| Effect of fabrication parameters on three-dimensional nanostructures of bulk heterojunctions imaged by high-resolution scanning ToF-SIMS BY Yu, WC Lin, WB Wang, S Iida, SZ Chen, CY Liu, CH Kuo, SH Lee, ... Acs Nano 4 (2), 833-840, 2010 | 54 | 2010 |
| The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beam T Miyayama, N Sanada, S Iida, JS Hammond, M Suzuki Applied Surface Science 255 (4), 951-953, 2008 | 35 | 2008 |
| Effect of fabrication process on the microstructure and the efficiency of organic light-emitting diode WC Lin, YC Lin, WB Wang, BY Yu, S Iida, M Tozu, MF Hsu, JH Jou, ... Organic Electronics 10 (3), 459-464, 2009 | 33 | 2009 |
| Evaluation of time-of-flight secondary ion mass spectrometry spectra of peptides by random forest with amino acid labels: results from a versailles project on advanced … S Aoyagi, Y Fujiwara, A Takano, JL Vorng, IS Gilmore, YC Wang, ... Analytical chemistry 93 (9), 4191-4197, 2021 | 19 | 2021 |
| Surface atoms in Sc–O/W (1 0 0) system as Schottky emitter at high temperature T Tsujita, S Iida, T Nagatomi, Y Takai Surface science 547 (1-2), 99-107, 2003 | 17 | 2003 |
| ToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: Effect of nanostructure on device efficiency BY Yu, CH Kuo, WB Wang, GJ Yen, S Iida, SZ Chen, WC Lin, SH Lee, ... Analyst 136 (4), 716-723, 2011 | 16 | 2011 |
| Accurate and reproducible in-depth observation of organic–inorganic hybrid materials using FIB-TOF-SIMS S Iida, DM Carr, GL Fisher, T Miyayama Journal of Vacuum Science & Technology B 36 (3), 2018 | 15 | 2018 |
| Low‐energy electron diffraction study of atomic structure of Sc–O/W (100) surface acting as Schottky emitter at high temperatures S Iida, T Tsujita, T Nagatomi, Y Takai Surface and Interface Analysis: An International Journal devoted to the …, 2003 | 15 | 2003 |
| Characterization of cathode-electrolyte interface in all-solid-state batteries using TOF-SIMS, XPS, and UPS/LEIPS S Iida, M Terashima, K Mamiya, HY Chang, S Sasaki, A Ono, T Kimoto, ... Journal of Vacuum Science & Technology B 39 (4), 2021 | 14 | 2021 |
| Surface properties of Sc–O/W (100) system as emitter at room and high temperatures T Nagatomi, S Iida, T Tsujita, Y Takai Surface science 523 (1-2), L37-L40, 2003 | 14 | 2003 |
| Self-recovery function of Sc–O/W (100) system as Schottky emitter S Iida, T Tsujita, T Nagatomi, Y Takai Surface science 543 (1-3), 1-4, 2003 | 13 | 2003 |
| Optimizing C60 incidence angle for polymer depth profiling by ToF‐SIMS S Iida, T Miyayama, N Sanada, M Suzuki, GL Fisher, SR Bryan Surface and interface analysis 43 (1‐2), 214-216, 2011 | 12 | 2011 |
| Development of unique specimen holder for LEED-AES study at high temperatures S Iida, T Tsujita, T Nagatomi, Y Takai Journal of Surface Analysis 9 (1), 81-87, 2002 | 12 | 2002 |
| X-ray photoelectron spectroscopy equipped with gas cluster ion beams for evaluation of the sputtering behavior of various nanomaterials HY Chang, WC Lin, PC Chu, YK Wang, M Sogo, S Iida, CJ Peng, ... ACS Applied Nano Materials 5 (3), 4260-4268, 2022 | 9 | 2022 |
| Time‐of‐flight secondary ion tandem mass spectrometry depth profiling of organic light‐emitting diode devices for elucidating the degradation process S Iida, T Murakami, Y Kurosawa, Y Suzuri, GL Fisher, T Miyayama Rapid Communications in Mass Spectrometry 34 (7), e8640, 2020 | 9 | 2020 |
| Surface structure of Sc-O/W (100) system used as Schottky emitter at high temperature S Iida, Y Nakanishi, T Nagatomi, Y Takai Japanese journal of applied physics 43 (9R), 6352, 2004 | 9 | 2004 |
| Single and dual metal atom catalysts for enhanced singlet oxygen generation and oxygen reduction reaction M Tamtaji, S Cai, W Wu, T Liu, Z Li, HY Chang, PR Galligan, S Iida, X Li, ... Journal of Materials Chemistry A 11 (14), 7513-7525, 2023 | 8 | 2023 |
| Structure analysis of immobilized-bovine serum albumin by means of TOF-SIMS S Aoyagi, M Dohi, N Kato, M Kudo, S Iida, M Tozu, N Sanada E-journal of surface science and nanotechnology 4, 614-618, 2006 | 8 | 2006 |
| A new approach for determining accurate chemical distributions using in‐situ GCIB cross‐section imaging S Iida, T Miyayama, GL Fisher, JS Hammond, SR Bryan, N Sanada Surface and Interface Analysis 46 (S1), 83-86, 2014 | 7 | 2014 |
| Self‐recovery function of p (1× 1)‐Sc‐O/W (100) system used as Schottky emitter S Iida, T Nagatomi, Y Takai Surface and Interface Analysis: An International Journal devoted to the …, 2005 | 7 | 2005 |
