Knut Müller-Caspary
Knut Müller-Caspary
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Zitiert von
Zitiert von
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
K Müller, FF Krause, A Béché, M Schowalter, V Galioit, S Löffler, ...
Nature communications 5 (1), 1-8, 2014
Measurement of specimen thickness and composition in AlxGa1-xN/GaN using high-angle annular dark field images
A Rosenauer, K Gries, K Müller, A Pretorius, M Schowalter, A Avramescu, ...
Ultramicroscopy 109 (9), 1171-1182, 2009
Composition mapping in InGaN by scanning transmission electron microscopy
A Rosenauer, T Mehrtens, K Müller, K Gries, M Schowalter, PV Satyam, ...
Ultramicroscopy 111 (8), 1316-1327, 2011
A pnCCD-based, fast direct single electron imaging camera for TEM and STEM
H Ryll, M Simson, R Hartmann, P Holl, M Huth, S Ihle, Y Kondo, P Kotula, ...
Journal of Instrumentation 11 (04), P04006, 2016
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy
K Müller-Caspary, FF Krause, T Grieb, S Löffler, M Schowalter, A Béché, ...
Ultramicroscopy 178, 62-80, 2017
Demonstration of a 2× 2 programmable phase plate for electrons
J Verbeeck, A Béché, K Müller-Caspary, G Guzzinati, MA Luong, ...
Ultramicroscopy 190, 58-65, 2018
Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis
T Grieb, K Müller, R Fritz, M Schowalter, N Neugebohrn, N Knaub, K Volz, ...
Ultramicroscopy 117, 15-23, 2012
Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy
K Müller, A Rosenauer, M Schowalter, J Zweck, R Fritz, K Volz
Microscopy and Microanalysis 18 (5), 995-1009, 2012
Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device
K Müller, H Ryll, I Ordavo, S Ihle, L Strüder, K Volz, J Zweck, H Soltau, ...
Applied Physics Letters 101 (21), 212110, 2012
Sample tilt effects on atom column position determination in ABF–STEM imaging
D Zhou, K Müller-Caspary, W Sigle, FF Krause, A Rosenauer, ...
Ultramicroscopy 160, 110-117, 2016
Effects of instrument imperfections on quantitative scanning transmission electron microscopy
FF Krause, M Schowalter, T Grieb, K Müller-Caspary, T Mehrtens, ...
Ultramicroscopy 161, 146-160, 2016
Metal–insulator-transition engineering by modulation tilt-control in perovskite nickelates for room temperature optical switching
Z Liao, N Gauquelin, RJ Green, K Müller-Caspary, I Lobato, L Li, ...
Proceedings of the National Academy of Sciences 115 (38), 9515-9520, 2018
Nanoscopic insights into InGaN/GaN core–shell nanorods: structure, composition, and luminescence
M Müller, P Veit, FF Krause, T Schimpke, S Metzner, F Bertram, ...
Nano letters 16 (9), 5340-5346, 2016
Synthesis Route for the Self-Assembly of Submicrometer-Sized Colloidosomes with Tailorable Nanopores
K Bollhorst, Tobias and Grieb, Tim and M{\"u}ller-Caspary, Knut and ...
Chemistry of Materials 25, 3464-3471, 2013
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction
C Mahr, K Müller-Caspary, T Grieb, M Schowalter, T Mehrtens, FF Krause, ...
Ultramicroscopy 158, 38-48, 2015
Citric acid based carbon dots with amine type stabilizers: pH-specific luminescence and quantum yield characteristics
F Meierhofer, F Dissinger, F Weigert, J Jungclaus, K Müller-Caspary, ...
The Journal of Physical Chemistry C 124 (16), 8894-8904, 2020
Two-dimensional strain mapping in semiconductors by nano-beam electron diffraction employing a delay-line detector
K Müller-Caspary, A Oelsner, P Potapov
Applied Physics Letters 107 (7), 072110, 2015
Wrinkling of atomic planes in ultrathin Au nanowires
A Roy, S Kundu, K Müller, A Rosenauer, S Singh, P Pant, MP Gururajan, ...
Nano letters 14 (8), 4859-4866, 2014
Quantitative chemical evaluation of dilute GaNAs using ADF STEM: Avoiding surface strain induced artifacts
T Grieb, K Müller, R Fritz, V Grillo, M Schowalter, K Volz, A Rosenauer
Ultramicroscopy 129, 1-9, 2013
Single atom detection from low contrast-to-noise ratio electron microscopy images
J Fatermans, AJ den Dekker, K Müller-Caspary, I Lobato, C O’Leary, ...
Physical Review Letters, 2018
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