Yves Kayser
Yves Kayser
PostDoc
Verified email at ptb.de
Title
Cited by
Cited by
Year
A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering …
J Szlachetko, M Nachtegaal, E de Boni, M Willimann, O Safonova, J Sa, ...
Review of Scientific Instruments 83 (10), 103105, 2012
1552012
Physical mechanisms and scaling laws of K-shell double photoionization
J Hoszowska, AK Kheifets, JC Dousse, M Berset, I Bray, W Cao, ...
Physical review letters 102 (7), 073006, 2009
662009
Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)
J Szlachetko, M Cotte, J Morse, M Salomé, P Jagodzinski, JC Dousse, ...
Journal of synchrotron radiation 17 (3), 400-408, 2010
632010
High Energy Resolution Off-Resonant Spectroscopy for X-Ray Absorption Spectra Free of Self-Absorption Effects
W Błachucki, J Szlachetko, J Hoszowska, JC Dousse, Y Kayser, ...
Physical Review Letters 112 (17), 173003, 2014
422014
Characterization of ultra shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy
P Hönicke, Y Kayser, B Beckhoff, M Müller, JC Dousse, J Hoszowska, ...
J. Anal. At. Spectrom. 27, 1432-1438, 2012
382012
Communication: The electronic structure of matter probed with a single femtosecond hard x-ray pulse
J Szlachetko, CJ Milne, J Hoszowska, JC Dousse, W Błachucki, J Sà, ...
Structural Dynamics 1 (2), 021101, 2014
372014
Establishing nonlinearity thresholds with ultraintense X-ray pulses
J Szlachetko, J Hoszowska, JC Dousse, M Nachtegaal, W Błachucki, ...
Scientific Reports 6, 33292, 2016
342016
Temperature-programmed reduction of NiO nanoparticles followed by time-resolved RIXS
J Sá, Y Kayser, CJ Milne, DLA Fernandes, J Szlachetko
Physical Chemistry Chemical Physics 16 (17), 7692-7696, 2014
322014
Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology
J Szlachetko, D Banaś, A Kubala-Kukuś, M Pajek, W Cao, JC Dousse, ...
Journal of Applied Physics 105 (8), 086101, 2009
312009
Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation
A Kubala-Kukuś, D Banaś, W Cao, JC Dousse, J Hoszowska, Y Kayser, ...
Physical Review B 80 (11), 113305, 2009
282009
First observation of two-electron one-photon transitions in single-photon K-Shell double ionization
J Hoszowska, JC Dousse, J Szlachetko, Y Kayser, W Cao, P Jagodziński, ...
Physical Review Letters 107 (5), 053001, 2011
272011
Following the dynamics of matter with femtosecond precision using the X-ray streaking method
C David, P Karvinen, M Sikorski, S Song, I Vartiainen, CJ Milne, ...
Scientific Reports 5, 7644, 2015
262015
Double K-shell photoionization and hypersatellite x-ray transitions of 12⩽ Z⩽ 23 atoms
J Hoszowska, JC Dousse, W Cao, K Fennane, Y Kayser, M Szlachetko, ...
Physical Review A 82 (6), 063408, 2010
242010
Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence
V Soltwisch, P Hönicke, Y Kayser, J Eilbracht, J Probst, F Scholze, ...
Nanoscale 10, 6177-6185, 2018
222018
Heat bump on a monochromator crystal measured with X-ray grating interferometry
S Rutishauser, A Rack, T Weitkamp, Y Kayser, C David, AT Macrander
Journal of synchrotron radiation 20 (2), 300-305, 2013
222013
Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube
Y Kayser, W Błachucki, JC Dousse, J Hoszowska, M Neff, V Romano
Review of Scientific Instruments 85 (4), 043101, 2014
212014
Depth profiles of Al impurities implanted in Si wafers determined by means of the high-resolution grazing emission X-ray fluorescence technique
Y Kayser, D Banaś, W Cao, JC Dousse, J Hoszowska, P Jagodziński, ...
Spectrochimica Acta Part B: Atomic Spectroscopy 65 (6), 445-449, 2010
202010
X-ray grating interferometer for in situ and at-wavelength wavefront metrology
Y Kayser, C David, U Flechsig, J Krempasky, V Schlott, R Abela
Journal of synchrotron radiation 24 (1), 150-162, 2017
192017
Wavefront metrology measurements at SACLA by means of X-ray grating interferometry
Y Kayser, S Rutishauser, T Katayama, H Ohashi, T Kameshima, ...
Optics Express 22 (8), 9004-9015, 2014
192014
Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces
SH Nowak, D Banaś, W Błachucki, W Cao, JC Dousse, P Hönicke, ...
Spectrochimica Acta Part B: Atomic Spectroscopy 98, 65-75, 2014
182014
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