| Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction K Müller, FF Krause, A Béché, M Schowalter, V Galioit, S Löffler, ... Nature communications 5 (1), 5653, 2014 | 292 | 2014 |
| Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy K Müller-Caspary, FF Krause, T Grieb, S Löffler, M Schowalter, A Béché, ... Ultramicroscopy 178, 62-80, 2017 | 127 | 2017 |
| Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging D Zhou, K Müller-Caspary, W Sigle, FF Krause, A Rosenauer, ... Microscopy and Microanalysis 22, 890-891, 2016 | 60 | 2016 |
| Sample tilt effects on atom column position determination in ABF–STEM imaging D Zhou, K Müller-Caspary, W Sigle, FF Krause, A Rosenauer, ... Ultramicroscopy 160, 110-117, 2016 | 60 | 2016 |
| Effects of instrument imperfections on quantitative scanning transmission electron microscopy FF Krause, M Schowalter, T Grieb, K Müller-Caspary, T Mehrtens, ... Ultramicroscopy 161, 146-160, 2016 | 59 | 2016 |
| Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction C Mahr, K Müller-Caspary, T Grieb, M Schowalter, T Mehrtens, FF Krause, ... Ultramicroscopy 158, 38-48, 2015 | 53 | 2015 |
| Nanoscopic insights into InGaN/GaN core–shell nanorods: Structure, composition, and luminescence M Müller, P Veit, FF Krause, T Schimpke, S Metzner, F Bertram, ... Nano letters 16 (9), 5340-5346, 2016 | 50 | 2016 |
| Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques N Gauquelin, KHW Van Den Bos, A Béché, FF Krause, I Lobato, S Lazar, ... Ultramicroscopy 181, 178-190, 2017 | 41 | 2017 |
| Materials characterisation by angle-resolved scanning transmission electron microscopy K Müller-Caspary, O Oppermann, T Grieb, FF Krause, A Rosenauer, ... Scientific reports 6 (1), 37146, 2016 | 36 | 2016 |
| Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose K Müller-Caspary, FF Krause, F Winkler, A Béché, J Verbeeck, S Van Aert, ... Ultramicroscopy 203, 95-104, 2019 | 34 | 2019 |
| Ultrathin Au-alloy nanowires at the liquid–liquid interface D Chatterjee, S Shetty, K Müller-Caspary, T Grieb, FF Krause, ... Nano letters 18 (3), 1903-1907, 2018 | 34 | 2018 |
| Conventional transmission electron microscopy imaging beyond the diffraction and information limits A Rosenauer, FF Krause, K Müller, M Schowalter, T Mehrtens Physical review letters 113 (9), 096101, 2014 | 31 | 2014 |
| Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods FF Krause, K Müller, D Zillmann, J Jansen, M Schowalter, A Rosenauer Ultramicroscopy 134, 94-101, 2013 | 26 | 2013 |
| Coherently embedded Ag nanostructures in Si: 3D imaging and their application to SERS RR Juluri, A Rath, A Ghosh, A Bhukta, R Sathyavathi, DN Rao, K Müller, ... Scientific reports 4 (1), 4633, 2014 | 24 | 2014 |
| Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence T Grieb, FF Krause, M Schowalter, D Zillmann, R Sellin, K Müller-Caspary, ... Ultramicroscopy 190, 45-57, 2018 | 21 | 2018 |
| Structural and emission properties of InGaAs/GaAs quantum dots emitting at 1.3 μm E Goldmann, M Paul, FF Krause, K Müller, J Kettler, T Mehrtens, ... Applied Physics Letters 105 (15), 2014 | 21 | 2014 |
| Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods C Mahr, K Müller-Caspary, T Grieb, FF Krause, M Schowalter, ... Ultramicroscopy 221, 113196, 2021 | 20 | 2021 |
| Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy A Beyer, FF Krause, HL Robert, S Firoozabadi, T Grieb, P Kükelhan, ... Scientific reports 10 (1), 17890, 2020 | 20 | 2020 |
| Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction C Mahr, K Müller-Caspary, R Ritz, M Simson, T Grieb, M Schowalter, ... Ultramicroscopy 196, 74-82, 2019 | 20 | 2019 |
| Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation T Grieb, M Tewes, M Schowalter, K Müller-Caspary, FF Krause, ... Ultramicroscopy 184, 29-36, 2018 | 19 | 2018 |
Andreas RosenauerProfessor for experimental phyics, University of BremenVerified email at ifp.uni-bremen.de
