Maurizio Rebaudengo
Title
Cited by
Cited by
Year
Soft-error detection using control flow assertions
O Goloubeva, M Rebaudengo, MS Reorda, M Violante
Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI …, 2003
3022003
Soft-error detection through software fault-tolerance techniques
M Rebaudengo, MS Reorda, M Torchiano, M Violante
Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance …, 1999
2081999
Software-implemented hardware fault tolerance
O Goloubeva, M Rebaudengo, MS Reorda, M Violante
Springer Science & Business Media, 2006
1802006
GATTO: A genetic algorithm for automatic test pattern generation for large synchronous sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996
1661996
Low power BIST via non-linear hybrid cellular automata
F Corno, M Rebaudengo, MS Reorda, G Squillero, M Violante
Proceedings 18th IEEE VLSI Test Symposium, 29-34, 2000
1572000
Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs
M Ceschia, M Violante, MS Reorda, A Paccagnella, P Bernardi, ...
IEEE Transactions on Nuclear Science 50 (6), 2088-2094, 2003
1532003
Experimentally evaluating an automatic approach for generating safety-critical software with respect to transient errors
P Cheynet, B Nicolescu, R Velazco, M Rebaudengo, MS Reorda, ...
IEEE Transactions on Nuclear Science 47 (6), 2231-2236, 2000
1352000
A test pattern generation methodology for low power consumption
E Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 453-457, 1998
1341998
A source-to-source compiler for generating dependable software
M Rebaudengo, MS Reorda, M Violante, M Torchiano
Proceedings First IEEE International Workshop on Source Code Analysis and …, 2001
1322001
Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA
M Bellato, P Bernardi, D Bortolato, A Candelori, M Ceschia, ...
Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004
1222004
An FPGA-based approach for speeding-up fault injection campaigns on safety-critical circuits
P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante
Journal of Electronic Testing 18 (3), 261-271, 2002
1212002
An automatic test pattern generator for large sequential circuits based on genetic algorithms
P Prinetto, M Rebaudengo, MS Reorda
Proceedings., International Test Conference, 240-249, 1994
1161994
On improving automation by integrating RFID in the traceability management of the agri-food sector
F Gandino, B Montrucchio, M Rebaudengo, ER Sanchez
IEEE Transactions on Industrial Electronics 56 (7), 2357-2365, 2009
1152009
Exploiting circuit emulation for fast hardness evaluation
P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante
IEEE Transactions on Nuclear Science 48 (6), 2210-2216, 2001
1122001
A new hybrid fault detection technique for systems-on-a-chip
P Bernardi, LMV Bolzani, M Rebaudengo, MS Reorda, FL Vargas, ...
IEEE transactions on Computers 55 (2), 185-198, 2006
982006
An accurate analysis of the effects of soft errors in the instruction and data caches of a pipelined microprocessor
M Rebaudengo, MS Reorda, M Violante
2003 Design, Automation and Test in Europe Conference and Exhibition, 602-607, 2003
922003
GALLO: A genetic algorithm for floorplan area optimization
M Rebaudengo, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996
851996
Fault-list collapsing for fault-injection experiments
A Benso, M Rebaudengo, L Impagliazzo, P Marmo
Annual Reliability and Maintainability Symposium. 1998 Proceedings …, 1998
781998
Probabilistic DCS: An RFID reader-to-reader anti-collision protocol
F Gandino, R Ferrero, B Montrucchio, M Rebaudengo
Journal of Network and Computer Applications 34 (3), 821-832, 2011
742011
New static compaction techniques of test sequences for sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings European Design and Test Conference. ED & TC 97, 37-43, 1997
731997
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Articles 1–20