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Rogerio Feris
Rogerio Feris
Research Manager, MIT-IBM Watson AI Lab
Bestätigte E-Mail-Adresse bei us.ibm.com - Startseite
Titel
Zitiert von
Zitiert von
Jahr
A unified multi-scale deep convolutional neural network for fast object detection
Z Cai, Q Fan, RS Feris, N Vasconcelos
Computer Vision–ECCV 2016: 14th European Conference, Amsterdam, The …, 2016
16542016
Blockdrop: Dynamic inference paths in residual networks
Z Wu, T Nagarajan, A Kumar, S Rennie, LS Davis, K Grauman, R Feris
Proceedings of the IEEE conference on computer vision and pattern …, 2018
4482018
Cross-domain image retrieval with a dual attribute-aware ranking network
J Huang, RS Feris, Q Chen, S Yan
Proceedings of the IEEE international conference on computer vision, 1062-1070, 2015
4402015
Image ranking and retrieval based on multi-attribute queries
B Siddiquie, RS Feris, LS Davis
CVPR 2011, 801-808, 2011
4212011
Fully-adaptive feature sharing in multi-task networks with applications in person attribute classification
Y Lu, A Kumar, S Zhai, Y Cheng, T Javidi, R Feris
Proceedings of the IEEE conference on computer vision and pattern …, 2017
3922017
Non-photorealistic camera: depth edge detection and stylized rendering using multi-flash imaging
R Raskar, KH Tan, R Feris, J Yu, M Turk
ACM transactions on graphics (TOG) 23 (3), 679-688, 2004
3802004
Non-photorealistic camera: depth edge detection and stylized rendering using multi-flash imaging
R Raskar, KH Tan, R Feris, J Yu, M Turk
ACM transactions on graphics (TOG) 23 (3), 679-688, 2004
3802004
Manifold based analysis of facial expression
Y Chang, C Hu, R Feris, M Turk
Image and Vision Computing 24 (6), 605-614, 2006
3542006
Spottune: transfer learning through adaptive fine-tuning
Y Guo, H Shi, A Kumar, K Grauman, T Rosing, R Feris
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2019
3432019
An exploration of parameter redundancy in deep networks with circulant projections
Y Cheng, FX Yu, RS Feris, S Kumar, A Choudhary, SF Chang
Proceedings of the IEEE international conference on computer vision, 2857-2865, 2015
3432015
Delta-encoder: an effective sample synthesis method for few-shot object recognition
E Schwartz, L Karlinsky, J Shtok, S Harary, M Marder, A Kumar, R Feris, ...
Advances in neural information processing systems 31, 2018
3272018
Repmet: Representative-based metric learning for classification and few-shot object detection
L Karlinsky, J Shtok, S Harary, E Schwartz, A Aides, R Feris, R Giryes, ...
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2019
3052019
Deep domain adaptation for describing people based on fine-grained clothing attributes
Q Chen, J Huang, R Feris, LM Brown, J Dong, S Yan
Proceedings of the IEEE conference on computer vision and pattern …, 2015
3042015
Attribute-based people search in surveillance environments
DA Vaquero, RS Feris, D Tran, L Brown, A Hampapur, M Turk
2009 workshop on applications of computer vision (WACV), 1-8, 2009
2612009
Robust detection of abandoned and removed objects in complex surveillance videos
YL Tian, RS Feris, H Liu, A Hampapur, MT Sun
IEEE Transactions on Systems, Man, and Cybernetics, Part C (Applications and …, 2010
2522010
Learning to separate object sounds by watching unlabeled video
R Gao, R Feris, K Grauman
Proceedings of the European Conference on Computer Vision (ECCV), 35-53, 2018
2492018
A broader study of cross-domain few-shot learning
Y Guo, NC Codella, L Karlinsky, JV Codella, JR Smith, K Saenko, ...
Computer Vision–ECCV 2020: 16th European Conference, Glasgow, UK, August 23 …, 2020
239*2020
Designing category-level attributes for discriminative visual recognition
FX Yu, L Cao, RS Feris, JR Smith, SF Chang
Proceedings of the IEEE conference on computer vision and pattern …, 2013
2372013
Designing Category-Level Attributes for Discriminative Visual Recognition
XY Felix, L Cao, RS Feris, JR Smith, SF Chang
237*
Jointly optimize data augmentation and network training: Adversarial data augmentation in human pose estimation
X Peng, Z Tang, F Yang, RS Feris, D Metaxas
Proceedings of the IEEE conference on computer vision and pattern …, 2018
2182018
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