Duygu Akbulut
Duygu Akbulut
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Cited by
Cited by
Scattering lens resolves sub-100 nm structures with visible light
EG Van Putten, D Akbulut, J Bertolotti, WL Vos, A Lagendijk, AP Mosk
Physical review letters 106 (19), 193905, 2011
Focusing light through random photonic media by binary amplitude modulation
D Akbulut, TJ Huisman, EG van Putten, WL Vos, AP Mosk
Optics express 19 (5), 4017-4029, 2011
Ultralow threshold laser action from toroidal polymer microcavity
A Tulek, D Akbulut, M Bayindir
Applied Physics Letters 94 (20), 133, 2009
Optical transmission matrix as a probe of the photonic strength
D Akbulut, T Strudley, J Bertolotti, EPAM Bakkers, A Lagendijk, ...
Physical Review A 94 (4), 043817, 2016
Observation of intensity statistics of light transmitted through 3D random media
T Strudley, D Akbulut, WL Vos, A Lagendijk, AP Mosk, OL Muskens
Optics letters 39 (21), 6347-6350, 2014
Method and apparatus for inspection and metrology
PD Van Voorst, D Akbulut, K Van Berkel, JJM Van De Wijdeven, F Zijp
US Patent 9,811,001, 2017
Measurements of strong correlations in the transport of light through strongly scattering materials
D Akbulut
Generation of new frequencies in toroid microcavities
D Akbulut, A Tulek, M Bayindir
2008 10th Anniversary International Conference on Transparent Optical …, 2008
Metrology apparatus, lithographic system, and method of measuring a structure
J Ravensbergen, D Akbulut, N Pandey, L Jin
US Patent 10,444,640, 2019
Measurements on the optical transmission matrices of strongly scattering nanowire layers
D Akbulut, T Strudley, J Bertolotti, T Zehender, EPAM Bakkers, ...
International Quantum Electronics Conference, IH_P_19, 2013
Lasing action and supercontinuum generation in nano-and micro-structures
D Akbulut
bilkent university, 2009
High-resolution phase and amplitude modulation using a digital micromirror device
SA Goorden, J Bertolotti, H Yılmaz, D Akbulut, WL Vos, AP Mosk
The European Conference on Lasers and Electro-Optics, CL_P_14, 2013
Metrology Sensor, Lithographic Apparatus and Method for Manufacturing Devices
SA Goorden, SR Huisman, D Akbulut, P Alessandro, SGJ Mathijssen
US Patent App. 16/611,500, 2020
Metrology sensor, lithographic apparatus and method for manufacturing devices
SA Goorden, N Pandey, D Akbulut, P Alessandro, SR Huisman
US Patent App. 16/470,905, 2020
Position sensor, lithographic apparatus and method for manufacturing devices
SR Huisman, SGJ Mathijssen, SA Goorden, D Akbulut, P Alessandro
US Patent 10,527,959, 2020
Metrology apparatus, lithographic system, and method of measuring a structure
J Ravensbergen, D Akbulut, N Pandey, L Jin
US Patent App. 16/562,869, 2020
Metrology Apparatus
N Pandey, AJ Den Boef, D Akbulut, MJM Van Dam, H Butler, HAJ Cramer, ...
US Patent App. 16/431,833, 2019
Measurement Apparatus and Method of Measuring a Target
L Jin, Z Zili, D Akbulut, S Tarabrin
US Patent App. 16/410,250, 2019
Method and apparatus for deriving corrections, method and apparatus for determining a property of a structure, device manufacturing method
N Kumar, AJH Schellekens, ST VAN DER POST, F Zijp, WMJM Coene, ...
US Patent App. 16/331,547, 2019
Position sensing arrangement and lithographic apparatus including such an arrangement, position sensing method and device manufacturing method
SR Huisman, P Alessandro, D Akbulut, SA Goorden, AJ Den Boef
US Patent 10,317,808, 2019
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