| Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit C Kisielowski, B Freitag, M Bischoff, H Van Lin, S Lazar, G Knippels, ... Microscopy and Microanalysis 14 (5), 469-477, 2008 | 377 | 2008 |
| Transmission electron microscopy at 20 kV for imaging and spectroscopy U Kaiser, J Biskupek, JC Meyer, J Leschner, L Lechner, H Rose, ... Ultramicroscopy 111 (8), 1239-1246, 2011 | 242 | 2011 |
| First application of Cc-corrected imaging for high-resolution and energy-filtered TEM B Kabius, P Hartel, M Haider, H Müller, S Uhlemann, U Loebau, J Zach, ... Journal of electron microscopy 58 (3), 147-155, 2009 | 163 | 2009 |
| Advancing the hexapole Cs-corrector for the scanning transmission electron microscope H Müller, S Uhlemann, P Hartel, M Haider Microscopy and Microanalysis 12 (6), 442-455, 2006 | 154 | 2006 |
| Information transfer in a TEM corrected for spherical and chromatic aberration M Haider, P Hartel, H Müller, S Uhlemann, J Zach Microscopy and Microanalysis 16 (4), 393-408, 2010 | 140 | 2010 |
| Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM M Haider, H Müller, S Uhlemann, J Zach, U Loebau, R Hoeschen Ultramicroscopy 108 (3), 167-178, 2008 | 128 | 2008 |
| Chromatic aberration correction for atomic resolution TEM imaging from 20 to 80 kV M Linck, P Hartel, S Uhlemann, F Kahl, H Müller, J Zach, M Haider, ... Physical review letters 117 (7), 076101, 2016 | 125 | 2016 |
| Thermal magnetic field noise limits resolution in transmission electron microscopy S Uhlemann, H Müller, P Hartel, J Zach, M Haider Physical review letters 111 (4), 046101, 2013 | 118 | 2013 |
| Current and future aberration correctors for the improvement of resolution in electron microscopy M Haider, P Hartel, H Müller, S Uhlemann, J Zach Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009 | 101 | 2009 |
| Present and future hexapole aberration correctors for high-resolution electron microscopy M Haider, H Müller, S Uhlemann Advances in Imaging and Electron Physics 153, 43-119, 2008 | 50 | 2008 |
| A beam separator with small aberrations H Müller, D Preikszas, H Rose Journal of electron microscopy 48 (3), 191-204, 1999 | 45 | 1999 |
| Aplanatic imaging systems for the transmission electron microscope H Müller, I Maßmann, S Uhlemann, P Hartel, J Zach, M Haider Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011 | 40 | 2011 |
| A coherence function approach to image simulation H Müller, H Rose, P Schorsch Journal of Microscopy 190 (1‐2), 73-88, 1998 | 39 | 1998 |
| Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscopy with 0.5 Å information limit C Kisielowski, B Freitag, M Bischoff, H van Lin, S Lazar, G Knippels, ... Microsc Microanal 14, 454-462, 2008 | 38 | 2008 |
| In-focus electron microscopy of frozen-hydrated biological samples with a Boersch phase plate B Barton, D Rhinow, A Walter, R Schröder, G Benner, E Majorovits, ... Ultramicroscopy 111 (12), 1696-1705, 2011 | 36 | 2011 |
| Electron nanodiffraction using sharply focused parallel probes C Dwyer, AI Kirkland, P Hartel, H Müller, M Haider Applied Physics Letters 90 (15), 2007 | 36 | 2007 |
| Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same O Kienzle, D Stenkamp, M Steigerwald, R Knippelmeyer, M Haider, ... US Patent 6,903,337, 2005 | 36 | 2005 |
| Mirror corrector for low-voltage electron microscopes P Hartel, D Preikszas, R Spehr, H Müller, H Rose Advances in Imaging and Electron Physics 120, 41-133, 2003 | 35 | 2003 |
| Aberration-corrected optics: from an idea to a device H Müller, S Uhlemann, P Hartel, M Haider Physics Procedia 1 (1), 167-178, 2008 | 21 | 2008 |
| Thermal magnetic field noise: Electron optics and decoherence S Uhlemann, H Müller, J Zach, M Haider Ultramicroscopy, 2014 | 20 | 2014 |
Martin LinckPhD in physics, CEOS GmbH HeidelbergVerified email at ceos-gmbh.de
