John Cuffe
Zitiert von
Zitiert von
Direct measurement of room-temperature nondiffusive thermal transport over micron distances in a silicon membrane
JA Johnson, AA Maznev, J Cuffe, JK Eliason, AJ Minnich, T Kehoe, ...
Physical review letters 110 (2), 025901, 2013
Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry
E Chávez-Angel, JS Reparaz, J Gomis-Bresco, MR Wagner, J Cuffe, ...
APL Materials 2 (1), 2014
Reconstructing phonon mean-free-path contributions to thermal conductivity using nanoscale membranes
J Cuffe, JK Eliason, AA Maznev, KC Collins, JA Johnson, A Shchepetov, ...
Physical Review B 91 (24), 245423, 2015
Lifetimes of confined acoustic phonons in ultrathin silicon membranes
J Cuffe, O Ristow, E Chávez, A Shchepetov, PO Chapuis, F Alzina, ...
Physical review letters 110 (9), 095503, 2013
Phonons in slow motion: Dispersion relations in ultrathin Si membranes
J Cuffe, E Chávez, A Shchepetov, PO Chapuis, EH El Boudouti, F Alzina, ...
Nano letters 12 (7), 3569-3573, 2012
Ultra-thin free-standing single crystalline silicon membranes with strain control
A Shchepetov, M Prunnila, F Alzina, L Schneider, J Cuffe, H Jiang, ...
Applied Physics Letters 102 (19), 2013
Thermal transport in suspended silicon membranes measured by laser-induced transient gratings
A Vega-Flick, RA Duncan, JK Eliason, J Cuffe, JA Johnson, JPM Peraud, ...
AIP advances 6 (12), 2016
Examining thermal transport through a frequency-domain representation of time-domain thermoreflectance data
KC Collins, AA Maznev, J Cuffe, KA Nelson, G Chen
Review of Scientific Instruments 85 (12), 2014
Enhanced light extraction in ITO-free OLEDs using double-sided printed electrodes
V Reboud, AZ Khokhar, B Sepúlveda, D Dudek, T Kehoe, J Cuffe, ...
Nanoscale 4 (11), 3495-3500, 2012
Nanostructured p-type Cr/V 2 O 5 thin films with boosted thermoelectric properties
J Loureiro, JR Santos, A Nogueira, F Wyczisk, L Divay, S Reparaz, ...
Journal of Materials Chemistry A 2 (18), 6456-6462, 2014
Calculation of the specific heat in ultra-thin free-standing silicon membranes
E Chávez, J Cuffe, F Alzina, CMS Torres
Journal of Physics: Conference Series 395 (1), 012105, 2012
Experimental evidence of non-diffusive thermal transport in Si and GaAs
JA Johnson, AA Maznev, JK Eliason, A Minnich, K Collins, G Chen, ...
MRS Online Proceedings Library 1347, 1-6, 2011
Lifetime of high-order thickness resonances of thin silicon membranes
AA Maznev, F Hofmann, J Cuffe, JK Eliason, KA Nelson
Ultrasonics 56, 116-121, 2015
Fine control of critical dimension for the fabrication of large bandgap high frequency photonic and phononic crystals
J Cuffe, D Dudek, N Kehagias, PO Chapuis, V Reboud, F Alsina, ...
Microelectronic engineering 88 (8), 2233-2235, 2011
Comparison of Brillouin light scattering and density of states in a supported layer: analytical and experimental study
O El Abouti, J Cuffe, EH El Boudouti, CM Sotomayor Torres, ...
Crystals 12 (9), 1212, 2022
Non Local Corrections to the Electronic Structure of Non Ideal Electron Gases: The Case of Graphene and Tyrosine
Y García, J Cuffe, F Alzina, CM Sotomayor-Torres
Journal of Modern Physics 4 (04), 522, 2013
Dispersion of confined acoustic phonons in ultra-thin Si membranes
J Cuffe, E Chavez, PO Chapuis, EH El Boudouti, F Alzina, D Dudek, ...
1st International Conference on Phononic Crystals, Metamaterials and …, 2011
Acoustic Phonons in Ultrathin Free‐Standing Silicon Membranes
CM Sotomayor Torres, F Alzina, A Shchepetov, E Chavez‐Angel, J Cuffe, ...
Silicon Nanomembranes: Fundamental Science and Applications, 305-326, 2016
Comparison of Brillouin Light Scattering and Density of States in a Supported Layer: Analytical and Experimental Study. Crystals 2022, 12, 1212
O El Abouti, J Cuffe, EH El Boudouti, CM Sotomayor Torres, ...
s Note: MDPI stays neu-tral with regard to jurisdictional claims in …, 2022
Nanostructured p-type Cr/V₂O₅ thin films with boosted thermoelectric properties
J Loureiro, JR Santos, A Nogueira, F Wyczisk, L Divay, S Reparaz, ...
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20