Peng Li
Peng Li
Associate Professor, Ph. D., Beijing University of Technology
Verified email at
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Recent development of PeakForce Tapping mode atomic force microscopy and its applications on nanoscience
K Xu, W Sun, Y Shao, F Wei, X Zhang, W Wang, P Li
Nanotechnology Reviews 7 (6), 605-621, 2018
Phase modulation mode of scanning ion conductance microscopy
P Li, L Liu, Y Wang, Y Yang, C Zhang, G Li
Applied Physics Letters 105 (5), 2014
In- Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy with Capacitance Compensation
P Li, L Liu, Y Yang, Y Wang, G Li
IEEE Transactions on Industrial Electronics, 2015
Amplitude Modulation Mode of Scanning Ion Conductance Microscopy
P Li, L Liu, Y Yang, L Zhou, D Wang, Y Wang, G Li
Journal of laboratory automation,, 2015
Development of mechanostimulated patch-clamp system for cellular physiological study
C Zhang, P Li, L Liu, Y Wang, Z Gao, G Li
Mechatronics, IEEE/ASME Transactions on 19 (4), 1138-1147, 2014
Nanopatterning on calixarene thin films via low-energy field-emission scanning probe lithography
X He, X., Li, P., Zhang, X., Zhou, X., Liu, W., & Qiu
Nanotechnology, 2018
Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire
G Zhang, P Li, D Wei, K Hu, X Qiu
Nanotechnology 31 (47), 475703, 2020
Comprehensive indicators for evaluating and seeking elasto-magnetic parameters for high-performance cable force monitoring
S Yan, Y Wang, P Li, Z Gao, B Wu, X Liu
Sensors 22 (20), 7776, 2022
Micromagnetic and quantitative prediction of surface hardness in carbon steels based on a joint classification-regression method
X Wang, C He, P Li, X Liu, Z Xing, Z Yan
Journal of Nondestructive Evaluation 41 (3), 62, 2022
Development of a multi-functional multi-probe atomic force microscope system with optical beam deflection method
P Li, Y Shao, K Xu, X Qiu
Review of Scientific Instruments 92 (12), 2021
Advances in scanning ion conductance microscopy: Principles and applications
P Li, G Li
IEEE Nanotechnology Magazine 15 (1), 17-25, 2020
Quantitative characterization of tensile stress in electroplated nickel coatings with a magnetic incremental permeability sensor
N Wang, P Li, T Li, Y Wang, C He, X Liu
Sensors and Actuators A: Physical 368, 115082, 2024
Formation of Anti-Etching Nanopatterns in Field-Emission Scanning Probe Lithography on Calixarene Films
Y Wu, L Xu, Y Fan, Z Zhang, W Liu, P Li, X Qiu
The Journal of Physical Chemistry C 127 (26), 12593-12598, 2023
High-speed Atomic Force Microscope Technology: A Review
K Xu, Q An, P Li
Current Nanoscience 18 (5), 545-553, 2022
LLM-Enabled Incremental Learning Framework for Hand Exoskeleton Control
W Chen, G Li, M Li, W Wang, P Li, X Xue, X Zhao, L Liu
IEEE Transactions on Automation Science and Engineering, 2024
High-speed multiparametric imaging through off-resonance tapping AFM with active probe
P Li, Y Shao, K Xu, X Liu
Ultramicroscopy 248, 113712, 2023
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