Muhammad Ashraful Alam
Muhammad Ashraful Alam
Jai N. Gupta Professor of Electrical Engineering, Purdue University
Bestätigte E-Mail-Adresse bei purdue.edu - Startseite
Titel
Zitiert von
Zitiert von
Jahr
High-efficiency solution-processed perovskite solar cells with millimeter-scale grains
W Nie, H Tsai, R Asadpour, JC Blancon, AJ Neukirch, G Gupta, ...
Science 347 (6221), 522-525, 2015
24332015
High-efficiency two-dimensional Ruddlesden–Popper perovskite solar cells
H Tsai, W Nie, JC Blancon, CC Stoumpos, R Asadpour, B Harutyunyan, ...
Nature 536 (7616), 312-316, 2016
14702016
High-performance electronics using dense, perfectly aligned arrays of single-walled carbon nanotubes
SJ Kang, C Kocabas, T Ozel, M Shim, N Pimparkar, MA Alam, SV Rotkin, ...
Nature nanotechnology 2 (4), 230-236, 2007
12102007
Medium-scale carbon nanotube thin-film integrated circuits on flexible plastic substrates
Q Cao, H Kim, N Pimparkar, JP Kulkarni, C Wang, M Shim, K Roy, ...
Nature 454 (7203), 495-500, 2008
12092008
A comprehensive model of PMOS NBTI degradation
MA Alam, S Mahapatra
Microelectronics Reliability 45 (1), 71-81, 2005
8122005
A critical examination of the mechanics of dynamic NBTI for PMOSFETs
MA Alam
IEEE International Electron Devices Meeting 2003, 14.4. 1-14.4. 4, 2003
4112003
DNA-mediated fluctuations in ionic current through silicon oxide nanopore channels
H Chang, F Kosari, G Andreadakis, MA Alam, G Vasmatzis, R Bashir
Nano letters 4 (8), 1551-1556, 2004
4072004
Macroelectronics: Perspectives on technology and applications
RH Reuss, BR Chalamala, A Moussessian, MG Kane, A Kumar, ...
Proceedings of the IEEE 93 (7), 1239-1256, 2005
4022005
Light-activated photocurrent degradation and self-healing in perovskite solar cells
W Nie, JC Blancon, AJ Neukirch, K Appavoo, H Tsai, M Chhowalla, ...
Nature communications 7 (1), 1-9, 2016
3982016
Performance limits of nanobiosensors
PR Nair, MA Alam
Applied physics letters 88 (23), 233120, 2006
3612006
Recent issues in negative-bias temperature instability: Initial degradation, field dependence of interface trap generation, hole trapping effects, and relaxation
AE Islam, H Kufluoglu, D Varghese, S Mahapatra, MA Alam
IEEE Transactions on Electron Devices 54 (9), 2143-2154, 2007
357*2007
Impact of NBTI on the temporal performance degradation of digital circuits
BC Paul, K Kang, H Kufluoglu, MA Alam, K Roy
IEEE Electron Device Letters 26 (8), 560-562, 2005
3282005
A comprehensive model for PMOS NBTI degradation: Recent progress
MA Alam, H Kufluoglu, D Varghese, S Mahapatra
Microelectronics Reliability 47 (6), 853-862, 2007
3232007
Design considerations of silicon nanowire biosensors
PR Nair, MA Alam
IEEE Transactions on Electron Devices 54 (12), 3400-3408, 2007
3062007
Experimental and theoretical studies of transport through large scale, partially aligned arrays of single-walled carbon nanotubes in thin film type transistors
C Kocabas, N Pimparkar, O Yesilyurt, SJ Kang, MA Alam, JA Rogers
Nano letters 7 (5), 1195-1202, 2007
2982007
Percolating conduction in finite nanotube networks
S Kumar, JY Murthy, MA Alam
Physical review letters 95 (6), 066802, 2005
2952005
Light-induced lattice expansion leads to high-efficiency perovskite solar cells
H Tsai, R Asadpour, JC Blancon, CC Stoumpos, O Durand, JW Strzalka, ...
Science 360 (6384), 67-70, 2018
2592018
Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs
S Mahapatra, PB Kumar, MA Alam
IEEE Transactions on Electron Devices 51 (9), 1371-1379, 2004
2592004
Screening-limited response of nanobiosensors
PR Nair, MA Alam
Nano letters 8 (5), 1281-1285, 2008
2412008
Ultra-thin gate dielectrics: They break down, but do they fail?
BE Weir, PJ Silverman, D Monroe, KS Krisch, MA Alam, GB Alers, ...
International Electron Devices Meeting. IEDM Technical Digest, 73-76, 1997
2361997
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