activity
P Sonström, J Birkenstock, Y Borchert, L Schilinsky, P Behrend, K Gries, ...
ChemCatChem 2 (6), 694-704, 2010
472010
Atomic-scale quantification of charge densities in two-dimensional materials
K Müller-Caspary, M Duchamp, M Rösner, V Migunov, F Winkler, H Yang, ...
Physical Review B 98 (12), 121408, 2018
462018
Extraordinary high room-temperature carrier mobility in graphene-WSe heterostructures
L Banszerus, T Sohier, A Epping, F Winkler, F Libisch, F Haupt, ...
arXiv preprint arXiv:1909.09523, 2019
432019
Two-dimensional strain mapping in semiconductors by nano-beam electron diffraction employing a delay-line detector
K Müller-Caspary, A Oelsner, P Potapov
Applied Physics Letters 107 (7), 2015
432015
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