Localized electromagnetic analysis of cryptographic implementations J Heyszl, S Mangard, B Heinz, F Stumpf, G Sigl Topics in Cryptology–CT-RSA 2012: The Cryptographers’ Track at the RSA …, 2012 | 125 | 2012 |
Clustering algorithms for non-profiled single-execution attacks on exponentiations J Heyszl, A Ibing, S Mangard, F De Santis, G Sigl Smart Card Research and Advanced Applications: 12th International Conference …, 2014 | 113 | 2014 |
Attack on a DFA protected AES by simultaneous laser fault injections B Selmke, J Heyszl, G Sigl 2016 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 36-46, 2016 | 92 | 2016 |
Localized electromagnetic analysis of RO PUFs D Merli, J Heyszl, B Heinz, D Schuster, F Stumpf, G Sigl 2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013 | 90 | 2013 |
Hardware Trojans: current challenges and approaches N Jacob, D Merli, J Heyszl, G Sigl IET Computers & Digital Techniques 8 (6), 264-273, 2014 | 80 | 2014 |
Precise laser fault injections into 90 nm and 45 nm sram-cells B Selmke, S Brummer, J Heyszl, G Sigl Smart Card Research and Advanced Applications: 14th International Conference …, 2016 | 77 | 2016 |
{AutoLock}: Why cache attacks on {ARM} are harder than you think M Green, L Rodrigues-Lima, A Zankl, G Irazoqui, J Heyszl, T Eisenbarth 26th USENIX Security Symposium (USENIX Security 17), 1075-1091, 2017 | 76 | 2017 |
Strengths and limitations of high-resolution electromagnetic field measurements for side-channel analysis J Heyszl, D Merli, B Heinz, F De Santis, G Sigl Smart Card Research and Advanced Applications: 11th International Conference …, 2013 | 57 | 2013 |
Towards fresh re-keying with leakage-resilient PRFs: cipher design principles and analysis S Belaïd, F De Santis, J Heyszl, S Mangard, M Medwed, JM Schmidt, ... Journal of Cryptographic Engineering 4, 157-171, 2014 | 50 | 2014 |
How to break secure boot on fpga socs through malicious hardware N Jacob, J Heyszl, A Zankl, C Rolfes, G Sigl Cryptographic Hardware and Embedded Systems–CHES 2017: 19th International …, 2017 | 49 | 2017 |
A milestone towards RFID products offering asymmetric authentication based on elliptic curve cryptography H Bock, M Braun, M Dichtl, E Hess, J Heyszl, W Kargl, H Koroschetz, ... Invited talk at RFIDsec, 2008 | 49 | 2008 |
Improving non-profiled attacks on exponentiations based on clustering and extracting leakage from multi-channel high-resolution EM measurements R Specht, J Heyszl, M Kleinsteuber, G Sigl International Workshop on Constructive Side-Channel Analysis and Secure …, 2015 | 48 | 2015 |
Practical runtime attestation for tiny IoT devices S Hristozov, J Heyszl, S Wagner, G Sigl NDSS Workshop on Decentralized IoT Security and Standards (DISS) 18, 2018 | 38 | 2018 |
Dissecting Leakage Resilient PRFs with Multivariate Localized EM Attacks: A Practical Security Evaluation on FPGA F Unterstein, J Heyszl, F De Santis, R Specht International Workshop on Constructive Side-Channel Analysis and Secure …, 2017 | 29 | 2017 |
Low-latency X25519 hardware implementation: Breaking the 100 microseconds barrier P Koppermann, F De Santis, J Heyszl, G Sigl Microprocessors and Microsystems 52, 491-497, 2017 | 27 | 2017 |
X25519 hardware implementation for low-latency applications P Koppermann, F De Santis, J Heyszl, G Sigl 2016 Euromicro Conference on Digital System Design (DSD), 99-106, 2016 | 27 | 2016 |
Dividing the threshold: Multi-probe localized EM analysis on threshold implementations R Specht, V Immler, F Unterstein, J Heyszl, G Sig 2018 IEEE International Symposium on Hardware Oriented Security and Trust …, 2018 | 19 | 2018 |
18 seconds to key exchange: Limitations of supersingular isogeny Diffie-Hellman on embedded devices P Koppermann, E Pop, J Heyszl, G Sigl Cryptology ePrint Archive, 2018 | 19 | 2018 |
Securing FPGA SoC configurations independent of their manufacturers N Jacob, J Wittmann, J Heyszl, R Hesselbarth, F Wilde, M Pehl, G Sigl, ... 2017 30th IEEE International System-on-Chip Conference (SOCC), 114-119, 2017 | 19 | 2017 |
Automated detection of instruction cache leaks in modular exponentiation software A Zankl, J Heyszl, G Sigl Smart Card Research and Advanced Applications: 15th International Conference …, 2017 | 18 | 2017 |