| Three-dimensional atomic imaging of crystalline nanoparticles S Van Aert, KJ Batenburg, MD Rossell, R Erni, G Van Tendeloo Nature 470 (7334), 374-377, 2011 | 625 | 2011 |
| Highly Emissive Divalent-Ion-Doped Colloidal CsPb1–xMxBr3 Perovskite Nanocrystals through Cation Exchange W Van der Stam, JJ Geuchies, T Altantzis, KHW Van Den Bos, ... Journal of the American Chemical Society 139 (11), 4087-4097, 2017 | 565 | 2017 |
| Electronically coupled complementary interfaces between perovskite band insulators M Huijben, G Rijnders, DHA Blank, S Bals, SV Aert, J Verbeeck, ... Nature materials 5 (7), 556-560, 2006 | 432 | 2006 |
| Smart Align—a new tool for robust non-rigid registration of scanning microscope data L Jones, H Yang, TJ Pennycook, MSJ Marshall, S Van Aert, ND Browning, ... Advanced Structural and Chemical Imaging 1 (1), 1-16, 2015 | 353 | 2015 |
| Controlled lateral anisotropy in correlated manganite heterostructures by interface-engineered oxygen octahedral coupling Z Liao, M Huijben, Z Zhong, N Gauquelin, S Macke, RJ Green, S Van Aert, ... Nature materials 15 (4), 425-431, 2016 | 321 | 2016 |
| Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy S Van Aert, S Turner, R Delville, D Schryvers, G Van Tendeloo, EKH Salje Advanced Materials 24 (4), 523-527, 2012 | 256 | 2012 |
| In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals JJ Geuchies, C Van Overbeek, WH Evers, B Goris, A De Backer, ... Nature materials 15 (12), 1248-1254, 2016 | 228 | 2016 |
| Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy S Van Aert, J Verbeeck, R Erni, S Bals, M Luysberg, D Van Dyck, ... Ultramicroscopy 109 (10), 1236-1244, 2009 | 224 | 2009 |
| Model based quantification of EELS spectra J Verbeeck, S Van Aert Ultramicroscopy 101 (2-4), 207-224, 2004 | 218 | 2004 |
| StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images A De Backer, KHW Van den Bos, W Van den Broek, J Sijbers, S Van Aert Ultramicroscopy 171, 104-116, 2016 | 176 | 2016 |
| Three-dimensional atomic imaging of colloidal core–shell nanocrystals S Bals, M Casavola, MA van Huis, S Van Aert, KJ Batenburg, ... Nano letters 11 (8), 3420-3424, 2011 | 160 | 2011 |
| Procedure to count atoms with trustworthy single-atom sensitivity S Van Aert, A De Backer, GT Martinez, B Goris, S Bals, G Van Tendeloo, ... Physical Review B 87 (6), 064107, 2013 | 149 | 2013 |
| Optimized fabrication of high-quality La0. 67Sr0. 33MnO3 thin films considering all essential characteristics H Boschker, M Huijben, A Vailionis, J Verbeeck, S van Aert, M Luysberg, ... Journal of physics D: applied physics 44 (20), 205001, 2011 | 142 | 2011 |
| Advanced electron microscopy for advanced materials G Van Tendeloo, S Bals, S Van Aert, J Verbeeck, D Van Dyck Advanced materials 24 (42), 5655-5675, 2012 | 139 | 2012 |
| Measuring lattice strain in three dimensions through electron microscopy B Goris, J De Beenhouwer, A De Backer, D Zanaga, KJ Batenburg, ... Nano letters 15 (10), 6996-7001, 2015 | 132 | 2015 |
| Atomic scale dynamics of ultrasmall germanium clusters S Bals, S Van Aert, CP Romero, K Lauwaet, MJ Van Bael, B Schoeters, ... Nature communications 3 (1), 897, 2012 | 118 | 2012 |
| Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals B Goris, A De Backer, S Van Aert, S Gómez-Graña, LM Liz-Marzán, ... Nano letters 13 (9), 4236-4241, 2013 | 117 | 2013 |
| Defect engineering in oxide heterostructures by enhanced oxygen surface exchange M Huijben, G Koster, MK Kruize, S Wenderich, J Verbeeck, S Bals, ... Advanced functional materials 23 (42), 5240-5248, 2013 | 115 | 2013 |
| Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework AJ Den Dekker, S Van Aert, A Van den Bos, D Van Dyck Ultramicroscopy 104 (2), 83-106, 2005 | 115 | 2005 |
| Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations A De Backer, GT Martinez, A Rosenauer, S Van Aert Ultramicroscopy 134, 23-33, 2013 | 103 | 2013 |
Sara BalsFull Professor, University of AntwerpBestätigte E-Mail-Adresse bei uantwerpen.be
