| A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies J Lubeck, B Beckhoff, R Fliegauf, I Holfelder, P Hönicke, M Müller, ... Review of Scientific Instruments 84 (4), 2013 | 118 | 2013 |
| Fabrication of FeNi hydroxides double-shell nanotube arrays with enhanced performance for oxygen evolution reaction N Yu, W Cao, M Huttula, Y Kayser, P Hoenicke, B Beckhoff, F Lai, R Dong, ... Applied Catalysis B: Environmental 261, 118193, 2020 | 103 | 2020 |
| Depth profile characterization of ultra shallow junction implants P Hönicke, B Beckhoff, M Kolbe, D Giubertoni, J van den Berg, G Pepponi Analytical and bioanalytical chemistry 396, 2825-2832, 2010 | 70 | 2010 |
| -subshell fluorescence yields and Coster-Kronig transition probabilities with a reliable uncertainty budget for selected high- and medium- elements M Kolbe, P Hoenicke, M Müller, B Beckhoff Physical Review A 86 (4), 042512, 2012 | 61 | 2012 |
| Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry M Müller, P Hönicke, B Detlefs, C Fleischmann Materials 7 (4), 3147-3159, 2014 | 50 | 2014 |
| Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy P Hönicke, Y Kayser, B Beckhoff, M Müller, JC Dousse, J Hoszowska, ... Journal of Analytical Atomic Spectrometry 27 (9), 1432-1438, 2012 | 47 | 2012 |
| Experimental Verification of the Individual Energy Dependencies of the Partial L-Shell Photoionization Cross Sections of Pd and Mo P Hönicke, M Kolbe, M Müller, M Mantler, M Krämer, B Beckhoff Physical Review Letters 113 (16), 163001, 2014 | 41 | 2014 |
| Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements A Haase, S Bajt, P Hönicke, V Soltwisch, F Scholze Journal of applied crystallography 49 (6), 2161-2171, 2016 | 40 | 2016 |
| Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence V Soltwisch, P Hönicke, Y Kayser, J Eilbracht, J Probst, F Scholze, ... Nanoscale 10 (13), 6177-6185, 2018 | 38 | 2018 |
| Experimental determination of the x-ray atomic fundamental parameters of nickel Y Ménesguen, MC Lépy, P Hönicke, M Müller, R Unterumsberger, ... Metrologia 55 (1), 56, 2017 | 32 | 2017 |
| Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils P Hönicke, M Kolbe, M Krumrey, R Unterumsberger, B Beckhoff Spectrochimica Acta Part B: Atomic Spectroscopy 124, 94-98, 2016 | 29 | 2016 |
| Fundamental parameters of Zr and Ti for a reliable quantitative X‐ray fluorescence analysis M Kolbe, P Hönicke X‐Ray Spectrometry 44 (4), 217-220, 2015 | 29 | 2015 |
| Accurate experimental determination of Gallium K-and L3-shell XRF fundamental parameters R Unterumsberger, P Hönicke, JL Colaux, C Jeynes, M Wansleben, ... Journal of Analytical Atomic Spectrometry 33 (6), 1003-1013, 2018 | 27 | 2018 |
| Sacrificial Self-Assembled Monolayers for the Passivation of GaAs (100) Surfaces and Interfaces D Cuypers, C Fleischmann, DH van Dorp, S Brizzi, M Tallarida, M Müller, ... Chemistry of Materials 28 (16), 5689-5701, 2016 | 26 | 2016 |
| Reference-free GIXRF-XRR as a methodology for independent validation of XRR on ultrathin layer stacks and a depth-dependent characterization P Hönicke, B Detlefs, Y Kayser, U Mühle, B Pollakowski, B Beckhoff arXiv preprint arXiv:1903.01196, 2019 | 25* | 2019 |
| Reference‐free, depth‐dependent characterization of nanolayers and gradient systems with advanced grazing incidence X‐ray fluorescence analysis P Hönicke, B Detlefs, M Müller, E Darlatt, E Nolot, H Grampeix, B Beckhoff physica status solidi (a) 212 (3), 523-528, 2015 | 25 | 2015 |
| Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu (In, Ga) Se2 absorber films C Streeck, S Brunken, M Gerlach, C Herzog, P Hönicke, CA Kaufmann, ... Applied Physics Letters 103, 113904, 2013 | 25 | 2013 |
| Quantitative depth profiling of boron and arsenic ultra low energy implants by pulsed rf-GD-ToFMS L Lobo, B Fernández, R Pereiro, N Bordel, E Demenev, D Giubertoni, ... Journal of Analytical Atomic Spectrometry 26 (3), 542-549, 2011 | 25 | 2011 |
| Towards a traceable enhancement factor in surface-enhanced Raman spectroscopy E Cara, L Mandrile, A Sacco, AM Giovannozzi, AM Rossi, F Celegato, ... Journal of Materials Chemistry C 8 (46), 16513-16519, 2020 | 24 | 2020 |
| Theoretical and experimental determination of - and -shell x-ray relaxation parameters in Ni M Guerra, JM Sampaio, F Parente, P Indelicato, P Hönicke, M Müller, ... Physical Review A 97 (4), 042501, 2018 | 24 | 2018 |
Yves KayserMPI for Chemical Energy ConversionVerified email at cec.mpg.de
