Dark-field X-ray microscopy for multiscale structural characterization H Simons, A King, W Ludwig, C Detlefs, W Pantleon, S Schmidt, F Stöhr, ...
Nature communications 6 (1), 6098, 2015
204 2015 Electric-field-induced strain mechanisms in lead-free H Simons, J Daniels, W Jo, R Dittmer, A Studer, M Avdeev, J Rödel, ...
Applied Physics Letters 98 (8), 082901, 2011
157 2011 A High‐Temperature‐Capacitor Dielectric Based on K0.5 Na0.5 NbO3 ‐Modified Bi1/2 Na1/2 TiO3 –Bi1/2 K1/2 TiO3 R Dittmer, EM Anton, W Jo, H Simons, JE Daniels, M Hoffman, J Pokorny, ...
Journal of the American Ceramic Society 95 (11), 3519-3524, 2012
126 2012 Long-range symmetry breaking in embedded ferroelectrics H Simons, AB Haugen, AC Jakobsen, S Schmidt, F Stöhr, M Majkut, ...
Nature materials 17 (9), 814-819, 2018
82 2018 Origin of large recoverable strain in 0.94(Bi0.5 Na0.5 )TiO3 -0.06BaTiO3 near the ferroelectric-relaxor transition H Simons, JE Daniels, J Glaum, AJ Studer, JL Jones, M Hoffman
Applied Physics Letters 102 (6), 062902, 2013
74 2013 Dual strain mechanisms in a lead-free morphotropic phase boundary ferroelectric J Walker, H Simons, DO Alikin, AP Turygin, VY Shur, AL Kholkin, H Ursic, ...
Scientific reports 6 (1), 1-8, 2016
66 2016 Multiscale 3D characterization with dark-field x-ray microscopy H Simons, AC Jakobsen, SR Ahl, C Detlefs, HF Poulsen
Mrs Bulletin 41 (6), 454-459, 2016
52 2016 X-ray diffraction microscopy based on refractive optics HF Poulsen, AC Jakobsen, H Simons, SR Ahl, PK Cook, C Detlefs
Journal of Applied Crystallography 50 (5), 1441-1456, 2017
49 2017 Tailoring the Piezoelectric and Relaxor Properties of (Bi1/2 Na1/2 )TiO3 –BaTiO3 via Zirconium Doping J Glaum, H Simons, M Acosta, M Hoffman
Journal of the American Ceramic Society 96 (9), 2881-2886, 2013
46 2013 Temperature dependent piezoelectric response and strain–electric-field hysteresis of rare-earth modified bismuth ferrite ceramics J Walker, H Ursic, A Bencan, B Malic, H Simons, I Reaney, G Viola, ...
Journal of Materials Chemistry C 4 (33), 7859-7868, 2016
45 2016 Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics S Gorfman, H Simons, T Iamsasri, S Prasertpalichat, DP Cann, H Choe, ...
Scientific reports 6 (1), 20829, 2016
42 2016 Domain fragmentation during cyclic fatigue in 94%(Bi1/2 Na1/2 )TiO3 -6%BaTiO3 H Simons, J Glaum, JE Daniels, AJ Studer, A Liess, J Rödel, M Hoffman
Journal of applied physics 112 (4), 044101, 2012
42 2012 The ESRF dark-field x-ray microscope at ID06 M Kutsal, P Bernard, G Berruyer, PK Cook, R Hino, AC Jakobsen, ...
IOP conference series: materials science and engineering 580 (1), 012007, 2019
38 2019 Mapping of individual dislocations with dark-field X-ray microscopy AC Jakobsen, H Simons, W Ludwig, C Yildirim, H Leemreize, L Porz, ...
Journal of Applied Crystallography 52 (1), 122-132, 2019
38 2019 Ultra-low-angle boundary networks within recrystallizing grains SR Ahl, H Simons, YB Zhang, C Detlefs, F Stöhr, AC Jakobsen, ...
Scripta Materialia 139, 87-91, 2017
35 2017 Conceptual framework for dislocation-modified conductivity in oxide ceramics deconvoluting mesoscopic structure, core, and space charge exemplified for SrTiO3 L Porz, T Frömling, A Nakamura, N Li, R Maruyama, K Matsunaga, ...
ACS nano 15 (6), 9355-9367, 2020
33 2020 Dislocation-toughened ceramics L Porz, AJ Klomp, X Fang, N Li, C Yildirim, C Detlefs, E Bruder, M Höfling, ...
Materials Horizons 8 (5), 1528-1537, 2021
32 2021 Multilayer Laue lenses at high X-ray energies: performance and applications KT Murray, AF Pedersen, I Mohacsi, C Detlefs, AJ Morgan, M Prasciolu, ...
Optics express 27 (5), 7120-7138, 2019
32 2019 Measurement and analysis of field-induced crystallographic texture using curved position-sensitive diffraction detectors H Simons, JE Daniels, AJ Studer, JL Jones, M Hoffman
Journal of Electroceramics 32, 283-291, 2014
28 2014 Subgrain dynamics during recovery of partly recrystallized aluminum SR Ahl, H Simons, C Detlefs, DJ Jensen, HF Poulsen
Acta Materialia 185, 142-148, 2020
23 2020 
Anders Clemen JakobsenPost Doc at DTU PhysicsBestätigte E-Mail-Adresse bei fysik.dtu.dk
