| Evaluation of the electrical contact area in contact-mode scanning probe microscopy U Celano, T Hantschel, G Giammaria, RC Chintala, T Conard, H Bender, ... Journal of Applied Physics 117 (21), 2015 | 60 | 2015 |
| Sacrificial self-assembled monolayers for the passivation of GaAs (100) surfaces and interfaces D Cuypers, C Fleischmann, DH van Dorp, S Brizzi, M Tallarida, M Müller, ... Chemistry of Materials 28 (16), 5689-5701, 2016 | 26 | 2016 |
| Photoinduced Charge Transfer and Trapping on Single Gold Metal Nanoparticles on TiO2 M Luna, M Barawi, S Gómez-Moñivas, J Colchero, M Rodríguez-Peña, ... ACS Applied Materials & Interfaces 13 (42), 50531-50538, 2021 | 16 | 2021 |
| Electrical properties of amino SAM layers studied with conductive AFM R Chintala, P Eyben, S Armini, AM Caro, J Loyo, Y Sun, W Vandervorst European polymer journal 49 (8), 1952-1956, 2013 | 13 | 2013 |
| Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy R Chintala, JG Tait, P Eyben, E Voroshazi, S Surana, C Fleischmann, ... Nanoscale 8 (6), 3629-3637, 2016 | 11 | 2016 |
| The unexpected effects of crystallization on Ta2O5 as studied by HRTEM and C-AFM U Celano, RC Chintala, C Adelmann, O Richard, W Vandervorst Microelectronic engineering 109, 318-321, 2013 | 8 | 2013 |
| Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography RC Chintala, S Wood, JC Blakesley, P Favia, U Celano, K Paredis, ... Aip Advances 9 (2), 2019 | 7 | 2019 |
| Scanning microwave impedance microscopy: Room-temperature and low-temperature applications for device and material characterization RC Chintala, K Rubin, Y Yang IEEE Microwave Magazine 21 (10), 22-35, 2020 | 6 | 2020 |
| A simple scheme of molecular electronic devices with multiwalled carbon nanotubes as the top electrodes JP Moscatello, A Prasad, R Chintala, YK Yap Carbon 50 (10), 3530-3534, 2012 | 5 | 2012 |
| Surface characterization of InP trenches embedded in oxide using scanning probe microscopy M Mannarino, R Chintala, A Moussa, C Merckling, P Eyben, K Paredis, ... Journal of Applied Physics 118 (22), 2015 | 4 | 2015 |
| Advances in Scanning Microwave Impedance Microscopy RC Chintala, N Antoniou, Y Yang ISTFA 2021, 436-440, 2021 | 2 | 2021 |
| Scanning microwave impedance microscopy for materials metrology N Antoniou, R Chintala, Y Yang Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021 | 1 | 2021 |
| Scanning Microwave Impedance Microscopy Y Yang, N Antoniou, R Chintala Atomic Force Microscopy for Energy Research, 185-212, 2022 | | 2022 |
| Photo-assisted kelvin probe force microscopy to study the surface charge changes in the enhanced photo-catalytic activity of TiO2 (110) M Luna, PD Ashby, YH Lu, R Chintala, A Weber-Bargioni, ... | | 2018 |
| Characterization of organic materials using scanning probe microscopy techniques R Chintala | | 2017 |
| A 3D electrical characterization of single stacking faults in InP by conductive-AFM M Mannarino, U Celano, A Lu, RC Chintala, K Paredis, W Vandervorst 2015 MRS Fall Meeting symposium UU:, Date: 2015/01/01-2015/01/11, Location …, 2015 | | 2015 |
| Thermal degradation study of P3HT: PCBM solar cells using SPM techniques RC Chintala, J Tait, P Eyben, E Voroshazi, W Vandervorst | | 2014 |
| Characterization of InP growth in nm-sized trenches by a combination of NC-AFM and STM M Mannarino, P Eyben, RC Chintala, C Merckling, D van Dorp, ... | | 2014 |
| A novel approach of using STM and NC-AFM to study narrow trenches in an oxide matrix M Mannarino, RC Chintala, P Eyben, W Vandervorst | | 2014 |
| Combining UHV AFM and SEM for high resolution, repeatable and low noise scanning spreading resistance microscopy P Eyben, RC Chintala, M Mannarino, A Nazir, A Schulze, W Vandervorst | | 2013 |
