| Current vs. logic testing of gate oxide short, floating gate and bridging failures in CMOS R Rodríguez-Montañés, JA Segura, VH Champac, J Figueras, JA Rubio 1991, Proceedings. International Test Conference, 510, 1991 | 129 | 1991 |
| Electrical model of the floating gate defect in CMOS ICs: implications on I/sub DDQ/testing VH Champac, A Rubio, J Figueras IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994 | 128 | 1994 |
| Fault Modelling of Gate Oxide Short, Floating Gate and Bridging Failuers in CMOS Circuit VH Champac Proc. of European Test Conf., 143-148, 1991 | 58 | 1991 |
| Quiescent current analysis and experimentation of defective CMOS circuits JA Segura, VH Champac, R Rodriguez-Montanes, J Figueras, JA Rubio Journal of Electronic Testing 3, 337-348, 1992 | 54 | 1992 |
| Noise-tolerance improvement in dynamic CMOS logic circuits F Mendoza-Hernandez, M Linares-Aranda, V Champac IEE Proceedings-Circuits, Devices and Systems 153 (6), 565-573, 2006 | 48 | 2006 |
| Adaptive error-prediction flip-flop for performance failure prediction with aging sensors CV Martins, J Semião, JC Vazquez, V Champac, M Santos, IC Teixeira, ... 29th VLSI Test Symposium, 203-208, 2011 | 45 | 2011 |
| Predictive error detection by on-line aging monitoring JC Vazquez, V Champac, AM Ziesemer, R Reis, J Semião, IC Teixeira, ... 2010 IEEE 16th International On-Line Testing Symposium, 9-14, 2010 | 45 | 2010 |
| Built-in aging monitoring for safety-critical applications JC Vazquez, V Champac, AM Ziesemer, R Reis, IC Teixeira, MB Santos, ... 2009 15th IEEE International On-Line Testing Symposium, 9-14, 2009 | 45 | 2009 |
| Low-sensitivity to process variations aging sensor for automotive safety-critical applications JC Vazquez, V Champac, AM Ziesemer, R Reis, IC Teixeira, MB Santos, ... 2010 28th VLSI Test Symposium (VTS), 238-243, 2010 | 43 | 2010 |
| Detectability conditions for interconnection open defects VH Champac, A Zenteno Proceedings 18th IEEE VLSI Test Symposium, 305-311, 2000 | 38 | 2000 |
| Programmable aging sensor for automotive safety-critical applications JC Vazquez, V Champac, IC Teixeira, MB Santos, JP Teixeira 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010 | 33 | 2010 |
| Test of interconnection opens considering coupling signals R Gomez, A Giron, V Champac 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2005 | 27 | 2005 |
| IDDQ testing of opens in CMOS SRAMs VH Champac, J Castillejos, J Figueras Journal of Electronic Testing 15, 53-62, 1999 | 27 | 1999 |
| Timing performance of nanometer digital circuits under process variations V Champac, JG Gervacio Springer International Publishing, 2018 | 26 | 2018 |
| Aging-aware power or frequency tuning with predictive fault detection J Pachito, CV Martins, B Jacinto, J Semiao, JC Vazquez, V Champac, ... IEEE Design & Test of Computers 29 (5), 27-36, 2012 | 25 | 2012 |
| Stuck-open fault leakage and testing in nanometer technologies J Vazquez, V Champac, C Hawkins, J Segura 2009 27th IEEE VLSI Test Symposium, 315-320, 2009 | 21 | 2009 |
| Testability of floating gate defects in sequential circuits VH Champac, J Figueras Proceedings 13th IEEE VLSI Test Symposium, 202-207, 1995 | 20 | 1995 |
| Testing of stuck-open faults in nanometer technologies V Champac, JV Hernandez, S Barcelo, R Gomez, C Hawkins, J Segura IEEE Design & Test of Computers 29 (4), 80-91, 2012 | 18 | 2012 |
| Testing of resistive opens in CMOS latches and flip-flops VH Champac, A Zenteno, JL Garcia European Test Symposium (ETS'05), 34-40, 2005 | 18 | 2005 |
| Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations AF Gomez, F Lavratti, G Medeiros, M Sartori, LB Poehls, V Champac, ... Microelectronics Reliability 67, 150-158, 2016 | 16 | 2016 |
