| A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry AAR Abu Ebayyeh, A Mousavi IEEE Access 8, 183192-183271, 2020 | 148 | 2020 |
| An Improved Capsule Network (WaferCaps) for Wafer Bin Map Classification Based on DCGAN Data Upsampling AAR Abu Ebayyeh, S Danishvar, A Mousavi IEEE Transactions on Semiconductor Manufacturing 35 (1), 50-59, 2021 | 22 | 2021 |
| Design and Implementation of Education and Training Graphical User Interface (GUI) Based on NI LabVIEW for the FESTO MPS PA Compact Workstation S Ahmad, S Salman, AAR Abu Ebayyeh International Review of Automatic Control 12 (2), 67 - 75, 2019 | 5 | 2019 |
| Waveguide quality inspection in quantum cascade lasers: A capsule neural network approach AAR Abu Ebayyeh, A Mousavi, S Danishvar, S Blaser, T Gresch, O Landry, ... Expert Systems with Applications, 118421, 2022 | 4 | 2022 |
| Printed Circuit Board Inspection: Fusion of Optical and X-ray Images (FOXi) for Electronic Components Classification D Starodubov, S Danishvar, R Ott, AAR Abu Ebayyeh, N Cummings, ... 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-7, 2022 | 1 | 2022 |
| Defect detection on optoelectronical devices to assist decision making: a real industry 4.0 case study GP Moustris, G Kouzas, S Fourakis, G Fiotakis, A Chondronasios, ... Frontiers in Manufacturing Technology, 20, 2022 | | 2022 |
| The design of a microcontroller-based automatic liquid level control system S Ahmad, AAR Abu Ebayyeh, A Alhashmi International Journal of Engineering and Technology 8 (4), 636 - 641, 2019 | | 2019 |
| Pcb Components Recognition Using Wafercaps: A Data Fusion and Deep Learning Approach D Starodubov, S Danishvar, AARM Abu Ebayyeh, A Mousavi Available at SSRN 4475275, 0 | | |
