Anteneh Gebregiorgis
Title
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Cited by
Year
Aging mitigation in memory arrays using self-controlled bit-flipping technique
A Gebregiorgis, M Ebrahimi, S Kiamehr, F Oboril, S Hamdioui, ...
The 20th Asia and South Pacific Design Automation Conference, 231-236, 2015
372015
A cross-layer analysis of soft error, aging and process variation in near threshold computing
A Gebregiorgis, S Kiamehr, F Oboril, R Bishnoi, MB Tahoori
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 205-210, 2016
122016
Test pattern generation for approximate circuits based on boolean satisfiability
A Gebregiorgis, MB Tahoori
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2019
102019
Maximizing energy efficiency in NTC by variation-aware microprocessor pipeline optimization
A Gebregiorgis, MS Golanbari, S Kiamehr, F Oboril, MB Tahoori
Proceedings of the 2016 International Symposium on Low Power Electronics and …, 2016
92016
A cross-layer approach for resiliency and energy efficiency in near threshold computing
MS Golanbari, A Gebregiorgis, F Oboril, S Kiamehr, MB Tahoori
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2016
82016
Error propagation aware timing relaxation for approximate near threshold computing
A Gebregiorgis, S Kiamehr, MB Tahoori
Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017
72017
Post-fabrication calibration of near-threshold circuits for energy efficiency
MS Golanbari, S Kiamehr, F Oboril, A Gebregiorgis, MB Tahoori
2017 18th International Symposium on Quality Electronic Design (ISQED), 385-390, 2017
72017
Balancing resiliency and energy efficiency of functional units in ultra-low power systems
MS Golanbari, A Gebregiorgis, E Moradi, S Kiamehr, MB Tahoori
2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), 637-644, 2018
52018
A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach
A Gebregiorgis, R Bishnoi, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018
42018
Fine-grained energy-constrained microprocessor pipeline design
A Gebregiorgis, MB Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (3), 457-469, 2017
42017
Modeling and testing of aging faults in finfet memories for automotive applications
G Tshagharyan, G Harutyunyan, Y Zorian, A Gebregiorgis, MS Golanbari, ...
2018 IEEE International Test Conference (ITC), 1-10, 2018
22018
Aging Mitigation Schemes for Embedded Memories
AB Gebregiorgis
22014
Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis
A Gebregiorgis, MB Tahoori
2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018
12018
Spintronic normally-off heterogeneous system-on-chip design
A Gebregiorgis, R Bishnoi, MB Tahoori
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 113-118, 2018
12018
Reliability analysis and mitigation of near threshold caches
A Gebregiorgis, MB Tahoori
2017 International Mixed Signals Testing Workshop (IMSTW), 1-6, 2017
12017
Instruction cache aging mitigation through Instruction Set Encoding
A Gebregiorgis, F Oboril, MB Tahoori, S Hamdioui
2016 17th International Symposium on Quality Electronic Design (ISQED), 325-330, 2016
12016
Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation
MS Golanbari, S Kiamehr, F Oboril, A Gebregiorgis, MB Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (2), 443-455, 2019
2019
Testing of Neuromorphic Circuits: Structural vs Functional
A Gebregiorgis, MB Tahoori
2019 IEEE International Test Conference (ITC), 1-10, 2019
2019
Resilient Energy-Constrained Microprocessor Architectures
A Gebregiorgis
Karlsruhe Institute of Technology, Germany, 2019
2019
PROCEEDINGS-INTERNATIONAL TEST CONFERENCE
S Jin, K Chakrabarty, Z Zhang, X Gu, SM Nair, R Bishnoi, MB Tahoori, ...
2019
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