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Lucas Matana Luza
Lucas Matana Luza
SENAI Institute of Innovation in Embedded Systems
Verified email at sc.senai.br - Homepage
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Cited by
Year
A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems
DA Santos, LM Luza, CA Zeferino, L Dilillo, DR Melo
2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 1-5, 2020
382020
Emulating the effects of radiation-induced soft-errors for the reliability assessment of neural networks
LM Luza, A Ruospo, D Söderström, C Cazzaniga, M Kastriotou, ...
IEEE Transactions on Emerging Topics in Computing 10 (4), 1867-1882, 2021
232021
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
D Söderström, LM Luza, H Kettunen, A Javanainen, W Farabolini, ...
IEEE Transactions on Nuclear Science 68 (5), 716-723, 2021
192021
A Survey on Deep Learning Resilience Assessment Methodologies
A Ruospo, E Sanchez, LM Luza, L Dilillo, M Traiola, A Bosio
Computer 56 (2), 57-66, 2023
182023
Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
LM Luza, D Söderström, G Tsiligiannis, H Puchner, C Cazzaniga, ...
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
172020
Reliability analysis of a fault-tolerant RISC-V system-on-chip
DA Santos, LM Luza, L Dilillo, CA Zeferino, DR Melo
Microelectronics Reliability 125, 114346, 2021
152021
Characterization of a RISC-V System-on-Chip under Neutron Radiation
DA Santos, LM Luza, M Kastriotou, C Cazzaniga, CA Zeferino, DR Melo, ...
2021 16th International Conference on Design & Technology of Integrated …, 2021
112021
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
LM Luza, D Söderström, H Puchner, RG Alía, M Letiche, A Bosio, L Dilillo
2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 1-6, 2020
92020
Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices
LM Luza, F Wrobel, L Entrena, L Dilillo
2022 IEEE European Test Symposium (ETS), 1-10, 2022
82022
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
A Ruospo, LM Luza, A Bosio, M Traiola, L Dilillo, E Sanchez
2021 IEEE 22nd Latin American Test Symposium (LATS), 1-5, 2021
82021
A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
LM Luza, A Ruospo, A Bosio, E Sanchez, L Dilillo
2021 24th International Symposium on Design and Diagnostics of Electronic …, 2021
62021
Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip
DA Santos, AMP Mattos, LM Luza, C Cazzaniga, M Kastriotou, DR Melo, ...
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2022
52022
Neutron-induced effects on a self-refresh DRAM
LM Luza, D Söderström, H Puchner, RG Alía, M Letiche, C Cazzaniga, ...
Microelectronics Reliability 128, 114406, 2022
52022
Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study
LM Luza, D Söderström, AMP de Mattos, EA Bezerra, C Cazzaniga, ...
2021 16th International Conference on Design & Technology of Integrated …, 2021
42021
Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory
LM Luza, A Bosser, V Gupta, A Javanainen, A Mohammadzadeh, L Dilillo
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019
42019
A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites
CA Rigo, LM Luza, ED Tramontin, V Martins, SV Martinez, LK Slongo, ...
2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019
32019
Analysis of space and atmospheric radiation-induced effects on memory devices
LM Luza
Université Montpellier, 2021
12021
On the evaluation of FPGA radiation benchmarks
G Bricas, G Tsiligiannis, A Touboul, J Boch, M Kastriotou, C Cazzaniga, ...
Microelectronics Reliability 126, 114276, 2021
12021
Design and Implementation of a Flexible Interface for TID Detector
I Fara, LM Luza, J Boch, G Furano, M Ottavi, L Dilillo
2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces …, 2019
12019
Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case study
L Dilillo, DA dos Santos, LM Luza, AMP de Mattos, DR de Melo, L Entrena, ...
G-RADNEXT Workshop, 2023
2023
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