Follow
Peter J. de Groot
Peter J. de Groot
Zygo Corporation
Verified email at zygo.com
Title
Cited by
Cited by
Year
Surface profiling by analysis of white-light interferograms in the spatial frequency domain
P De Groot, L Deck
Journal of modern optics 42 (2), 389-401, 1995
5471995
High-speed noncontact profiler based on scanning white-light interferometry
L Deck, P De Groot
Applied optics 33 (31), 7334-7338, 1994
5141994
Three-dimensional imaging by sub-Nyquist sampling of white-light interferograms
P de Groot, L Deck
Optics letters 18 (17), 1462-1464, 1993
3961993
Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window
P De Groot
Applied optics 34 (22), 4723-4730, 1995
3521995
Principles of interference microscopy for the measurement of surface topography
P de Groot
Advances in Optics and Photonics 7 (1), 1-65, 2015
3002015
Ranging and velocimetry signal generation in a backscatter-modulated laser diode
PJ de Groot, GM Gallatin, SH Macomber
Applied optics 27 (21), 4475-4480, 1988
2891988
Determination of fringe order in white-light interference microscopy
P de Groot, XC de Lega, J Kramer, M Turzhitsky
Applied optics 41 (22), 4571-4578, 2002
2722002
Vibration in phase-shifting interferometry
PJ De Groot
JOSA A 12 (2), 354-365, 1995
2521995
Measurement of transparent plates with wavelength-tuned phase-shifting interferometry
P De Groot
Applied Optics 39 (16), 2658-2663, 2000
2462000
Method and system for profiling objects having multiple reflective surfaces using wavelength-tuning phase-shifting interferometry
P de Groot
US Patent 6,359,692, 2002
2232002
Signal modeling for low-coherence height-scanning interference microscopy
P de Groot, XC de Lega
Applied optics 43 (25), 4821-4830, 2004
2152004
Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms
P De Groot
US Patent 5,398,113, 1995
2071995
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,271,918, 2007
1772007
Interferometry method and system including spectral decomposition
XC De Lega, P De Groot
US Patent 7,636,168, 2009
1652009
Coherence scanning interferometry
P Groot
Optical measurement of surface topography, 187-208, 2011
156*2011
Infrared scanning interferometry apparatus and method
XC De Lega, P De Groot, LL Deck
US Patent 6,195,168, 2001
1302001
Interferometric optical systems having simultaneously scanned optical path length and focus
PJ De Groot, XC De Lega, S Balasubramaniam
US Patent 7,012,700, 2006
1152006
Interpreting interferometric height measurements using the instrument transfer function
PD Groot, XC Lega
Fringe 2005, 30-37, 2006
1142006
Extending the unambiguous range of two-color interferometers
PJ De Groot
Applied optics 33 (25), 5948-5953, 1994
1111994
Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
PJ De Groot
US Patent 7,139,081, 2006
1102006
The system can't perform the operation now. Try again later.
Articles 1–20