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Asaad F. Said
Asaad F. Said
Research Scientist at Intel Corporation
Bestätigte E-Mail-Adresse bei asu.edu
Titel
Zitiert von
Zitiert von
Jahr
Robust automatic void detection in solder balls
AF Said, BL Bennett, LJ Karam, J Pettinato
2010 IEEE International Conference on Acoustics, Speech and Signal …, 2010
352010
Automated detection and classification of non-wet solder joints
AF Said, BL Bennett, LJ Karam, JS Pettinato
IEEE transactions on automation science and engineering 8 (1), 67-80, 2010
312010
Automated void detection in solder balls in the presence of vias and other artifacts
AF Said, BL Bennett, LJ Karam, A Siah, K Goodman, JS Pettinato
IEEE Transactions on Components, Packaging and Manufacturing Technology 2 …, 2012
282012
Automatic cell migration and proliferation analysis
LJ Karam, A Said
US Patent 9,082,164, 2015
172015
Real-time detection and classification of traffic light signals
AF Said, MK Hazrati, F Akhbari
2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR), 1-5, 2016
72016
Non-wet solder joint detection in processor sockets and BGA assemblies
AF Said, BL Bennett, F Toth, LJ Karam, J Pettinato
2010 Proceedings 60th Electronic Components and Technology Conference (ECTC …, 2010
62010
Multi-region texture image segmentation based on constrained level-set evolution functions
AF Said, LJ Karam
2009 IEEE 13th Digital Signal Processing Workshop and 5th IEEE Signal …, 2009
62009
White and color noise cancellation using adaptive feedback cross-coupled line enhancer filter
AF Said
2008 IEEE International Symposium on Signal Processing and Information …, 2008
62008
Migration and proliferation analysis for bladder cancer cells
AF Said, LJ Karam, ME Berens, Z Lacroix, RA Renaut
2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to …, 2007
62007
Robust and Accurate Objects Measurement in Real-World Based on Camera System
AF Said
2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR), 1-5, 2017
42017
A cost-effective, fast, and robust annotation tool
AF Said, V Kashyap, N Choudhury, F Akhbari
2017 IEEE applied imagery pattern recognition workshop (AIPR), 1-6, 2017
42017
Die level defects detection in semiconductor units
AF Said, NS Patel
ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference, 130-133, 2013
42013
Cell migration analysis using a statistical level-set segmentation on a wavelet-based structure tensor feature space
AF Said, LJ Karam
2007 IEEE International Symposium on Signal Processing and Information …, 2007
32007
Noise resilient image segmentation and classification methods with applications in biomedical and semiconductor images
AF Said
Arizona State University, 2010
12010
Bspline based Wavelets with Lifting Implementation85-89
AF Said
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