|Structure and ferroelectricity of nonstoichiometric (Na0.5Bi0.5)TiO3|
J Carter, E Aksel, T Iamsasri, JS Forrester, J Chen, JL Jones
Applied Physics Letters 104 (11), 112904, 2014
|Electric field-induced phase transitions in Li-modified Na0.5K0.5NbO3 at the polymorphic phase boundary|
T Iamsasri, G Tutuncu, C Uthaisar, S Wongsaenmai, S Pojprapai, ...
Journal of Applied Physics 117 (2), 024101, 2015
|Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics|
S Gorfman, H Simons, T Iamsasri, S Prasertpalichat, DP Cann, H Choe, ...
Scientific reports 6 (1), 20829, 2016
|Local and average structures of BaTiO3-Bi(Zn1/2Ti1/2)O3|
TM Usher, T Iamsasri, JS Forrester, N Raengthon, N Triamnak, DP Cann, ...
Journal of Applied Physics 120 (18), 184102, 2016
|Extensive domain wall contribution to strain in a (K, Na) NbO3-based lead-free piezoceramics quantified from high energy X-ray diffraction|
DA Ochoa, G Esteves, T Iamsasri, F Rubio-Marcos, JF Fernández, ...
Journal of the European Ceramic Society 36 (10), 2489-2494, 2016
|Analysis methods for characterizing ferroelectric/ferroelastic domain reorientation in orthorhombic perovskite materials and application to Li-doped Na0.5K0.5NbO3|
T Iamsasri, G Tutuncu, C Uthaisar, S Pojprapai, JL Jones
Journal of Materials Science 48, 6905-6910, 2013
|Crystal structure of Si-doped HfO2|
L Zhao, M Nelson, H Aldridge, T Iamsasri, CM Fancher, JS Forrester, ...
Journal of Applied Physics 115 (3), 034104, 2014
|Effect of Crystallographic Texture on the Field-Induced-Phase Transformation Behavior of Bi 0.5Na 0.5TiO 3−7BaTiO 3−2K 0.5 Na 0.5NbO 3|
CM Fancher, T Iamsasri, JE Blendell, KJ Bowman
Materials Research Letters 1 (3), 156-160, 2013
|Time and frequency-dependence of the electric field-induced phase transition in BaTiO3-BiZn1/2Ti1/2O3|
T Iamsasri, G Esteves, H Choe, M Vogt, S Prasertpalichat, DP Cann, ...
Journal of Applied Physics 122 (6), 064104, 2017
|A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials|
T Iamsasri, J Guerrier, G Esteves, CM Fancher, AG Wilson, RC Smith, ...
Journal of Applied Crystallography 50 (1), 211-220, 2017
|Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns|
L Zhao, D Hou, TM Usher, T Iamsasri, CM Fancher, JS Forrester, ...
Journal of Alloys and Compounds 646, 655-661, 2015
|Electric Field-Induced Phase Transitions in Ferroelectrics at Polymorphic Phase Boundaries|
North Carolina State University, 2016
|The use of Bayesian inference in the characterization of materials and thin films|
JL Jones, R Broughton, T Iamsasri, CM Fancher, AG Wilson, B Reich, ...
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 75, A211-A211, 2019
|Time-resolved X-ray diffraction reveals the origins of high dielectric and electromechanical responses in ferroelectrics|
S Gorfman, H Choe, M Ziolkowski, T Iamsasri, J Jones, V Shvartsman, ...
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 71, S84-S85, 2015