Alberto Herrera-Gomez
Alberto Herrera-Gomez
CINVESTAV-Unidad Queretaro
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Cited by
Cited by
Modern theory and applications of photocathodes
WE Spicer, A Herrera-Gomez
Photodetectors and Power Meters 2022, 18-35, 1993
Practical methods for background subtraction in photoemission spectra
A Herrera‐Gomez, M Bravo‐Sanchez, O Ceballos‐Sanchez, ...
Surface and Interface Analysis 46 (10-11), 897-905, 2014
Accurate peak fitting and subsequent quantitative composition analysis of the spectrum of Co 2p obtained with Al Kα radiation: I: cobalt spinel
D Cabrera‐German, G Gomez‐Sosa, A Herrera‐Gomez
Surface and Interface Analysis 48 (5), 252-256, 2016
Chemical depth profile of ultrathin nitrided films
A Herrera-Gómez, A Hegedus, PL Meissner
Applied physics letters 81 (6), 1014-1016, 2002
Identification of bound water through infrared spectroscopy in methylcellulose
G Velazquez, A Herrera-Gómez, MO Martı́n-Polo
Journal of Food Engineering 59 (1), 79-84, 2003
Uniqueness plots: A simple graphical tool for identifying poor peak fits in X-ray photoelectron spectroscopy
B Singh, A Diwan, V Jain, A Herrera-Gomez, J Terry, MR Linford
Applied Surface Science 387, 155-162, 2016
Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature
GH Major, TG Avval, B Moeini, G Pinto, D Shah, V Jain, V Carver, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 38 (6 …, 2020
The slope-background for the near-peak regimen of photoemission spectra
A Herrera-Gomez, M Bravo-Sanchez, FS Aguirre-Tostado, ...
Journal of Electron Spectroscopy and Related Phenomena 189, 76-80, 2013
Photoemission from the Sr/Si (001) interface
A Herrera-Gomez, FS Aguirre-Tostado, Y Sun, P Pianetta, Z Yu, ...
Journal of Applied Physics 90 (12), 6070-6072, 2001
Photocatalytic degradation of 2, 4-dichlorophenoxyacetic acid under visible light: effect of synthesis route
K Del Ángel-Sanchez, O Vázquez-Cuchillo, A Aguilar-Elguezabal, ...
Materials chemistry and physics 139 (2-3), 423-430, 2013
Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities
MH Engelhard, DR Baer, A Herrera-Gomez, PMA Sherwood
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 38 (6 …, 2020
Resolving overlapping peaks in ARXPS data: the effect of noise and fitting method
J Muñoz-Flores, A Herrera-Gomez
Journal of Electron Spectroscopy and Related Phenomena 184 (11-12), 533-541, 2012
Physics of high‐intensity nanosecond electron source: Charge limit phenomenon in GaAs photocathodes
A Herrera‐Gómez, G Vergara, WE Spicer
Journal of applied physics 79 (9), 7318-7323, 1996
Report on the 47th IUVSTA Workshop ‘Angle‐Resolved XPS: the current status and future prospects for angle‐resolved XPS of nano and subnano films’
A Herrera‐Gomez, JT Grant, PJ Cumpson, M Jenko, FS Aguirre‐Tostado, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2009
Analysis of the water bound to a polymer matrix by infrared spectroscopy
A Herrera-Gómez, G Velázquez-Cruz, MO Martín-Polo
Journal of Applied Physics 89 (10), 5431-5437, 2001
Composition assessment of ferric oxide by accurate peak fitting of the Fe 2p photoemission spectrum
M Bravo Sanchez, JA Huerta‐Ruelas, D Cabrera‐German, ...
Surface and Interface Analysis 49 (4), 253-260, 2017
Electronic structure and Schottky-barrier formation on GaAs (100) surfaces prepared by thermal desorption of a protective arsenic coating
CJ Spindt, M Yamada, PL Meissner, KE Miyano, T Kendelewicz, ...
Physical Review B 45 (19), 11108, 1992
Proliferation of faulty materials data analysis in the literature
MR Linford, VS Smentkowski, JT Grant, CR Brundle, PMA Sherwood, ...
Microscopy and Microanalysis 26 (1), 1-2, 2020
In/Si (111)-√ 3×√ 3 interface: An unrelaxed T 4 geometry
JC Woicik, T Kendelewicz, A Herrera-Gomez, KE Miyano, PL Cowan, ...
Physical review letters 71 (8), 1204, 1993
Geometrical structure of the 1 2− M L (2× 1) and 1 3− M L (2× 3) Ba/Si (001) interfaces
A Herrera-Gómez, P Pianetta, D Marshall, E Nelson, WE Spicer
Physical Review B 61 (19), 12988, 2000
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