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Nicholas May
Nicholas May
Innovation Partnership Building at UCONN & Manhattan College SOE
Bestätigte E-Mail-Adresse bei uconn.edu
Titel
Zitiert von
Zitiert von
Jahr
Training AI-based feature extraction algorithms, for micro CT images, using synthesized data
M Konnik, B Ahmadi, N May, J Favata, Z Shahbazi, S Shahbazmohamadi, ...
Journal of Nondestructive Evaluation 40, 1-13, 2021
172021
Rapid high-resolution volumetric imaging via laser ablation delayering and confocal imaging
A Phoulady, N May, H Choi, Y Suleiman, S Shahbazmohamadi, ...
Scientific Reports 12 (1), 12277, 2022
62022
A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics
A Phoulady, N May, H Choi, S Shahbazmohamadi, P Tavousi
Microelectronics Reliability 126, 114287, 2021
62021
Reverse engineering and geometric optimization for resurrecting antique saxophone sound using micro-computed tomography and additive manufacturing
F Celentano, R DiPasquale, E Simoneau, N May, Z Shahbazi, ...
Journal of Computing and Information Science in Engineering 17 (3), 034501, 2017
62017
Rapid three-dimensional reconstruction of printed circuit board using femtosecond laser delayering and digital microscopy
H Choi, N May, A Phoulady, Y Suleiman, D DiMase, ...
Microelectronics Reliability 138, 114659, 2022
52022
Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation
N May, H Choi, A Phoulady, Y Suleiman, D DiMase, P Tavousi, ...
Microelectronics Reliability 138, 114660, 2022
52022
Femtosecond laser hierarchical surface restructuring for next generation neural interfacing electrodes and microelectrode arrays
S Amini, W Seche, N May, H Choi, P Tavousi, S Shahbazmohamadi
Scientific Reports 12 (1), 13966, 2022
52022
Single Image Composite Tomography Utilizing Large Scale Femtosecond Laser Cross-sectioning and Scanning Electron Microscopy
N May, A Phoulady, H Choi, P Tavousi, S Shahbazmohamadi
Microscopy and Microanalysis 28 (S1), 876-878, 2022
52022
Gas-assisted femtosecond pulsed laser machining: A high-throughput alternative to focused ion beam for creating large, high-resolution cross sections
N May, H Choi, A Phoulady, S Amini, P Tavousi, S Shahbazmohamadi
Plos one 18 (5), e0285158, 2023
42023
In-situ 3D X-ray tomography and analysis of reverse osmosis membranes under compaction
Y Suleiman, N May, M Zhang, A Zhu, S Zhang, J McCutcheon, ...
Microscopy and Microanalysis 28 (S1), 270-271, 2022
42022
Three-Dimensional Reconstruction of Printed Circuit Boards: Comparative Study between 3D Femtosecond Laser Serial Sectioning and Optical Imaging versus 3D X-Ray Computed Tomography
N May, H Choi, A Phoulady, P Tavousi, S Shahbazmohamadi
Microscopy and Microanalysis 28 (S1), 284-286, 2022
42022
Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors
N May, J Favata, B Ahmadi, P Tavousi, S Shahbazmohamadi
Microelectronics Reliability 114, 113858, 2020
42020
3D printing for manufacturing antique and modern musical instrument parts
F Celentano, N May, E Simoneau, R DiPasquale, Z Shahbazi, ...
ASME International Mechanical Engineering Congress and Exposition 50688 …, 2016
42016
Synthetic data augmentation to enhance manual and automated defect detection in microelectronics
A Phoulady, Y Suleiman, H Choi, T Moore, N May, S Shahbazmohamadi, ...
Microelectronics Reliability 150, 115220, 2023
22023
Terahertz-readable laser engraved marks as a novel solution for product traceability
P Hoveida, A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi
Scientific Reports 13 (1), 12474, 2023
22023
Generation and control of phase-locked Bessel beams with a persistent noninterfering region
Z Rodnova, T Saule, R Sadlon, E McManus, N May, X Yu, ...
JOSA B 37 (11), 3179-3183, 2020
22020
Automated, real-time material detection during ultrashort pulsed laser machining using laser-induced breakdown spectroscopy, for process tuning, end-pointing, and segmentation
H Choi, A Phoulady, P Hoveida, N May, S Shahbazmohamadi, P Tavousi
Plos one 19 (1), e0290761, 2024
12024
Model for predicting surface properties of lasered samples
A Phoulady, H Choi, N May, B Ahmadi, P Tavousi, S Shahbazmohamadi
Microscopy and Microanalysis 27 (S1), 3186-3189, 2021
12021
Automated endpointing in microelectronics failure analysis using laser induced breakdown spectroscopy
P Hoveida, A Phoulady, H Choi, Y Suleiman, N May, T Moore, ...
Microelectronics Reliability 150, 115224, 2023
2023
System and method of detecting or predicting materials in microelectronic devices and laser-based machining techniques with co2 assisted processing
MAY Nicholas, H Choi, V Ray, P Tavousi, S Shahbazmohamadi, ...
US Patent App. 18/160,986, 2023
2023
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