Arindam Mallik
Arindam Mallik
Verified email at imec.be
TitleCited byYear
Automatic parallelization of embedded software using hierarchical task graphs and integer linear programming
D Cordes, P Marwedel, A Mallik
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware …, 2010
642010
PICSEL: Measuring user-perceived performance to control dynamic frequency scaling
A Mallik, J Cosgrove, RP Dick, G Memik, P Dinda
ACM Sigplan Notices 43 (3), 70-79, 2008
532008
Learning and leveraging the relationship between architecture-level measurements and individual user satisfaction
A Shye, B Ozisikyilmaz, A Mallik, G Memik, PA Dinda, RP Dick, ...
ACM SIGARCH Computer Architecture News 36 (3), 427-438, 2008
512008
User-driven frequency scaling
A Mallik, B Lin, G Memik, P Dinda, RP Dick
IEEE Computer Architecture Letters 5 (2), 16-16, 2006
502006
User-and process-driven dynamic voltage and frequency scaling
B Lin, A Mallik, P Dinda, G Memik, R Dick
2009 IEEE International Symposium on Performance Analysis of Systems and …, 2009
482009
Low-power optimization by smart bit-width allocation in a SystemC-based ASIC design environment
A Mallik, D Sinha, P Banerjee, H Zhou
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007
462007
The user in experimental computer systems research
PA Dinda, G Memik, RP Dick, B Lin, A Mallik, A Gupta, S Rossoff
Proceedings of the 2007 workshop on Experimental computer science, 10, 2007
452007
System and method for controlling power consumption in a computer system based on user satisfaction
L Yang, RP Dick, X Chen, G Memik, PA Dinda, A Shye, B Ozisikyilmaz, ...
US Patent 8,706,652, 2014
432014
Engineering over-clocking: Reliability-performance trade-offs for high-performance register files
G Memik, MH Chowdhury, A Mallik, YI Ismail
2005 International Conference on Dependable Systems and Networks (DSN'05 …, 2005
402005
Maintaining Moore’s law: enabling cost-friendly dimensional scaling
A Mallik, J Ryckaert, A Mercha, D Verkest, K Ronse, A Thean
Extreme Ultraviolet (EUV) Lithography VI 9422, 94221N, 2015
352015
Systems and methods for process and user driven dynamic voltage and frequency scaling
A Mallik, B Lin, G Memik, P Dinda, R Dick
US Patent 7,913,071, 2011
322011
DTCO at N7 and beyond: patterning and electrical compromises and opportunities
J Ryckaert, P Raghavan, P Schuddinck, HB Trong, A Mallik, SS Sakhare, ...
Design-Process-Technology Co-optimization for Manufacturability IX 9427, 94270C, 2015
292015
Automatic extraction of pipeline parallelism for embedded software using linear programming
D Cordes, A Heinig, P Marwedel, A Mallik
2011 IEEE 17th International Conference on Parallel and Distributed Systems …, 2011
292011
A case for clumsy packet processors
A Mallik, G Memik
37th International Symposium on Microarchitecture (MICRO-37'04), 147-156, 2004
282004
The need for EUV lithography at advanced technology for sustainable wafer cost
A Mallik, W Vansumere, J Ryckaert, A Mercha, N Horiguchi, S Demuynck, ...
Extreme Ultraviolet (Euv) Lithography Iv 8679, 86792Y, 2013
272013
Design technology co-optimization for N10
J Ryckaert, P Raghavan, R Baert, MG Bardon, M Dusa, A Mallik, ...
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 1-8, 2014
262014
Automated task distribution in multicore network processors using statistical analysis
A Mallik, Y Zhang, G Memik
Proceedings of the 3rd ACM/IEEE Symposium on Architecture for networking and …, 2007
262007
The economic impact of EUV lithography on critical process modules
A Mallik, N Horiguchi, J Bömmels, A Thean, K Barla, G Vandenberghe, ...
Extreme Ultraviolet (EUV) Lithography V 9048, 90481R, 2014
252014
Opportunities and challenges in device scaling by the introduction of EUV lithography
K Ronse, P De Bisschop, G Vandenberghe, E Hendrickx, R Gronheid, ...
2012 International Electron Devices Meeting, 18.5. 1-18.5. 4, 2012
232012
Single exposure EUV patterning of BEOL metal layers on the IMEC iN7 platform
VMB Carballo, J Bekaert, M Mao, BK Kotowska, S Larivière, I Ciofi, ...
Extreme Ultraviolet (EUV) Lithography VIII 10143, 1014318, 2017
182017
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