|Automatic parallelization of embedded software using hierarchical task graphs and integer linear programming|
D Cordes, P Marwedel, A Mallik
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware …, 2010
|PICSEL: Measuring user-perceived performance to control dynamic frequency scaling|
A Mallik, J Cosgrove, RP Dick, G Memik, P Dinda
ACM Sigplan Notices 43 (3), 70-79, 2008
|Learning and leveraging the relationship between architecture-level measurements and individual user satisfaction|
A Shye, B Ozisikyilmaz, A Mallik, G Memik, PA Dinda, RP Dick, ...
ACM SIGARCH Computer Architecture News 36 (3), 427-438, 2008
|User-driven frequency scaling|
A Mallik, B Lin, G Memik, P Dinda, RP Dick
IEEE Computer Architecture Letters 5 (2), 16-16, 2006
|User-and process-driven dynamic voltage and frequency scaling|
B Lin, A Mallik, P Dinda, G Memik, R Dick
2009 IEEE International Symposium on Performance Analysis of Systems and …, 2009
|Low-power optimization by smart bit-width allocation in a SystemC-based ASIC design environment|
A Mallik, D Sinha, P Banerjee, H Zhou
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007
|The user in experimental computer systems research|
PA Dinda, G Memik, RP Dick, B Lin, A Mallik, A Gupta, S Rossoff
Proceedings of the 2007 workshop on Experimental computer science, 10, 2007
|System and method for controlling power consumption in a computer system based on user satisfaction|
L Yang, RP Dick, X Chen, G Memik, PA Dinda, A Shye, B Ozisikyilmaz, ...
US Patent 8,706,652, 2014
|Engineering over-clocking: Reliability-performance trade-offs for high-performance register files|
G Memik, MH Chowdhury, A Mallik, YI Ismail
2005 International Conference on Dependable Systems and Networks (DSN'05 …, 2005
|Maintaining Moore’s law: enabling cost-friendly dimensional scaling|
A Mallik, J Ryckaert, A Mercha, D Verkest, K Ronse, A Thean
Extreme Ultraviolet (EUV) Lithography VI 9422, 94221N, 2015
|Systems and methods for process and user driven dynamic voltage and frequency scaling|
A Mallik, B Lin, G Memik, P Dinda, R Dick
US Patent 7,913,071, 2011
|DTCO at N7 and beyond: patterning and electrical compromises and opportunities|
J Ryckaert, P Raghavan, P Schuddinck, HB Trong, A Mallik, SS Sakhare, ...
Design-Process-Technology Co-optimization for Manufacturability IX 9427, 94270C, 2015
|Automatic extraction of pipeline parallelism for embedded software using linear programming|
D Cordes, A Heinig, P Marwedel, A Mallik
2011 IEEE 17th International Conference on Parallel and Distributed Systems …, 2011
|A case for clumsy packet processors|
A Mallik, G Memik
37th International Symposium on Microarchitecture (MICRO-37'04), 147-156, 2004
|The need for EUV lithography at advanced technology for sustainable wafer cost|
A Mallik, W Vansumere, J Ryckaert, A Mercha, N Horiguchi, S Demuynck, ...
Extreme Ultraviolet (Euv) Lithography Iv 8679, 86792Y, 2013
|Design technology co-optimization for N10|
J Ryckaert, P Raghavan, R Baert, MG Bardon, M Dusa, A Mallik, ...
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 1-8, 2014
|Automated task distribution in multicore network processors using statistical analysis|
A Mallik, Y Zhang, G Memik
Proceedings of the 3rd ACM/IEEE Symposium on Architecture for networking and …, 2007
|The economic impact of EUV lithography on critical process modules|
A Mallik, N Horiguchi, J Bömmels, A Thean, K Barla, G Vandenberghe, ...
Extreme Ultraviolet (EUV) Lithography V 9048, 90481R, 2014
|Opportunities and challenges in device scaling by the introduction of EUV lithography|
K Ronse, P De Bisschop, G Vandenberghe, E Hendrickx, R Gronheid, ...
2012 International Electron Devices Meeting, 18.5. 1-18.5. 4, 2012
|Single exposure EUV patterning of BEOL metal layers on the IMEC iN7 platform|
VMB Carballo, J Bekaert, M Mao, BK Kotowska, S Larivière, I Ciofi, ...
Extreme Ultraviolet (EUV) Lithography VIII 10143, 1014318, 2017