| Highly Emissive Divalent-Ion-Doped Colloidal CsPb1–xMxBr3 Perovskite Nanocrystals through Cation Exchange W Van der Stam, JJ Geuchies, T Altantzis, KHW Van Den Bos, ... Journal of the American Chemical Society 139 (11), 4087-4097, 2017 | 498 | 2017 |
| StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images A De Backer, KHW van den Bos, W Van den Broek, J Sijbers, S Van Aert Ultramicroscopy 171, 104-116, 2016 | 138 | 2016 |
| Strong Oxygen Participation in the Redox Governing the Structural and Electrochemical Properties of Na-Rich Layered Oxide Na2IrO3 AJ Perez, D Batuk, M Saubanère, G Rousse, D Foix, E McCalla, EJ Berg, ... Chemistry of Materials 28 (22), 8278–8288, 2016 | 113 | 2016 |
| Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy KHW van den Bos, A De Backer, GT Martinez, N Winckelmans, S Bals, ... Physical Review Letters 116 (24), 246101, 2016 | 53 | 2016 |
| Berry phase engineering at oxide interfaces DJ Groenendijk, C Autieri, TC van Thiel, W Brzezicki, JR Hortensius, ... Physical Review Research 2 (2), 023404, 2020 | 50 | 2020 |
| Ligand-induced shape transformation of PbSe nanocrystals JL Peters, KHW Van Den Bos, S Van Aert, B Goris, S Bals, ... Chemistry of Materials 29 (9), 4122-4128, 2017 | 44 | 2017 |
| Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques N Gauquelin, KHW Van den Bos, A Béché, FF Krause, I Lobato, S Lazar, ... Ultramicroscopy 181, 178-190, 2017 | 30 | 2017 |
| Disruption of the electrical conductivity of highly conductive poly (3, 4-ethylenedioxythiophene): poly (styrene sulfonate) by hypochlorite AJ Oostra, KHW van den Bos, PWM Blom, JJ Michels The Journal of Physical Chemistry B 117 (37), 10929-10935, 2013 | 27 | 2013 |
| Controlled growth of hexagonal gold nanostructures during thermally induced self-assembling on Ge (001) surface BR Jany, N Gauquelin, T Willhammar, M Nikiel, KHW Van Den Bos, ... Scientific reports 7 (1), 1-9, 2017 | 26 | 2017 |
| Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM H Akamine, KHW van den Bos, N Gauquelin, S Farjami, S Van Aert, ... Journal of Alloys and Compounds 644, 570-574, 2015 | 15 | 2015 |
| Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy GT Martinez, KHW Van Den Bos, M Alania, PD Nellist, S Van Aert Ultramicroscopy 187, 84-92, 2018 | 13 | 2018 |
| Recent breakthroughs in scanning transmission electron microscopy of small species KHW van den Bos, T Altantzis, A De Backer, S Van Aert, S Bals Advances in Physics: X 3 (1), 1480420, 2018 | 12 | 2018 |
| The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials KHW Van den Bos, L Janssens, A De Backer, PD Nellist, S Van Aert Ultramicroscopy 203, 155-162, 2019 | 10 | 2019 |
| Self‐Assembly of Atomically Thin Chiral Copper Heterostructures Templated by Black Phosphorus HC Nerl, A Pokle, L Jones, K Müller‐Caspary, KHW Van den Bos, ... Advanced functional materials 29 (37), 1903120, 2019 | 7 | 2019 |
| Locating light and heavy atomic column positions with picometer precision using ISTEM KHW van den Bos, FF Krause, A Béché, J Verbeeck, A Rosenauer, ... Ultramicroscopy, 2016 | 7 | 2016 |
| One step toward a new generation of C-MOS compatible oxide P–N junctions: structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work D Pullini, MF Sgroi, A Mahmoud, N Gauquelin, L Maschio, AM Ferrari, ... ACS applied materials & interfaces 9 (24), 20974-20980, 2017 | 4 | 2017 |
| StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images A De Backer, KHW Van den Bos, W Van den Broek, J Sijbers, S Van Aert Journal of Physics: Conference Series 902 (1), 012013, 2017 | 3 | 2017 |
| Quantitative atomic resolution transmission electron microscopy for heterogeneous nanomaterials KHW van den Bos University of Antwerp, 2017 | 1 | 2017 |
| Quantitative Atomic Resolution Transmission Electron Microscopy for Heterogeneous Nanomaterials: Proefschrift K Van den Bos | | 2017 |
| The atomic lensing model: extending HAADF STEM atom counting from homogeneous to heterogeneous nanostructures KHW van den Bos, A De Backer, GT Martinez, N Winckelmans, S Bals, ... European Microscopy Congress 2016: Proceedings, 499-500, 2016 | | 2016 |
