Training AI-based feature extraction algorithms, for micro CT images, using synthesized data M Konnik, B Ahmadi, N May, J Favata, Z Shahbazi, S Shahbazmohamadi, ... Journal of Nondestructive Evaluation 40, 1-13, 2021 | 17 | 2021 |
Rapid high-resolution volumetric imaging via laser ablation delayering and confocal imaging A Phoulady, N May, H Choi, Y Suleiman, S Shahbazmohamadi, ... Scientific Reports 12 (1), 12277, 2022 | 6 | 2022 |
A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics A Phoulady, N May, H Choi, S Shahbazmohamadi, P Tavousi Microelectronics Reliability 126, 114287, 2021 | 6 | 2021 |
Reverse engineering and geometric optimization for resurrecting antique saxophone sound using micro-computed tomography and additive manufacturing F Celentano, R DiPasquale, E Simoneau, N May, Z Shahbazi, ... Journal of Computing and Information Science in Engineering 17 (3), 034501, 2017 | 6 | 2017 |
Rapid three-dimensional reconstruction of printed circuit board using femtosecond laser delayering and digital microscopy H Choi, N May, A Phoulady, Y Suleiman, D DiMase, ... Microelectronics Reliability 138, 114659, 2022 | 5 | 2022 |
Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation N May, H Choi, A Phoulady, Y Suleiman, D DiMase, P Tavousi, ... Microelectronics Reliability 138, 114660, 2022 | 5 | 2022 |
Femtosecond laser hierarchical surface restructuring for next generation neural interfacing electrodes and microelectrode arrays S Amini, W Seche, N May, H Choi, P Tavousi, S Shahbazmohamadi Scientific Reports 12 (1), 13966, 2022 | 5 | 2022 |
Single Image Composite Tomography Utilizing Large Scale Femtosecond Laser Cross-sectioning and Scanning Electron Microscopy N May, A Phoulady, H Choi, P Tavousi, S Shahbazmohamadi Microscopy and Microanalysis 28 (S1), 876-878, 2022 | 5 | 2022 |
Gas-assisted femtosecond pulsed laser machining: A high-throughput alternative to focused ion beam for creating large, high-resolution cross sections N May, H Choi, A Phoulady, S Amini, P Tavousi, S Shahbazmohamadi Plos one 18 (5), e0285158, 2023 | 4 | 2023 |
In-situ 3D X-ray tomography and analysis of reverse osmosis membranes under compaction Y Suleiman, N May, M Zhang, A Zhu, S Zhang, J McCutcheon, ... Microscopy and Microanalysis 28 (S1), 270-271, 2022 | 4 | 2022 |
Three-Dimensional Reconstruction of Printed Circuit Boards: Comparative Study between 3D Femtosecond Laser Serial Sectioning and Optical Imaging versus 3D X-Ray Computed Tomography N May, H Choi, A Phoulady, P Tavousi, S Shahbazmohamadi Microscopy and Microanalysis 28 (S1), 284-286, 2022 | 4 | 2022 |
Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors N May, J Favata, B Ahmadi, P Tavousi, S Shahbazmohamadi Microelectronics Reliability 114, 113858, 2020 | 4 | 2020 |
3D printing for manufacturing antique and modern musical instrument parts F Celentano, N May, E Simoneau, R DiPasquale, Z Shahbazi, ... ASME International Mechanical Engineering Congress and Exposition 50688 …, 2016 | 4 | 2016 |
Synthetic data augmentation to enhance manual and automated defect detection in microelectronics A Phoulady, Y Suleiman, H Choi, T Moore, N May, S Shahbazmohamadi, ... Microelectronics Reliability 150, 115220, 2023 | 2 | 2023 |
Terahertz-readable laser engraved marks as a novel solution for product traceability P Hoveida, A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi Scientific Reports 13 (1), 12474, 2023 | 2 | 2023 |
Generation and control of phase-locked Bessel beams with a persistent noninterfering region Z Rodnova, T Saule, R Sadlon, E McManus, N May, X Yu, ... JOSA B 37 (11), 3179-3183, 2020 | 2 | 2020 |
Automated, real-time material detection during ultrashort pulsed laser machining using laser-induced breakdown spectroscopy, for process tuning, end-pointing, and segmentation H Choi, A Phoulady, P Hoveida, N May, S Shahbazmohamadi, P Tavousi Plos one 19 (1), e0290761, 2024 | 1 | 2024 |
Model for predicting surface properties of lasered samples A Phoulady, H Choi, N May, B Ahmadi, P Tavousi, S Shahbazmohamadi Microscopy and Microanalysis 27 (S1), 3186-3189, 2021 | 1 | 2021 |
Automated endpointing in microelectronics failure analysis using laser induced breakdown spectroscopy P Hoveida, A Phoulady, H Choi, Y Suleiman, N May, T Moore, ... Microelectronics Reliability 150, 115224, 2023 | | 2023 |
System and method of detecting or predicting materials in microelectronic devices and laser-based machining techniques with co2 assisted processing MAY Nicholas, H Choi, V Ray, P Tavousi, S Shahbazmohamadi, ... US Patent App. 18/160,986, 2023 | | 2023 |