Tim Dahmen
Tim Dahmen
Bestätigte E-Mail-Adresse bei - Startseite
Zitiert von
Zitiert von
Realtime ray tracing for current and future games
J Schmittler, D Pohl, T Dahmen, C Vogelgesang, P Slusallek
ACM SIGGRAPH 2005 Courses, 23-es, 2005
Feature adaptive sampling for scanning electron microscopy
T Dahmen, M Engstler, C Pauly, P Trampert, N De Jonge, F Mücklich, ...
Scientific reports 6 (1), 25350, 2016
How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?
P Trampert, F Bourghorbel, P Potocek, M Peemen, C Schlinkmann, ...
Ultramicroscopy 191, 11-17, 2018
Combined scanning transmission electron microscopy tilt-and focal series
T Dahmen, JP Baudoin, AR Lupini, C Kübel, P Slusallek, N De Jonge
Microscopy and Microanalysis 20 (2), 548-560, 2014
Digital reality: a model-based approach to supervised learning from synthetic data
T Dahmen, P Trampert, F Boughorbel, J Sprenger, M Klusch, K Fischer, ...
AI Perspectives 1 (1), 1-12, 2019
Applying ray tracing for virtual reality and industrial design
I Wald, A Dietrich, C Benthin, A Efremov, T Dahmen, J Gunther, V Havran, ...
2006 IEEE symposium on interactive ray tracing, 177-185, 2006
An automated workflow for the biomechanical simulation of a tibia with implant using computed tomography and the finite element method
T Dahmen, M Roland, T Tjardes, B Bouillon, P Slusallek, S Diebels
Computers & Mathematics with Applications 70 (5), 903-916, 2015
Deep neural networks for analysis of microscopy images—synthetic data generation and adaptive sampling
P Trampert, D Rubinstein, F Boughorbel, C Schlinkmann, M Luschkova, ...
Crystals 11 (3), 258, 2021
Neuroscope: An explainable ai toolbox for semantic segmentation and image classification of convolutional neural nets
C Schorr, P Goodarzi, F Chen, T Dahmen
Applied Sciences 11 (5), 2199, 2021
Interactive headlight simulation: a case study of interactive distributed ray tracing
C Benthin, T Dahmen, I Wald, P Slusallek
ACM International Conference Proceeding Series 29, 83-88, 2002
The Ettention software package
T Dahmen, L Marsalek, N Marniok, B Turoňová, S Bogachev, P Trampert, ...
Ultramicroscopy 161, 110-118, 2016
Interactive Headlight Simulation–A Case Study of Distributed Interactive Ray Tracing
C Benthin, I Wald, T Dahmen, P Slusallek
Proceedings of the 4th Eurographics Workshop on Parallel Graphics and …, 2002
Exemplar-based inpainting as a solution to the missing wedge problem in electron tomography
P Trampert, W Wang, D Chen, RBG Ravelli, T Dahmen, PJ Peters, ...
Ultramicroscopy 191, 1-10, 2018
Linear chains of HER2 receptors found in the plasma membrane using liquid-phase electron microscopy
K Parker, P Trampert, V Tinnemann, D Peckys, T Dahmen, N de Jonge
Biophysical Journal 115 (3), 503-513, 2018
Synthetic training data generation for deep learning based quality inspection
P Gutierrez, M Luschkova, A Cordier, M Shukor, M Schappert, T Dahmen
Fifteenth International Conference on Quality Control by Artificial Vision …, 2021
Exemplar-based inpainting based on dictionary learning for sparse scanning electron microscopy
P Trampert, S Schlabach, T Dahmen, P Slusallek
Microscopy and Microanalysis 24 (S1), 700-701, 2018
Modelling and characterization of ductile fracture surface in Al-Si alloys by means of Voronoi tessellation
A Kruglova, M Roland, S Diebels, T Dahmen, P Slusallek, F Mücklich
Materials Characterization 131, 1-11, 2017
Less than full circumferential fusion of a tibial nonunion is sufficient to achieve mechanically valid fusion-Proof of concept using a finite element modeling approach
T Tjardes, M Roland, R Otchwemah, T Dahmen, S Diebels, B Bouillon
BMC Musculoskeletal Disorders 15, 1-7, 2014
Predicting the adhesion strength of micropatterned surfaces using supervised machine learning
M Samri, J Thiemecke, E Prinz, T Dahmen, R Hensel, E Arzt
Materials Today 53, 41-50, 2022
Sparse scanning electron microscopy data acquisition and deep neural networks for automated segmentation in connectomics
P Potocek, P Trampert, M Peemen, R Schoenmakers, T Dahmen
Microscopy and Microanalysis 26 (3), 403-412, 2020
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