Florian F. Krause
Florian F. Krause
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Zitiert von
Zitiert von
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
K Müller, FF Krause, A Béché, M Schowalter, V Galioit, S Löffler, ...
Nature communications 5 (1), 1-8, 2014
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy
K Müller-Caspary, FF Krause, T Grieb, S Löffler, M Schowalter, A Béché, ...
Ultramicroscopy 178, 62-80, 2017
Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging
D Zhou, K Müller-Caspary, W Sigle, FF Krause, A Rosenauer, ...
Microscopy and Microanalysis 22, 890-891, 2016
Sample tilt effects on atom column position determination in ABF–STEM imaging
D Zhou, K Müller-Caspary, W Sigle, FF Krause, A Rosenauer, ...
Ultramicroscopy 160, 110-117, 2016
Effects of instrument imperfections on quantitative scanning transmission electron microscopy
FF Krause, M Schowalter, T Grieb, K Müller-Caspary, T Mehrtens, ...
Ultramicroscopy 161, 146-160, 2016
Nanoscopic insights into InGaN/GaN core–shell nanorods: structure, composition, and luminescence
M Müller, P Veit, FF Krause, T Schimpke, S Metzner, F Bertram, ...
Nano letters 16 (9), 5340-5346, 2016
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction
C Mahr, K Müller-Caspary, T Grieb, M Schowalter, T Mehrtens, FF Krause, ...
Ultramicroscopy 158, 38-48, 2015
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques
N Gauquelin, KHW Van den Bos, A Béché, FF Krause, I Lobato, S Lazar, ...
Ultramicroscopy 181, 178-190, 2017
Materials characterisation by angle-resolved scanning transmission electron microscopy
K Müller-Caspary, O Oppermann, T Grieb, FF Krause, A Rosenauer, ...
Scientific reports 6 (1), 1-9, 2016
Conventional transmission electron microscopy imaging beyond the diffraction and information limits
A Rosenauer, FF Krause, K Müller, M Schowalter, T Mehrtens
Physical review letters 113 (9), 096101, 2014
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods
FF Krause, K Müller, D Zillmann, J Jansen, M Schowalter, A Rosenauer
Ultramicroscopy 134, 94-101, 2013
Ultrathin Au-alloy nanowires at the liquid–liquid interface
D Chatterjee, S Shetty, K Müller-Caspary, T Grieb, FF Krause, ...
Nano letters 18 (3), 1903-1907, 2018
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose
K Müller-Caspary, FF Krause, F Winkler, A Béché, J Verbeeck, S Van Aert, ...
Ultramicroscopy 203, 95-104, 2019
Coherently embedded Ag nanostructures in Si: 3D imaging and their application to SERS
RR Juluri, A Rath, A Ghosh, A Bhukta, R Sathyavathi, DN Rao, K Müller, ...
Scientific reports 4 (1), 1-7, 2014
Structural and emission properties of InGaAs/GaAs quantum dots emitting at 1.3 μm
E Goldmann, M Paul, FF Krause, K Müller, J Kettler, T Mehrtens, ...
Applied Physics Letters 105 (15), 152102, 2014
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence
T Grieb, FF Krause, M Schowalter, D Zillmann, R Sellin, K Müller-Caspary, ...
Ultramicroscopy 190, 45-57, 2018
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction
C Mahr, K Müller-Caspary, R Ritz, M Simson, T Grieb, M Schowalter, ...
Ultramicroscopy 196, 74-82, 2019
Homogeneity and composition of AlInGaN: A multiprobe nanostructure study
FF Krause, JP Ahl, D Tytko, PP Choi, R Egoavil, M Schowalter, ...
Ultramicroscopy 156, 29-36, 2015
Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaN
FF Krause, D Bredemeier, M Schowalter, T Mehrtens, T Grieb, ...
Ultramicroscopy 189, 124-135, 2018
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation
T Grieb, M Tewes, M Schowalter, K Müller-Caspary, FF Krause, ...
Ultramicroscopy 184, 29-36, 2018
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