Michael Horn-von Hoegen

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Frank Meyer zu HeringdorfProfessor for Physics / Director ICAN, University of Duisburg-EssenVerified email at uni-due.de
Andrea CavalleriMax Planck Institute for the Structure and Dynamics of Matter & University of OxfordVerified email at physics.ox.ac.uk
Craig W SidersLawrence Livermore National LaboratoryVerified email at llnl.gov
Anja Hanisch-BlicharskiProfessorVerified email at fom-net.de
Matt CopelIBM TJ Watson Research CenterVerified email at us.ibm.com
Percy ZahlBrookhaven National LaboratoryVerified email at bnl.gov
Jens FaltaUniversität BremenVerified email at ifp.uni-bremen.de
Manuel LiggesFraunhofer Institute for Microelectronic Circuits and SystemsVerified email at ims.fraunhofer.de
Peter Kuryout-of-the-box systems GmbHVerified email at uni-due.de
Claudius KleinVDI Technologiezentrum GmbHVerified email at uni-due.de
Rudolf TrompIBM T.J. Watson Research Center / Leiden UniversityVerified email at us.ibm.com
Thomas MichelyProfessor der Experimentalphysik, Universität zu KölnVerified email at ph2.uni-koeln.de
Johann CorauxCNRS researcher at Institut Néel, GrenobleVerified email at neel.cnrs.fr
Simon SindermannUniversity Duisburg-EssenVerified email at uni-due.de
Christian BrandUniversität Duisburg-Essen, ExperimentalphysikVerified email at uni-due.de
Carsten BusseProfessor of Physics, University of Siegen, GermanyVerified email at uni-siegen.de
Michael C. TringidesDepartment of Physics and Astronomy Iowa State University and Ames LaboratoryVerified email at iastate.edu
Germán SciainiThe Ultrafast electron Imaging Laboratory, University of WaterlooVerified email at uwaterloo.ca
Ralph ErnstorferTechnische Universität Berlin and Fritz-Haber-Institut BerlinVerified email at tu-berlin.de
G Jnawali

Michael Horn-von Hoegen

Professor für Experimentalphysik, Universität Duisburg-Essen

Verified email at uni-due.de

Surface Science of Semiconductors Hetero Epitaxial Growth Surfactants Low Energy Electron Diffraction Ultrafast Electron Diffraction


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Femtosecond X-ray measurement of coherent lattice vibrations near the Lindemann stability limit K Sokolowski-Tinten, C Blome, J Blums, A Cavalleri, C Dietrich, ... Nature 422, 287-289, 2003	768	2003
Detection of nonthermal melting by ultrafast X-ray diffraction CW Siders, A Cavalleri, K Sokolowski-Tinten, C Toth, T Guo, M Kammler, ... Science 286 (5443), 1340-1342, 1999	749	1999
Ultrafast bond softening in bismuth: Mapping a solid's interatomic potential with x-rays DM Fritz, DA Reis, B Adams, RA Akre, J Arthur, C Blome, PH Bucksbaum, ... Science 315 (5812), 633-636, 2007	499	2007
Influence of surfactants in Ge and Si epitaxy on Si (001) M Copel, MC Reuter, M Horn-von Hoegen, RM Tromp Physical Review B 42 (18), 11682, 1990	390	1990
Electronic acceleration of atomic motions and disordering in bismuth G Sciaini, M Harb, SG Kruglik, T Payer, CT Hebeisen, FJM Heringdorf, ... Nature 458 (7234), 56-59, 2009	356	2009
Femtosecond X-ray measurement of ultrafast melting and large acoustic transients K Sokolowski-Tinten, C Blome, C Dietrich, A Tarasevitch, ... Physical Review Letters 87 (22), 225701-225701, 2001	341	2001
Defect self-annihilation in surfactant-mediated epitaxial growth M Horn-von Hoegen, FK LeGoues, M Copel, MC Reuter, RM Tromp Physical Review Letters 67 (9), 1130-1133, 1991	316	1991
Anharmonic lattice dynamics in germanium measured with ultrafast X-ray diffraction A Cavalleri, CW Siders, FLH Brown, DM Leitner, C Toth, JA Squier, ... Physical Review Letters 85 (3), 586-589, 2000	213	2000
Growth of semiconductor layers studied by spot profile analysing low energy electron diffraction-Part I M Horn-von Hoegen Zeitschrift für Kristallographie 214 (10), 591-629, 1999	204*	1999
Interplay of wrinkles, strain, and lattice parameter in graphene on iridium H Hattab, AT N’Diaye, D Wall, C Klein, G Jnawali, J Coraux, C Busse, ... Nano letters 12 (2), 678-682, 2012	174	2012
Optically excited structural transition in atomic wires on surfaces at the quantum limit T Frigge, B Hafke, T Witte, B Krenzer, C Streubühr, A Samad Syed, ... Nature 544 (7649), 207-211, 2017	146	2017
A new two‐dimensional particle detector for a toroidal electrostatic analyzer RM Tromp, M Copel, MC Reuter, M Horn von Hoegen, J Speidell, ... Review of scientific instruments 62 (11), 2679-2683, 1991	144	1991
In situ observation of stress relaxation in epitaxial graphene R Gastel, AJ Martínez-Galera, J Coraux, H Hattab, D Wall, FJ Heringdorf, ... New Journal of Physics 11, 113056, 2009	143	2009
Selecting a single orientation for millimeter sized graphene sheets R van Gastel, AT N’Diaye, D Wall, J Coraux, C Busse, NM Buckanie, ... Applied physics letters 95 (12), 2009	141	2009
Growth temperature dependent graphene alignment on Ir (111) H Hattab, AT N’Diaye, D Wall, G Jnawali, J Coraux, C Busse, ... Applied Physics Letters 98 (14), 2011	134	2011
Layer-by-layer growth of germanium on Si (100): strain-induced morphology and the influence of surfactants U Kohler, O Jusko, B Muller, M Horn-von Hoegen, M Pook Ultramicroscopy 42, 832-837, 1992	133	1992
Normal-incidence photoemission electron microscopy (NI-PEEM) for imaging surface plasmon polaritons P Kahl, S Wall, C Witt, C Schneider, D Bayer, A Fischer, P Melchior, ... Plasmonics 9, 1401-1407, 2014	119	2014
Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold A Cavalleri, CW Siders, C Rose-Petruck, R Jimenez, C Tóth, JA Squier, ... Physical Review B 63 (19), 193306-193306, 2001	112	2001
Short-range surface plasmonics: Localized electron emission dynamics from a 60-nm spot on an atomically flat single-crystalline gold surface B Frank, P Kahl, D Podbiel, G Spektor, M Orenstein, L Fu, T Weiss, ... Science Advances 3 (7), e1700721, 2017	111	2017
Formation of interfacial dislocation network in surfactant mediated growth of Ge on Si (111) investigated by SPA-LEED. M Horn-von Hoegen, A Al-Falou, H Pietsch, BH Müller, M Henzler Surface science 298 (1), 29-42, 1993	105	1993

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