High-speed spatial atomic-layer deposition of aluminum oxide layers for solar cell passivation P Poodt, A Lankhorst, F Roozeboom, K Spee, D Maas, A Vermeer Adv. Mater 22 (32), 3564-3567, 2010 | 401 | 2010 |
Sub-10-nm nanolithography with a scanning helium beam V Sidorkin, E van Veldhoven, E van der Drift, P Alkemade, H Salemink, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 175 | 2009 |
Vibrational ladder climbing in NO by (sub) picosecond frequency-chirped infrared laser pulses DJ Maas, DI Duncan, RB Vrijen, WJ Van Der Zande, LD Noordam Chemical physics letters 290 (1-3), 75-80, 1998 | 174 | 1998 |
Interference in climbing a quantum ladder system with frequency-chirped laser pulses P Balling, DJ Maas, LD Noordam Physical Review A 50 (5), 4276, 1994 | 147 | 1994 |
Population transfer via adiabatic passage in the rubidium quantum ladder system DJ Maas, CW Rella, P Antoine, ES Toma, LD Noordam Physical Review A 59 (2), 1374, 1999 | 93 | 1999 |
Vibrational ladder climbing in NO by ultrashort infrared laser pulses DJ Maas, DI Duncan, AFG Van der Meer, WJ Van der Zande, ... Chemical Physics Letters 270 (1-2), 45-49, 1997 | 76 | 1997 |
Charging effects in quantum dots at high magnetic fields NC Van der Vaart, AT Johnson, LP Kouwenhoven, DJ Maas, W de Jong, ... Physica B: Condensed Matter 189 (1-4), 99-110, 1993 | 76 | 1993 |
Precise control of domain wall injection and pinning using helium and gallium focused ion beams JH Franken, M Hoeijmakers, R Lavrijsen, JT Kohlhepp, HJM Swagten, ... Journal of Applied Physics 109 (7), 2011 | 74 | 2011 |
Nanofabrication with a helium ion microscope D Maas, E van Veldhoven, P Chen, V Sidorkin, H Salemink, ... Metrology, Inspection, and Process Control for Microlithography XXIV 7638 …, 2010 | 68 | 2010 |
Nanopillar growth by focused helium ion-beam-induced deposition P Chen, E van Veldhoven, CA Sanford, HWM Salemink, DJ Maas, ... Nanotechnology 21 (45), 455302, 2010 | 64 | 2010 |
Beam induced deposition of platinum using a helium ion microscope CA Sanford, L Stern, L Barriss, L Farkas, M DiManna, R Mello, DJ Maas, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 56 | 2009 |
Rotational interference in vibrational ladder climbing in NO by chirped infrared laser pulses DJ Maas, MJJ Vrakking, LD Noordam Physical Review A 60 (2), 1351, 1999 | 55 | 1999 |
Imaging and Nanofabrication With the Helium Ion Microscope of the V an L eeuwenhoek Laboratory in D elft PFA Alkemade, EM Koster, E van Veldhoven, DJ Maas Scanning 34 (2), 90-100, 2012 | 51 | 2012 |
High-resolution direct-write patterning using focused ion beams LE Ocola, C Rue, D Maas Mrs Bulletin 39 (4), 336-341, 2014 | 38 | 2014 |
Model for nanopillar growth by focused helium ion-beam-induced deposition PFA Alkemade, P Chen, E van Veldhoven, D Maas Journal of Vacuum Science & Technology B 28 (6), C6F22-C6F25, 2010 | 36 | 2010 |
Structural characterization of He ion microscope platinum deposition and sub-surface silicon damage Y Drezner, Y Greenzweig, D Fishman, E van Veldhoven, DJ Maas, ... Journal of Vacuum Science & Technology B 30 (4), 2012 | 31 | 2012 |
Generation of frequency-chirped pulses in the far-infrared by means of a sub-picosecond free-electron laser and an external pulse shaper GMH Knippels, AFG Van der Meer, R Mols, PW Van Amersfoort, RB Vrijen, ... Optics communications 118 (5-6), 546-550, 1995 | 29 | 1995 |
Helium Ion Lithography: Principles and Performance E van der Drift, DJ Maas Nanofabrication: Techniques and Principles, 93-116, 2011 | 25 | 2011 |
Pulsed helium ion beam induced deposition: A means to high growth rates PFA Alkemade, H Miro, E Van Veldhoven, DJ Maas, DA Smith, PD Rack Journal of Vacuum Science & Technology B 29 (6), 2011 | 23 | 2011 |
On the influence of the sputtering in determining the resolution of a scanning ion microscope V Castaldo, CW Hagen, P Kruit, E Van Veldhoven, D Maas Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 20 | 2009 |