| Smart Align—a new tool for robust non-rigid registration of scanning microscope data L Jones, H Yang, TJ Pennycook, MSJ Marshall, S Van Aert, ND Browning, ... Advanced Structural and Chemical Imaging 1, 1-16, 2015 | 382 | 2015 |
| Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution TJ Pennycook, AR Lupini, H Yang, MF Murfitt, L Jones, PD Nellist Ultramicroscopy 151, 160-167, 2015 | 251 | 2015 |
| Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures H Yang, RN Rutte, L Jones, M Simson, R Sagawa, H Ryll, M Huth, ... Nature Communications 7 (1), 12532, 2016 | 229 | 2016 |
| Towards data-driven next-generation transmission electron microscopy SR Spurgeon, C Ophus, L Jones, A Petford-Long, SV Kalinin, MJ Olszta, ... Nature Materials, 1-6, 2020 | 182 | 2020 |
| Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope L Jones, PD Nellist Microscopy and Microanalysis 19 (4), 1050-1060, 2013 | 178 | 2013 |
| Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopy L Jones, KE MacArthur, VT Fauske, ATJ van Helvoort, PD Nellist Nano Letters 14 (11), 6336-6341, 2014 | 129 | 2014 |
| Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution H Yang, I MacLaren, L Jones, GT Martinez, M Simson, M Huth, H Ryll, ... Ultramicroscopy 180, 173-179, 2017 | 94 | 2017 |
| Polarization screening-induced magnetic phase gradients at complex oxide interfaces SR Spurgeon, PV Balachandran, DM Kepaptsoglou, AR Damodaran, ... Nature communications 6 (1), 6735, 2015 | 88 | 2015 |
| Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall‐Meanders, Kinks, and Local Electric Charges J Gonnissen, D Batuk, GF Nataf, L Jones, AM Abakumov, S Van Aert, ... Advanced Functional Materials 26 (42), 7599-7604, 2016 | 83 | 2016 |
| Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy S Wenner, L Jones, CD Marioara, R Holmestad Micron 96, 103-111, 2017 | 78 | 2017 |
| Electrochemical CO oxidation at platinum on carbon studied through analysis of anomalous in situ IR spectra IJ McPherson, PA Ash, L Jones, A Varambhia, RMJ Jacobs, KA Vincent The Journal of Physical Chemistry C 121 (32), 17176-17187, 2017 | 69 | 2017 |
| Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning H Yang, JG Lozano, TJ Pennycook, L Jones, PB Hirsch, PD Nellist Nature Communications 6 (1), 7266, 2015 | 69 | 2015 |
| 4D STEM: High efficiency phase contrast imaging using a fast pixelated detector H Yang, L Jones, H Ryll, M Simson, H Soltau, Y Kondo, R Sagawa, ... Journal of Physics: Conference Series 644 (1), 012032, 2015 | 68 | 2015 |
| Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting A De Backer, GT Martinez, KE MacArthur, L Jones, A Béché, PD Nellist, ... Ultramicroscopy 151, 56-61, 2015 | 62 | 2015 |
| Prismatic 2.0–Simulation software for scanning and high resolution transmission electron microscopy (STEM and HRTEM) LR DaCosta, HG Brown, PM Pelz, A Rakowski, N Barber, P O’Donovan, ... Micron 151, 103141, 2021 | 60 | 2021 |
| Predicting the oxygen-binding properties of platinum nanoparticle ensembles by combining high-precision electron microscopy and density functional theory J Aarons, L Jones, A Varambhia, KE MacArthur, D Ozkaya, M Sarwar, ... Nano letters 17 (7), 4003-4012, 2017 | 60 | 2017 |
| Managing dose-, damage-and data-rates in multi-frame spectrum-imaging L Jones, A Varambhia, R Beanland, D Kepaptsoglou, I Griffiths, A Ishizuka, ... Microscopy 67 (suppl_1), i98-i113, 2018 | 58 | 2018 |
| Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping L Jones, S Wenner, M Nord, PH Ninive, OM Løvvik, R Holmestad, ... Ultramicroscopy 179, 57-62, 2017 | 57 | 2017 |
| Quantitative ADF STEM: acquisition, analysis and interpretation L Jones IOP Conference series: materials science and engineering 109 (1), 012008, 2016 | 55 | 2016 |
| Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities A De Backer, L Jones, I Lobato, T Altantzis, B Goris, PD Nellist, S Bals, ... Nanoscale 9 (25), 8791-8798, 2017 | 51 | 2017 |
Peter NellistProfessor of Materials, University of OxfordVerified email at materials.ox.ac.uk
