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Martin Seah
Martin Seah
Bestätigte E-Mail-Adresse bei npl.co.uk
Titel
Zitiert von
Zitiert von
Jahr
Practical surface analysis
D Briggs
Auger and X-Ray Photoelecton Spectroscory 1, 151-152, 1990
107611990
Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
MP Seah, WA Dench
Surface and interface analysis 1 (1), 2-11, 1979
68891979
Elastic scattering corrections in AES and XPS. II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments
PJ Cumpson, MP Seah
Surface and Interface Analysis: An International Journal devoted to the …, 1997
6781997
Segregation to interfaces
ED Hondros, MP Seah
International Metals Reviews 22 (1), 262-301, 1977
5911977
Grain boundary segregation
MP Seah, ED Hondros
Proceedings of the Royal Society of London A: Mathematical, Physical and …, 1973
5281973
The quantitative analysis of surfaces by XPS: a review
MP Seah
Surface and Interface Analysis 2 (6), 222-239, 1980
4921980
Quantitative Auger electron spectroscopy and electron ranges
MP Seah
Surface Science 32 (3), 703-728, 1972
4801972
Adsorption-induced interface decohesion
MP Seah
Acta Metallurgica 28 (7), 955-962, 1980
4431980
Quantification in AES and XPS
MP Seah
Quantitative Microbeam Analysis, 1-42, 2017
365*2017
XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies
MT Anthony, MP Seah
Surface and interface analysis 6 (3), 95-106, 1984
3221984
The theory of grain boundary segregation in terms of surface adsorption analogues
ED Hondros, MP Seah
Metallurgical Transactions A 8 (9), 1363-1371, 1977
3181977
XPS: binding energy calibration of electron spectrometers 5—re‐evaluation of the reference energies
MP Seah, IS Gilmore, G Beamson
Surface and Interface Analysis: An International Journal devoted to the …, 1998
3161998
Precision, accuracy, and uncertainty in quantitative surface analyses by Auger‐electron spectroscopy and x‐ray photoelectron spectroscopy
CJ Powell, MP Seah
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8 (2 …, 1990
3141990
Interface adsorption, embrittlement and fracture in metallurgy: A review
MP Seah
Surface Science 53 (1), 168-212, 1975
2651975
Grain boundary segregation
MP Seah
Journal of Physics F: Metal Physics 10 (6), 1043, 1980
2631980
POST‐1989 calibration energies for x‐ray photoelectron spectrometers and the 1990 JOSEPHSON constant
MP Seah
Surface and Interface Analysis 14 (8), 488-488, 1989
2511989
Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness
MP Seah, SJ Spencer
Surface and Interface Analysis: An International Journal devoted to the …, 2002
2422002
Kinetics of surface segregation
C Lea, MP Seah
Philosophical Magazine 35 (1), 213-228, 1977
2261977
Grain boundary segregation and the Tt dependence of temper brittleness
MP Seah
Acta metallurgica 25 (3), 345-357, 1977
2231977
The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis
CA Clifford, MP Seah
Nanotechnology 16 (9), 1666, 2005
2132005
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