| Dirichlet-to-Neumann boundary conditions for multiple scattering problems MJ Grote, C Kirsch Journal of Computational Physics 201 (2), 630-650, 2004 | 142 | 2004 |
| Nonreflecting boundary condition for time-dependent multiple scattering MJ Grote, C Kirsch Journal of Computational Physics 221 (1), 41-62, 2007 | 46 | 2007 |
| Simulation of OLEDs with a polar electron transport layer S Altazin, S Züfle, E Knapp, C Kirsch, TD Schmidt, L Jäger, Y Noguchi, ... Organic Electronics 39, 244-249, 2016 | 42 | 2016 |
| Numerical simulation of Lamb wave propagation in metallic foam sandwich structures: a parametric study SMH Hosseini, A Kharaghani, C Kirsch, U Gabbert Composite Structures 97, 387-400, 2013 | 39 | 2013 |
| Effects of nano-patterned versus simple flat active layers in upright organic photovoltaic devices Y Liu, C Kirsch, A Gadisa, M Aryal, S Mitran, ET Samulski, R Lopez Journal of Physics D: Applied Physics 46 (2), 024008, 2012 | 33 | 2012 |
| Discrete pore network modeling of superheated steam drying KH Le, A Kharaghani, C Kirsch, E Tsotsas Drying Technology 35 (13), 1584-1601, 2017 | 25 | 2017 |
| Quantitative analysis of pixel crosstalk in AMOLED displays M Diethelm, L Penninck, S Altazin, R Hiestand, C Kirsch, B Ruhstaller Journal of Information Display 19 (2), 61-69, 2018 | 20 | 2018 |
| Pore network simulations of heat and mass transfer inside an unsaturated capillary porous wick in the dry-out regime KH Le, A Kharaghani, C Kirsch, E Tsotsas Transport in porous media 114, 623-648, 2016 | 16 | 2016 |
| Refined drift-diffusion model for the simulation of charge transport across layer interfaces in organic semiconductor devices S Altazin, C Kirsch, E Knapp, A Stous, B Ruhstaller Journal of Applied Physics 124 (13), 135501, 2018 | 15 | 2018 |
| Electrothermal simulation of large-area semiconductor devices C Kirsch, S Altazin, R Hiestand, T Beierlein, R Ferrini, T Offermans, ... The International Journal of Multiphysics 11 (2), 127-136, 2017 | 13 | 2017 |
| Influence of chemically p-type doped active organic semiconductor on the film thickness versus performance trend in cyanine/C60 bilayer solar cells S Jenatsch, T Geiger, J Heier, C Kirsch, F Nüesch, A Paracchino, ... Science and technology of advanced materials, 2015 | 12 | 2015 |
| Simulated annealing electro-photonic optimization of organic solar cells C Kirsch, S Mitran Journal of Applied Physics 112 (5), 054502, 2012 | 12 | 2012 |
| Micro-scale fluid model for drying of highly porous particle aggregates A Kharaghani, C Kirsch, T Metzger, E Tsotsas Computers & chemical engineering 52, 46-54, 2013 | 11 | 2013 |
| Determination of the moisture transport coefficient from pore network simulations of spontaneous imbibition in capillary porous media Y Jabbari, E Tsotsas, C Kirsch, A Kharaghani Chemical Engineering Science 207, 600-610, 2019 | 10 | 2019 |
| Modelling crosstalk through common semiconductor layers in AMOLED displays L Penninck, M Diethelm, S Altazin, R Hiestand, C Kirsch, B Ruhstaller Journal of the Society for Information Display 26 (9), 546-554, 2018 | 8 | 2018 |
| 38.3: simulations, measurements, and optimization of OLEDs with scattering layer S Altazin, C Reynaud, UM Mayer, T Lanz, K Lapagna, R Knaack, ... SID Symposium Digest of Technical Papers 46 (1), 564-567, 2015 | 8 | 2015 |
| 40.4: Design tool for light scattering enhancement in OLEDs S Altazin, K Lapagna, T Lanz, C Kirsch, R Knaack, B Ruhstaller SID Symposium Digest of Technical Papers 45 (1), 576-579, 2014 | 8 | 2014 |
| Non-reflecting boundary conditions for the numerical solution of wave propagation problems in unbounded domains C Kirsch University_of_Basel, 2005 | 8 | 2005 |
| Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells M Diethelm, L Penninck, M Regnat, T Offermans, B Zimmermann, ... Solar Energy 209, 186-193, 2020 | 7 | 2020 |
| Coupled 3D master equation and 1D drift‐diffusion approach for advanced OLED modeling S Zeder, C Kirsch, U Aeberhard, B Blülle, S Jenatsch, B Ruhstaller Journal of the Society for Information Display 28 (5), 440-449, 2020 | 7 | 2020 |
