Frieder Johannes Koch
Frieder Johannes Koch
Bestätigte E-Mail-Adresse bei gsi.de
Titel
Zitiert von
Zitiert von
Jahr
In-vivo x-ray dark-field chest radiography of a pig
LB Gromann, F De Marco, K Willer, PB Noël, K Scherer, B Renger, ...
Scientific reports 7 (1), 1-7, 2017
552017
Experimental realisation of high-sensitivity laboratory X-ray grating-based phase-contrast computed tomography
L Birnbacher, M Willner, A Velroyen, M Marschner, A Hipp, J Meiser, ...
Scientific reports 6, 24022, 2016
532016
X-ray phase-contrast imaging and metrology through unified modulated pattern analysis
MC Zdora, P Thibault, T Zhou, FJ Koch, J Romell, S Sala, A Last, C Rau, ...
Physical review letters 118 (20), 203903, 2017
332017
Large field-of-view tiled grating structures for X-ray phase-contrast imaging
TJ Schröter, FJ Koch, P Meyer, D Kunka, J Meiser, K Willer, L Gromann, ...
Review of Scientific Instruments 88 (1), 015104, 2017
322017
Increasing the field of view in grating based X-ray phase contrast imaging using stitched gratings
J Meiser, M Willner, T Schröter, A Hofmann, J Rieger, F Koch, ...
Journal of X-Ray Science and Technology 24 (3), 379-388, 2016
252016
X-ray grating interferometry at photon energies over 180 keV
M Ruiz-Yaniz, F Koch, I Zanette, A Rack, P Meyer, D Kunka, A Hipp, ...
Applied Physics Letters 106 (15), 151105, 2015
222015
Large-area full field x-ray differential phase-contrast imaging using 2D tiled gratings
TJ Schröter, FJ Koch, D Kunka, P Meyer, S Tietze, S Engelhardt, M Zuber, ...
Journal of Physics D: Applied Physics 50 (22), 225401, 2017
192017
Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry
FJ Koch, C Detlefs, TJ Schröter, D Kunka, A Last, J Mohr
Optics express 24 (9), 9168-9177, 2016
162016
Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses
B Rösner, F Koch, F Döring, J Bosgra, VA Guzenko, E Kirk, M Meyer, ...
Microelectronic Engineering 191, 91-96, 2018
152018
Increasing the aperture of x-ray mosaic lenses by freeze drying
F Koch, F Marschall, J Meiser, O Márkus, A Faisal, T Schröter, P Meyer, ...
Journal of Micromechanics and Microengineering 25 (7), 075015, 2015
142015
7 nm spatial resolution in soft x-ray microscopy
B Rösner, F Koch, F Döring, VA Guzenko, M Meyer, JL Ornelas, A Späth, ...
Microscopy and Microanalysis 24 (S2), 270-271, 2018
122018
Large area gratings by x-ray LIGA dynamic exposure for x-ray phase-contrast imaging
TJ Schröter, F Koch, P Meyer, M Baumann, D Münch, D Kunka, ...
Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (1), 013501, 2017
122017
Note: Gratings on low absorbing substrates for x-ray phase contrast imaging
FJ Koch, TJ Schröter, D Kunka, P Meyer, J Meiser, A Faisal, MI Khalil, ...
Review of Scientific Instruments 86 (12), 126114, 2015
122015
Characterization method for new resist formulations for HAR patterns made by X-ray lithography
D Kunka, J Mohr, V Nazmov, J Meiser, P Meyer, M Amberger, F Koch, ...
Microsystem technologies 20 (10-11), 2023-2029, 2014
122014
Wavefront sensing at x-ray free-electron lasers
M Seaberg, R Cojocaru, S Berujon, E Ziegler, A Jaggi, J Krempasky, ...
Journal of synchrotron radiation 26 (4), 2019
82019
Increasing the field of view of x-ray phase contrast imaging using stitched gratings on low absorbent carriers
J Meiser, M Amberger, M Willner, D Kunka, P Meyer, F Koch, A Hipp, ...
Medical Imaging 2014: Physics of Medical Imaging 9033, 903355, 2014
82014
Towards X-ray transient grating spectroscopy
C Svetina, R Mankowsky, G Knopp, F Koch, G Seniutinas, B Rösner, ...
Optics Letters 44 (3), 574-577, 2019
62019
Ptychographic characterisation of polymer compound refractive lenses manufactured by additive technology
M Lyubomirskiy, F Koch, KA Abrashitova, VO Bessonov, N Kokareva, ...
Optics express 27 (6), 8639-8650, 2019
52019
Scanning Hard X-Ray Microscopy Based on Be CRLs
A Schropp, D Bruckner, J Bulda, G Falkenberg, J Garrevoet, F Seiboth, ...
Microscopy and Microanalysis 24 (S2), 186-187, 2018
52018
At-wavelength optics characterisation via X-ray speckle-and grating-based unified modulated pattern analysis
MC Zdora, I Zanette, T Zhou, FJ Koch, J Romell, S Sala, A Last, Y Ohishi, ...
Optics express 26 (4), 4989-5004, 2018
42018
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