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Hiroyuki Kageshima
Hiroyuki Kageshima
Bestätigte E-Mail-Adresse bei riko.shimane-u.ac.jp - Startseite
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Zitiert von
Zitiert von
Jahr
Microscopic thickness determination of thin graphite films formed on from quantized oscillation in reflectivity of low-energy electrons
H Hibino, H Kageshima, F Maeda, M Nagase, Y Kobayashi, H Yamaguchi
Physical Review B 77 (7), 075413, 2008
4612008
Dependence of electronic properties of epitaxial few-layer graphene on the number of layers investigated by photoelectron emission microscopy
H Hibino, H Kageshima, M Kotsugi, F Maeda, FZ Guo, Y Watanabe
Physical Review B 79 (12), 125437, 2009
3052009
First-Principles Study of Oxide Growth on Si(100) Surfaces and at /Si(100) Interfaces
H Kageshima, K Shiraishi
Physical Review Letters 81 (26), 5936, 1998
2911998
Momentum-matrix-element calculation using pseudopotentials
H Kageshima, K Shiraishi
Physical Review B 56 (23), 14985, 1997
2091997
Universal theory of Si oxidation rate and importance of interfacial Si emission
H Kageshima, K Shiraishi, M Uematsu
Japanese journal of applied physics 38 (9A), L971, 1999
2021999
First-principles theory of scanning tunneling microscopy
M Tsukada, K Kobayashi, N Isshiki, H Kageshima
Surface Science Reports 13 (8), 267-304, 1991
1791991
Epitaxial few-layer graphene: towards single crystal growth
H Hibino, H Kageshima, M Nagase
Journal of Physics D: Applied Physics 43 (37), 374005, 2010
1582010
Growth and low-energy electron microscopy characterization of monolayer hexagonal boron nitride on epitaxial cobalt
CM Orofeo, S Suzuki, H Kageshima, H Hibino
Nano Research 6, 335-347, 2013
1292013
Carrier transport mechanism in graphene on SiC (0001)
S Tanabe, Y Sekine, H Kageshima, M Nagase, H Hibino
Physical Review B 84 (11), 115458, 2011
1182011
Mechanism of potential profile formation in silicon single-electron transistors fabricated using pattern-dependent oxidation
S Horiguchi, M Nagase, K Shiraishi, H Kageshima, Y Takahashi, ...
Japanese Journal of Applied Physics 40 (1A), L29, 2001
1132001
Stacking domains of epitaxial few-layer graphene on SiC (0001)
H Hibino, S Mizuno, H Kageshima, M Nagase, H Yamaguchi
Physical Review B 80 (8), 085406, 2009
1112009
Scanning-tunneling-microscopy observation of thermal oxide growth on Si (111) 7× 7 surfaces
Y Ono, M Tabe, H Kageshima
Physical Review B 48 (19), 14291, 1993
1061993
Self-diffusion of Si in thermally grown SiO2 under equilibrium conditions
T Takahashi, S Fukatsu, KM Itoh, M Uematsu, A Fujiwara, H Kageshima, ...
Journal of applied physics 93 (6), 3674-3676, 2003
1052003
Theoretical investigation of nitrogen-doping effect on vacancy aggregation processes in Si
H Kageshima, A Taguchi, K Wada
Applied Physics Letters 76 (25), 3718-3720, 2000
1052000
Effect of the interface on self-diffusion of Si in semiconductor-grade
S Fukatsu, T Takahashi, KM Itoh, M Uematsu, A Fujiwara, H Kageshima, ...
Applied physics letters 83 (19), 3897-3899, 2003
852003
Half-integer quantum Hall effect in gate-controlled epitaxial graphene devices
S Tanabe, Y Sekine, H Kageshima, M Nagase, H Hibino
Applied physics express 3 (7), 075102, 2010
842010
Modeling of Si self-diffusion in Effect of the interface including time-dependent diffusivity
M Uematsu, H Kageshima, Y Takahashi, S Fukatsu, KM Itoh, K Shiraishi, ...
Applied physics letters 84 (6), 876-878, 2004
812004
Unified simulation of silicon oxidation based on the interfacial silicon emission model
M Uematsu, H Kageshima, K Shiraishi
Japanese Journal of Applied Physics 39 (7B), L699, 2000
812000
Theoretical study of epitaxial graphene growth on SiC (0001) surfaces
H Kageshima, H Hibino, M Nagase, H Yamaguchi
Applied physics express 2 (6), 065502, 2009
802009
Growth and electronic transport properties of epitaxial graphene on SiC
H Hibino, S Tanabe, S Mizuno, H Kageshima
Journal of physics D: Applied physics 45 (15), 154008, 2012
762012
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