Nico Klingner
Title
Cited by
Cited by
Year
Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry
N Klingner, R Heller, G Hlawacek, J von Borany, J Notte, J Huang, ...
Ultramicroscopy 162, 91-97, 2016
302016
Threshold and efficiency for perforation of 1 nm thick carbon nanomembranes with slow highly charged ions
RA Wilhelm, E Gruber, R Ritter, R Heller, A Beyer, A Turchanin, ...
2D Materials 2 (3), 035009, 2015
132015
Quantum oscillations and ferromagnetic hysteresis observed in iron filled multiwall carbon nanotubes
J Barzola-Quiquia, N Klingner, J Krüger, A Molle, P Esquinazi, ...
Nanotechnology 23 (1), 015707, 2011
112011
Time-of-flight secondary ion mass spectrometry in the helium ion microscope
N Klingner, R Heller, G Hlawacek, S Facsko, J von Borany
Ultramicroscopy 198, 10-17, 2019
62019
Lithium ion beams from liquid metal alloy ion sources
W Pilz, N Klingner, L Bischoff, P Mazarov, S Bauerdick
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2019
42019
Quantitative elemental microscopy on lateral highly inhomogeneous meteorite samples using ion beam analysis
R Wunderlich, N Klingner, J Vogt, D Spemann
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2013
42013
Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm Scale
R Heller, N Klingner, G Hlawacek
Helium Ion Microscopy, 265-295, 2016
32016
Optimizing the Rutherford Backscattering Spectrometry setup in a nuclear microprobe
N Klingner, J Vogt, D Spemann
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2013
32013
Entwicklung eines Systems zur hochaufgelösten Rutherford-Rückstreu-Spektrometrie mittels Halbleiterdetektoren
N Klingner
Universität Leipzig, 2012
22012
Modelling of focused ion beam induced increases in sample temperature: a case study of heat damage in biological samples
A WOLFF, N KLINGNER, W THOMPSON, Y ZHOU, J LIN, YY PENG, ...
Journal of Microscopy, 2018
12018
Ionenstrahlanalytik im Helium-Ionen-Mikroskop
N Klingner
Technische Universtität Dresden, 2016
12016
Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
N Klingner, G Hlawacek, R Heller, J von Borany, S Facsko
Microscopy and Microanalysis 22 (S3), 618-619, 2016
12016
Morphology modifcation of Si nanopillars under ion irradiation at elevated temperatures: plastic deformation and controlled thinning to 10nm
X Xu, KH Heinig, W Möller, HJ Engelmann, N Klingner, A Gharbi, R Tiron, ...
Semiconductor Science and Technology 35, 015021, 2019
2019
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
M Mousley, S Eswara, O De Castro, O Bouton, N Klingner, CT Koch, ...
Beilstein Journal of Nanotechnology 10 (1), 1648-1657, 2019
2019
Focused Ion Beams in Biology: How the Helium Ion Microscope and FIB/SEMs Help Reveal Nature's Tiniest Structures
A Wolff, N Klingner, W Thompson, Y Zhou, J Lin, YY Peng, JAM Ramshaw, ...
Microscopy and Microanalysis 25 (S2), 864-865, 2019
2019
Vorrichtung und Verfahren zum Erzeugen von Ionenpulsen sowie deren Verwendung
RA Wilhelm, N Klingner, S Facsko
DE Patent 102017218456B3, 2018
2018
Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope
N Klingner, G Hlawacek, R Heller, J von Borany, S Facsko
Microscopy and Microanalysis 24 (S1), 802-803, 2018
2018
Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts
J Buchriegler, N Klingner, D Hanf, F Munnik, SH Nowak, O Scharf, ...
X‐Ray Spectrometry, 2018
2018
Ionenmikroskopievorrichtung
N Klingner, J von Borany, G Hlawacek, S Facsko, RA Wilhelm, R Heller
DE Patent 10 2016 112 328, 2017
2017
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Articles 1–19