| Applications of focused ion beam microscopy to materials science specimens MW Phaneuf Micron 30 (3), 277-288, 1999 | 365 | 1999 |
| Surface damage formation during ion-beam thinning of samples for transmission electron microscopy JP McCaffrey, MW Phaneuf, LD Madsen Ultramicroscopy 87 (3), 97-104, 2001 | 282 | 2001 |
| Chemical and biological integration of a mouldable bioactive ceramic material capable of forming apatite in vivo in teeth H Engqvist, JE Schultz-Walz, J Loof, GA Botton, D Mayer, MW Phaneuf, ... Biomaterials 25 (14), 2781-2787, 2004 | 144 | 2004 |
| Multi-resolution correlative focused ion beam scanning electron microscopy: applications to cell biology K Narayan, CM Danielson, K Lagarec, BC Lowekamp, P Coffman, ... Journal of structural biology 185 (3), 278-284, 2014 | 106 | 2014 |
| Wear phenomena on WC-based face seal rings H Engqvist, GA Botton, S Ederyd, M Phaneuf, J Fondelius, N Axén International Journal of Refractory Metals and Hard Materials 18 (1), 39-46, 2000 | 76 | 2000 |
| A novel tool for high‐resolution transmission electron microscopy of intact interfaces between bone and metallic implants H Engqvist, GA Botton, M Couillard, S Mohammadi, J Malmström, ... Journal of Biomedical Materials Research Part A: An Official Journal of The …, 2006 | 63 | 2006 |
| Microscopy imaging method and system MW Phaneuf, KG Lagarec US Patent 9,633,819, 2017 | 61 | 2017 |
| Design analysis workstation for analyzing integrated circuits DF Skoll, T Ludlow, J Elvidge, M Phaneuf US Patent 6,684,379, 2004 | 61 | 2004 |
| Copper device editing: Strategy for focused ion beam milling of copper JD Casey Jr, M Phaneuf, C Chandler, M Megorden, KE Noll, R Schuman, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2002 | 49 | 2002 |
| FIB for materials science applications-A review MW Phaneuf Introduction to focused ion beams, 143-172, 2005 | 48 | 2005 |
| Apparatus and method for surface modification using charged particle beams MW Phaneuf, KG Lagarec, A Krechmer US Patent 8,552,406, 2013 | 47 | 2013 |
| Microscopy study of intergranular stress corrosion cracking of X-52 line pipe steel J Li, M Elboujdaini, B Fang, RW Revie, MW Phaneuf Corrosion 62 (4), 316-322, 2006 | 46 | 2006 |
| “H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM preparation for ex-situ cross-sectional and plan-view FIB specimen preparation RJ Patterson, D Mayer, L Weaver, MW Phaneuf Microscopy and Microanalysis 8 (S02), 566-567, 2002 | 45 | 2002 |
| Apparatus and method for reducing differential sputter rates M Phaneuf, J Li, RF Shuman, K Noll, JD Casey Jr US Patent 6,641,705, 2003 | 43 | 2003 |
| Imaging, spectroscopy and spectroscopic imaging with an energy filtered field emission TEM GA Botton, MW Phaneuf Micron 30 (2), 109-119, 1999 | 36 | 1999 |
| System and method for focused ion beam data analysis MW Phaneuf, MA Anderson, KG Lagarec US Patent 7,897,918, 2011 | 32 | 2011 |
| Characterisation of smooth fine-grained diamond coatings on titanium alloy by TEM/EELS, Raman spectroscopy and X-ray diffraction MI De Barros, V Serin, L Vandenbulcke, G Botton, P Andreazza, ... Diamond and related materials 11 (8), 1544-1551, 2002 | 30 | 2002 |
| Gallium phase formation in Cu and other FCC metals during near-normal incidence Ga-FIB milling and techniques to avoid this phenomenon MW Phaneuf, J Li, JD Casey Microscopy and Microanalysis 8 (S02), 52-53, 2002 | 25 | 2002 |
| Application of focused ion beam (FIB) microscopy to the study of crack profiles YZ Wang, RW Revie, MW Phaneuf, J Li Fatigue & fracture of engineering materials & structures (Print) 22 (3), 251-256, 1999 | 23 | 1999 |
| FIB techniques for analysis of metallurgical specimens MW Phaneuf, J Li Microscopy and Microanalysis 6 (S2), 524-525, 2000 | 21* | 2000 |
