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Martin Seah
Martin Seah
Bestätigte E-Mail-Adresse bei npl.co.uk
Titel
Zitiert von
Zitiert von
Jahr
Practical surface analysis
D Briggs
Auger and X-Ray Photoelecton Spectroscory 1, 151-152, 1990
11064*1990
Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
MP Seah, WA Dench
Surface and interface analysis 1 (1), 2-11, 1979
75751979
Elastic scattering corrections in AES and XPS. II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments
PJ Cumpson, MP Seah
Surface and Interface Analysis: An International Journal devoted to the …, 1997
7211997
Segregation to interfaces
ED Hondros, MP Seah
International Metals Reviews 22 (1), 262-301, 1977
6011977
Grain boundary segregation
MP Seah, ED Hondros
Proceedings of the Royal Society of London A: Mathematical, Physical and …, 1973
5691973
The quantitative analysis of surfaces by XPS: A review
MP Seah
Surface and Interface Analysis 2 (6), 222-239, 1980
5471980
Quantitative Auger electron spectroscopy and electron ranges
MP Seah
Surface Science 32 (3), 703-728, 1972
4881972
Adsorption-induced interface decohesion
MP Seah
Acta Metallurgica 28 (7), 955-962, 1980
4201980
Quantification in AES and XPS
MP Seah
Quantitative Microbeam Analysis, 1-42, 2017
388*2017
The theory of grain boundary segregation in terms of surface adsorption analogues
ED Hondros, MP Seah
Metallurgical Transactions A 8, 1363-1371, 1977
3551977
XPS: binding energy calibration of electron spectrometers 5—re‐evaluation of the reference energies
MP Seah, IS Gilmore, G Beamson
Surface and Interface Analysis: An International Journal devoted to the …, 1998
3531998
XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies
MT Anthony, MP Seah
Surface and interface analysis 6 (3), 95-106, 1984
3291984
Precision, accuracy, and uncertainty in quantitative surface analyses by Auger‐electron spectroscopy and x‐ray photoelectron spectroscopy
CJ Powell, MP Seah
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8 (2 …, 1990
3231990
Interface adsorption, embrittlement and fracture in metallurgy: A review
MP Seah
Surface Science 53 (1), 168-212, 1975
2851975
Grain boundary segregation
MP Seah
Journal of Physics F: Metal Physics 10 (6), 1043, 1980
2841980
POST‐1989 calibration energies for x‐ray photoelectron spectrometers and the 1990 JOSEPHSON constant
MP Seah
Surface and Interface Analysis 14 (8), 488-488, 1989
2771989
Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness
MP Seah, SJ Spencer
Surface and Interface Analysis: An International Journal devoted to the …, 2002
2542002
Grain boundary segregation and the Tt dependence of temper brittleness
MP Seah
Acta metallurgica 25 (3), 345-357, 1977
2421977
Summary of ISO/TC 201 Standard: VII ISO 15472: 2001—surface chemical analysis—x‐ray photoelectron spectrometers—calibration of energy scales
MP Seah
Surface and Interface Analysis: An International Journal devoted to the …, 2001
2372001
Empirically drived atomic sensitivity factors for xps
D Briggs, M Seah
Practical Surface Analysis, 1, 635-650, 1990
2371990
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