A peak-power estimation for digital circuits design V Yarmolik, I Murashko Fifth Int. Conf.«New Information Technologies».-Minsk: BSEU, 34-38, 2002 | 9 | 2002 |
Transparent Testing of Digital Memories VN Yarmolik, IA Murashko, A Kummert, AA Ivaniuk Minsk Bielarus, Bestprint, 2005 | 8 | 2005 |
The power consumption reducing technique of the pseudo-random test pattern generator and the signature analyzer for the built-in self-test I Murashko, V Yarmolik, M Puczko CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th …, 2003 | 6 | 2003 |
Techniki zmniejszania poboru mocy wykorzystywane podczas wbudowanego samotestowania M Puczko, I Murashko Pomiary, Automatyka, Kontrola 51 (6), 56-58, 2006 | 3 | 2006 |
A new test pattern generator design approach for VLSI built-in self-testing VN Yarmolik, IA Murashko AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 25-35, 1995 | 3 | 1995 |
PSEUDORANDOM SEQUENCE GENERATOR BASED ON CELLULAR-AUTOMATA V YARMOLIK, I MURASHKO AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 9-13, 1993 | 3 | 1993 |
Pseudo random sequence generator construction using cellular automata VN Yarmolik, IA Murashko AUTOMATIC CONTROL AND COMPUTER SCIENCES C/C OF AVTOMATIKA I VYCHISLITEL'NAIA …, 1993 | 3* | 1993 |
Zmniejszanie poboru mocy w samotestujących układach cyfrowych M Puczko, I Murashko, SV Yarmolik Pomiary Automatyka Kontrola 53 (7), 3-5, 2007 | 2 | 2007 |
A High-Speed Pseudorandom Test Pattern Generator IA Murashko, VN Yarmolik Russian Microelectronics 30 (1), 59-66, 2001 | 2 | 2001 |
A new approach to the design of a fast M -sequence generator IA Murashko Automatic Control and Computer Sciences 41 (2), 88-92, 2007 | 1 | 2007 |
A switching activity reducing tecnique for the signature analyzer I Murashko, V Yarmolik Минск, БГУ, 2003 | 1 | 2003 |
Switching Activity Minimization for XOR Gate Decomposition P Barskar, I Murashko ГГТУ им. ПО Сухого, 2017 | | 2017 |
Voice User Identification in Access Control Systems PA Menshakou, IA Murashko, ПА Меньшаков, ИА Мурашко БГУИР, 2017 | | 2017 |
Application of cellular automata with an expanded set of rules to generate pseudo-random test sequences IA Murashko, DE Khrabrov Problemy Fiziki, Matematiki i Tekhniki (Problems of Physics, Mathematics and …, 2014 | | 2014 |
Optimal Low Power XOR Gate Decomposition P Barskar, I Murashko БГУИР, 2012 | | 2012 |
Pseudorandom test pattern generators for built-in self-testing: A power reduction method IA Murashko, VN Yarmolik Automation and Remote Control 65 (8), 1265-1275, 2004 | | 2004 |
High-speed generator for built-in self-testing of multi-chip modules VN Yarmolik, IA Murashko Automatic Control and Computer Sciences 33 (2), 51-59, 1999 | | 1999 |
Built-in self-test scanners for very large-scale integration: a new design approach IA Murashko, AM Shmidman, VN Yarmolik Avtomatika i Telemekhanika, 157-167, 1998 | | 1998 |
The Analysis and Design of a Scan Chain for Built-In VLSI Self-Test VN Yarmolik, IA Murashko, AM Shmidman RUSSIAN MICROELECTRONICS C/C OF MIKROELEKTRONIKA 26, 299-302, 1997 | | 1997 |
Design technique of test pattern generator based on decimation of M-sequence property VN Yarmolik, IA Murashko AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 44-56, 1997 | | 1997 |