Bias-dependent imaging of the In-terminated InAs(001) C Kendrick, G LeLay, A Kahn
Physical Review B 54 (24), 17877, 1996
85 1996 STM study of the organic semiconductor PTCDA on highly-oriented pyrolytic graphite C Kendrick, A Kahn, SR Forrest
Applied surface science 104, 586-594, 1996
83 1996 Failure analysis and optimization of metal fuses for post package trimming YH Cheng, CE Kendrick
2007 IEEE International Reliability Physics Symposium Proceedings. 45th …, 2007
80 2007 Epitaxial growth and phase transition in multilayers of the organic semiconductor PTCDA on InAs (0 0 1) C Kendrick, A Kahn
Journal of crystal growth 181 (3), 181-192, 1997
45 1997 Organic-inorganic interfaces: principles of quasi-epitaxy of a molecular semiconductor on inorganic compound semiconductors C Kendrick, A Kahn
Applied surface science 123, 405-411, 1998
39 1998 Growth of the Organic Molecular Semiconductor PTCDA on Se-Passivated GaAs (100): An STM Study C Kendrick, A Kahn
Surface Review and Letters 5 (01), 289-293, 1998
18 1998 Studies of bias temperature instabilities in 4H-SiC DMOSFETs A Ghosh, J Hao, M Cook, C Kendrick, SA Suliman, GDR Hall, T Kopley, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020
15 2020 Polysilicon resistor stability under voltage stress for safe-operating area characterization C Kendrick, M Cook, JP Gambino, T Myers, J Slezak, T Hirano, T Sano, ...
2018 IEEE International Reliability Physics Symposium (IRPS), P-RT. 4-1-P-RT …, 2018
8 2018 Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors KEK Holden, GDR Hall, M Cook, C Kendrick, K Pabst, B Greenwood, ...
2021 IEEE International Reliability Physics Symposium (IRPS), 1-10, 2021
4 2021 IEEE International Reliability Physics Symposium (IRPS) KE Holden, GD Hall, M Cook, C Kendrick, K Pabst, B Greenwood, ...
Monterey, CA, USA, 1-10, 2021
3 2021 Comparison of extraction methods for threshold voltage shift in NBTI characterization YH Cheng, M Cook, C Kendrick
2020 IEEE 33rd International Conference on Microelectronic Test Structures …, 2020
3 2020 Reliability of NLDMOS transistors subjected to repetitive power pulses C Kendrick, R Stout, M Cook
2008 IEEE International Reliability Physics Symposium, 651-652, 2008
3 2008 Structural and Spectroscopic Investigation of the In-Terminated InAs (100)(4× 2)/c (8× 2) Reconstruction C Kendrick, A Kahn, G Le Lay
Surface Review and Letters 5 (01), 229-234, 1998
2 1998 Epitaxial growth of the organic molecular crystal PTCDA on crystalline inorganic substrates CE Kendrick
Princeton University, 1997
1997 
